Radar Test & Electronic Warfare (EW) Test
As technology evolves so do the challenges in detection, avoidance, electronic warfare and countermeasures. In all cases, the testing of today's systems will benefit from high-performance test equipment — analog and vector signal generators, spectrum analyzers, vector signal analyzers, vector network analyzers and more. From simulations of an arriving wavefront with multiple emitters to testing of precision components in a receiver, our solutions are ready for the complexity of radar test and EW test applications.
See Measurement Solution Examples: Active Antenna Test, Multi-Emitter Environment Test Signals
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1-17 of 17
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81100 Family of Pulse Pattern/Generators Radar Distance Test to Airborne Planes (PN 1)
This Product Note describes how a trigger pulse train of double pulses is sent from the control tower's radar system to an airplane.
Application Note 2004-10-12 |
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8753/8720 Pulsed Measurements
The aim of this Product Note is to show that under certain conditions, network analyzers such as the Agilent 8720ES and 8753ES can produce good results at a much lower cost.
Application Note 2000-05-01 |
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392 KB
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Addressing the Challenges of High-Speed Digital I/O for Aerospace Defense Applications
This application note will also discuss test challenges and commercial test solutions for fiber digital I/O technologies to help mitigate risk in upgrading to fiber-based technologies.
Application Note 2011-05-04 |
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1.35 MB
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Characterizing Barker Coded Modulation in Radar Systems (AN 358-10)
This Application Note is for information only. Agilent no longer sells or supports these products.
Application Note 1989-10-01 |
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721 KB
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Characterizing Chirp Coded Modulation in Radar Systems (AN 358-11)
This Application Note is for information only. Agilent no longer sells or supports these products.
Application Note 1990-01-01 |
PDF
647 KB
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Characterizing phase-locked-loop signal transition behaviors of Microphonic/Phase-hit
This paper discusses how Agilent's Signal Source Analyzer helps you to identify unwanted phase-locked-loop transition "phase-hits", and achieve easy, comprehensive and accurate phase-locked-loop characterization in both linear and nonlinear regions.
Application Note 2008-10-02 |
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1.68 MB
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Continuous Monitoring of Radar Noise Figures (AN 43)
This Application Note is for information only. Agilent no longer sells or supports these products.
Application Note 1964-12-01 |
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900 KB
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Fundamentals of Time Interval Measurements (AN 200-3)
This classic Application Note provides a fundamental background on measurements of time-related events with electronic time interval counters. This Application Note is for information only. Agilent no longer sells or supports these products.
Application Note 1997-06-01 |
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897 KB
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Modulation Domain Techniques for Measuring Complex Radar Singals (AN 358-9)
This Application Note is for information only. Agilent no longer sells or supports these products.
Application Note 1989-10-01 |
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713 KB
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PNA - Pulsed-RF S-Parameter Measurements Using Wideband and Narrowband Detection (AN 1408-12)
Application Note 2007-11-28 |
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Pulsed Carrier Phase Noise Measurements (AN 1309)
This application note discusses basic fundamentals for making pulsed carrier phase noise measurements using Agilent E5500 phase noise measurement system.
Application Note 2000-05-01 |
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632 KB
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Radar Test Measurements - Application Note
This application note focuses on the fundamentals of measuring basic pulsed radars and measurements for more complex or modulated pulsed radar systems.
Application Note 2013-04-30 |
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4.68 MB
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Radar, EW & ELINT Testing: Identifying Common Test Challenges - Application Note
This application note reviews some of the latest test equipment for radar, EW & ELINT systems. Since this is a complex subject, we begin with a brief review of the fundamental radar and EW/ELINT challenges.
Application Note 2013-04-29 |
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1.32 MB
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Reducing Measurement Times in Antenna and RCS Applications
To help you achieve these speed improvements, this note describes test range configurations and typical measurement scenarios.
Application Note 2010-12-20 |
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3.15 MB
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Single Shot Frequency Profiling of Chirped Radars Made Easy (AN 1200-8)
This Application Note describes the Agilent 53310A's ability to measure and display a signal's continuous frequency over time makes dynamic frequency analysis of radar pulses easy. Views of single-shot chirp linearity are obtained by measuring the continuous frequency of the IF chirp. The chirp...
Application Note 2000-08-01 |
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105 KB
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Solutions for Using a Frequency Counter to Measure Phase Noise Close to a Carrier Signal
A local oscillator (LO) is the heart of any modern radar, electronic warfare or communication system. See how you can use this to your advantage.
Application Note 2011-08-01 |
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Spectrum and Signal Analysis Pulsed RF Application Note 150-2
This application note is intended as an aid for the operation of spectrum and signal analyzers and the interpretation of the displayed pulse spectra.
Application Note 2012-07-05 |
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12.46 MB
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