Military Communications
To meet present and future mission requirements, the countless unique radios of the past are giving way to compatible, multi mode or software-defined digital systems that ensure easy interoperability. To keep pace, measurement solutions must be able to test these versatile radios throughout their lifecycles. From dynamic probing inside an FPGA to testing RF, IF and IQ, from design simulation to operational troubleshooting, we can help you ensure system readiness.
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Data Generators & Analyzers
- 81160A Pulse Function Arbitrary Noise Generator (2)
- Transition Time Converters (2)
- 81110A Pulse Pattern Generator, 165/330 MHz (2)
- 81104A Pulse Pattern Generator, 80 MHz [Discontinued] (2)
- 81130A Pulse Data Generator, 400/660 MHz and 1.32 Gb/s (2)
- 81133A Pulse Pattern Generator, 3.35 GHz, single channel (2)
- 81134A Pulse Pattern Generator, 3.35 GHz, dual-channel (2)
- 81250 13.5 Gb/s ParBERT Modules (N4872A, N4873A) (2)
- 81250 7 Gb/s ParBERT Modules (N4874A, N4875A) (2)
- 81250 3.35 Gb/s ParBERT Modules (E4861B, E4862B, E4863B) (2)
- PCI Express® Gen 2.0 RX jitter testing with J-BERT N4903B (2)
- N4903B J-BERT high-performance serial BERT up to 7 Gb/s and 12.5 Gb/s with complete jitter tolerance (4)
- 81150A Pulse Function Arbitrary Noise Generator (3)
- N2102B PXIT Pattern Generator (2)
- 81250 675 Mb/s ParBERT Modules (E4832A, E4835A, E4838A) (2)
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Evénements Agilent en France
Bienvenue sur la page des événements auxquels participe Agilent en France
Seminar |
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Digital Webcast Series - Master the high-speed digital test challenge
multiple broadcasts - refer to www.agilent.com/find/DPTwebcasts for the complete list
Webcast - recorded |
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Test & Measurement events in Europe, Middle East & Africa
Test & Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.
Seminar |
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USB 3.0 Physical Layer Test Challenges: Gen3 and Beyond Webcast
Original broadcast June 13, 2013
Webcast - recorded |
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