Radar Test & Electronic Warfare (EW) Test
As technology evolves so do the challenges in detection, avoidance, electronic warfare and countermeasures. In all cases, the testing of today's systems will benefit from high-performance test equipment — analog and vector signal generators, spectrum analyzers, vector signal analyzers, vector network analyzers and more. From simulations of an arriving wavefront with multiple emitters to testing of precision components in a receiver, our solutions are ready for the complexity of radar test and EW test applications.
See Measurement Solution Examples: Active Antenna Test, Multi-Emitter Environment Test Signals
Refine the List
By Type of Content
- Document Library
- Application Notes
- Application Note (2)
- Application Notes
By Product Category
-
All Product Categories
-
Oscilloscopes, Analyzers, Meters
- EMI/EMC, Phase Noise, Physical Layer Test Systems
-
Oscilloscopes, Analyzers, Meters
1-2 of 2
|
Characterizing phase-locked-loop signal transition behaviors of Microphonic/Phase-hit
This paper discusses how Agilent's Signal Source Analyzer helps you to identify unwanted phase-locked-loop transition "phase-hits", and achieve easy, comprehensive and accurate phase-locked-loop characterization in both linear and nonlinear regions.
Application Note 2008-10-02 |
|
|
Pulsed Carrier Phase Noise Measurements (AN 1309)
This application note discusses basic fundamentals for making pulsed carrier phase noise measurements using Agilent E5500 phase noise measurement system.
Application Note 2000-05-01 |
|
