Radar Test & Electronic Warfare (EW) Test
As technology evolves so do the challenges in detection, avoidance, electronic warfare and countermeasures. In all cases, the testing of today's systems will benefit from high-performance test equipment — analog and vector signal generators, spectrum analyzers, vector signal analyzers, vector network analyzers and more. From simulations of an arriving wavefront with multiple emitters to testing of precision components in a receiver, our solutions are ready for the complexity of radar test and EW test applications.
See Measurement Solution Examples: Active Antenna Test, Multi-Emitter Environment Test Signals
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81100 Family of Pulse Pattern/Generators Radar Distance Test to Airborne Planes (PN 1)
This Product Note describes how a trigger pulse train of double pulses is sent from the control tower's radar system to an airplane.
Application Note 2004-10-12 |
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8753/8720 Pulsed Measurements
The aim of this Product Note is to show that under certain conditions, network analyzers such as the Agilent 8720ES and 8753ES can produce good results at a much lower cost.
Application Note 2000-05-01 |
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392 KB
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A New Gated-CW Radar Implementation
Review a gated-CW solution that provides performance and speed improvements for RCS measurements. Reprinted with the permission of Orbit/FR Inc.
Application Note 2004-03-03 |
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154 KB
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Addressing the Challenges of High-Speed Digital I/O for Aerospace Defense Applications
This application note will also discuss test challenges and commercial test solutions for fiber digital I/O technologies to help mitigate risk in upgrading to fiber-based technologies.
Application Note 2011-05-04 |
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1.35 MB
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Analyzing Infiniium Scope Radar Waveform with ADS
This AN focuses on using both Agilent test and measurement instruments such as oscilloscopes, signal generators, and signal analyzers to solve a common design problems of wireless and wireline communications products.
Application Note 2003-12-01 |
PDF
380 KB
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Calibrating Signal Paths in RF/Microwave Test Systems (AN 1465-19)
Application Note 2005-10-31 |
PDF
126 KB
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Characterizing Barker Coded Modulation in Radar Systems (AN 358-10)
This Application Note is for information only. Agilent no longer sells or supports these products.
Application Note 1989-10-01 |
PDF
721 KB
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Characterizing Chirp Coded Modulation in Radar Systems (AN 358-11)
This Application Note is for information only. Agilent no longer sells or supports these products.
Application Note 1990-01-01 |
PDF
647 KB
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Characterizing phase-locked-loop signal transition behaviors of Microphonic/Phase-hit
This paper discusses how Agilent's Signal Source Analyzer helps you to identify unwanted phase-locked-loop transition "phase-hits", and achieve easy, comprehensive and accurate phase-locked-loop characterization in both linear and nonlinear regions.
Application Note 2008-10-02 |
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1.68 MB
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Cheetah PNA RCS and Antenna Measurement System
Introducing a radar measurement system based on Agilent's PNA network analyzer. Reprinted with permission of SPC Corp.
Application Note 2004-03-03 |
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582 KB
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Continuous Monitoring of Radar Noise Figures (AN 43)
This Application Note is for information only. Agilent no longer sells or supports these products.
Application Note 1964-12-01 |
PDF
900 KB
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Creating a Complete and Flexible Solution for WiGig Testing Application Note
When developing new WiGig products, testing must address the transmitter and receiver portions of each device. In a tri-band device, signals have three key attributes: they operate at 2.4 GHz, 5.0 GHz
Application Note 2011-06-13 |
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2.18 MB
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Creating a Radar Threat Simulator and Receiver Calibrator with Precise Angle of Arrival
This application brief focuses on a solution for radar testing and covers three key topics: the problem, the solution, and the associated results and benefits.
Application Note 2011-06-20 |
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1.66 MB
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Creating and Analyzing Custom OFDM Waveforms for Software-Defined Radio (SDR)
This note outlines the complexities of generating and analyzing COTS and custom waveforms, proposes solutions that address those problems, and presents the results of the suggested approaches.
Application Note 2012-12-14 |
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483 KB
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Designing, Verifying and Testing Stepped Frequency Radar Systems for Commercial and A/D Applications
This note shows a simulation platform using SystemVue software that easily links measurement tools to enable the design, validation and test of SFR systems under different environments.
Application Note 2012-10-18 |
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688 KB
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EPM-P Series Power Meters Used in Radar and Pulse Applications (AN 1438)
Application Note 2003-01-28 |
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428 KB
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Evaluating and Optimizing High-power Amplifier Designs with X-Parameter Techniques
This brief presents an example PA design that uses a 45-watt GaN transistor. The center operating frequency is 1.2 GHz and the target output power is 45 dBm or more.
Application Note 2011-04-28 |
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Fundamentals of Time Interval Measurements (AN 200-3)
This classic Application Note provides a fundamental background on measurements of time-related events with electronic time interval counters. This Application Note is for information only. Agilent no longer sells or supports these products.
Application Note 1997-06-01 |
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897 KB
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Improving Radar Performance by Optimizing Overall Signal-to-Noise Ratio
Better noise-figure measurements enhance characterization of excess noise in receivers.
Application Note 2011-05-05 |
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964 KB
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Low Cost Radar Verification Testing with USB Sensor-Based Scalar Network
Perform accurate measurements of RF and microwave power.
Application Note 2011-07-28 |
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1.99 MB
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Modulation Domain Techniques for Measuring Complex Radar Singals (AN 358-9)
This Application Note is for information only. Agilent no longer sells or supports these products.
Application Note 1989-10-01 |
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713 KB
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Optimizing Throughput in Transmit/Receive Module Test
This application brief illustrates modern trends of testing by focusing on transmit/receive (T/R) modules used in radar systems.
Application Note 2011-04-12 |
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PNA - Pulsed-RF S-Parameter Measurements Using Wideband and Narrowband Detection (AN 1408-12)
Application Note 2007-11-28 |
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Pulsed Carrier Phase Noise Measurements (AN 1309)
This application note discusses basic fundamentals for making pulsed carrier phase noise measurements using Agilent E5500 phase noise measurement system.
Application Note 2000-05-01 |
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632 KB
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Radar Emitter Simulation Using the E8267C PSG Vector Signal Generator
This 32-page application note explains how to generate and evaluate complex radar signals using the Agilent E8267C vector signal generator.
Application Note 2003-12-01 |
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