Fundamentals of Electronic Test & Measurement

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How to use the Agilent 81200 together with Agilent VEE This attached Product Note shows how to use the Agilent 81200 Data Generator/Analyzer together with Agilent VEE for Signal Integrity Analysis. Application Note 2002-01-28	PDF 383 KB
How to use the Agilent N6700 Modular Power System to replace an Agilent 662xA (AN 1467) This is a high-level overview to help current 662xA owners easily convert to an Agilent N6700. Application Note 2004-08-02	PDF 220 KB Sprachen English \| 2004-08-02 \| PDF 220 KB 中文（简体） \| 2004-08-02 \| PDF 220 KB 日本語 \| 2004-02-19 \| PDF 852 KB 中文（繁體） \| 2004-01-01 \| PDF 316 KB 한국어 \| 2004-02-10 \| PDF 316 KB
How to Use VXI and PXI in Your New LXI Test System (AN 1465-23) Application Note 2006-06-06	PDF 275 KB Sprachen English \| 2006-06-06 \| PDF 275 KB 日本語 \| 2006-06-17 \| PDF 518 KB
IEEE 1149.6 Standard Boundary Scan Testing on Agilent Medalist i3070 ICT Systems This paper introduces the latest advancements in Boundary Scan test capabilities on the Agilent Medalist i3070 In-Circuit Test platform that supports the testing of IEEE 1149.6-compliant devices. Application Note 2008-11-24	PDF 297 KB
Impedance Matching Techniques for Mixers and Detectors (AN 963) This Application Note is for information only. Agilent no longer sells or supports these products. Application Note 1980-08-01	PDF 108 KB
Improved Fault Coverage in a Combined X-ray and In-Circuit Test Environment Cutting functional test failures in half and doubling the faults detected at process test! These are some of the case study results observed in combined X-ray and in-circuit test environments. Application Note 2001-02-27	PDF 575 KB
Improved Throughput in Network Analyzer Applications (AN 1287-5) This Application Note explores a variety of throughput issues and how they might affect different applications. It suggests ways to improve network analyzer performance for better throughput in specific situations, and how to get an accurate picture of how an analyzer's performance might impact... Application Note 2010-03-15	PDF Sprachen English \| PDF 日本語 \| PDF
Introduction to Test-System Design (AN 1465-1) Application Note 2005-01-20	PDF 412 KB Sprachen English \| 2005-01-20 \| PDF 412 KB 中文（简体） \| 2006-08-01 \| PDF 1.41 MB 日本語 \| 2003-10-14 \| PDF 1.04 MB
ISDN Testing Techniques (AN 397-1) This Application Note is for information only. Agilent no longer sells or supports these products. Application Note 1990-09-01	PDF 1.67 MB
Jitter Analysis Techniques for High Data Rates (AN 1432) This new application note describes the basic jitter measurements and the specific measurement techniques used in SONet/SDH/OTN and Gigabit Ethernet applications. Application Note 2003-02-03	PDF 4 MB Sprachen English \| 2003-02-03 \| PDF 4 MB 日本語 \| 2003-04-28 \| PDF 1.65 MB
Jitter Fundamentals: Jitter Tolerance Testing with Agilent ParBERT 81250 This applicaiton note describes gain fast and efficient insight into the operation and performance of CDR, clock system and jitter tolerance. Application Note 2003-12-02	PDF 3.18 MB
LCR/Impedance Measurement Basics presents impedance, component value definitions, typical measurement problemsand their solutions, and error correction and compensation techniques. Application Note 2001-03-28
Logic Analyzer Probing Techniques for High-Speed Digital Systems (AN 1450) Discusses the impact of adding logic analysis testability to PCB's. Examples of today's logic analyzer probing solutions are presented and the advantages and disadvantages of each solution are discussed. Application Note 2003-03-24	PDF 645 KB Sprachen English \| 2003-03-24 \| PDF 645 KB 日本語 \| 2003-05-14 \| PDF 1.07 MB
Maximising Test Coverage with Agilent Medalist VTEP v2.0 This paper describes how to get the most from Agilent Technologies’ industry-leading vectorless test innovation, the Medalist VTEP v2.0 which is a suite of solution comprising VTEP, iVTEP and NPM. Application Note 2007-04-17	PDF 227 KB Sprachen English \| 2007-04-17 \| PDF 227 KB 日本語 \| 2007-07-11 \| PDF 2.11 MB
Maximizing Accuracy in Noise Figure Measurements (PN 85719A-1) This Product Note discusses factors that affect accuracy with the 85719A Noise Figure Measurement System. Statistically generated curves of noise figure measurements uncertainly are also included. Application Note 2000-10-01	PDF 661 KB
Maximizing System Throughput and Optimizing System Deployment (AN 1465-7) Application Note 2004-12-21	PDF 144 KB Sprachen English \| 2004-12-21 \| PDF 144 KB 中文（简体） \| 2006-10-01 \| PDF 754 KB 日本語 \| 2004-04-20 \| PDF 503 KB
Medalist 3070 and Medalist i5000 System Recovery using Retrospect Express This app note describes how to perform backups of the system hard disk for the Agilent Medalist 3070 and Agilent Medalist i5000 In-circuit Test systems that have been shipped with Retrospect Express 7.0 and Roxio Digital Media Plus 7.2 software. Application Note 2007-07-10	PDF 628 KB
Medalist i3070 Test Throughput Optimization This application note explores some factors which cause test time to increase on the Medalist i3070 In-Circuit Test system, and methods which users can employ to reduce the test time and increase throughput on the Medalist i3070 ICT system. Application Note 2008-11-24	PDF 163 KB Sprachen English \| 2008-11-24 \| PDF 163 KB 中文（简体） \| 2008-11-01 \| PDF 364 KB
Merging Windowed Deposits in CamCad on Agilent’s Automated Optical Inspection (AOI) Systems In many stencil designs, windowed deposits are used to apply paste to a large pad. This document provides some tips for dealing with this. Application Note 2008-07-23	PDF 352 KB
Modulation Domain Techniques for Measuring Complex Radar Singals (AN 358-9) This Application Note is for information only. Agilent no longer sells or supports these products. Application Note 1989-10-01	PDF 713 KB
Network Analysis - Balanced and Multiport Device Measurements (1373-2) The use of differential components such as surface acoustic wave (SAW) filters and differential amplifiers is becoming more common in the wireless industry because they have greater performance than their single-ended counterparts. Application Note 2002-03-08	PDF 1.09 MB
Network Analysis - Balanced Measurement Example: Baluns (1373-6) Differential circuits are becoming more widely used in RF circuits for the same reasons that they have been used for years in lower frequency analog circuits. Application Note 2001-09-17	PDF 230 KB Sprachen English \| 2001-09-17 \| PDF 230 KB 日本語 \| 2001-07-24 \| PDF 399 KB
Network Analysis - Balanced Measurement Example: Differential Amplifiers (1373-7) This Application Note describes Agilent balanced-measurement solutions they have developed that offer the most accurate method available for measuring differential RF circuits. Application Note 2001-09-10	PDF 397 KB Sprachen English \| 2001-09-10 \| PDF 397 KB 日本語 \| 2001-10-30 \| PDF 523 KB
Network Analysis - Balanced Measurement Example: SAW Filters (1373-5) SAW filters are commonly used in wireless communication products because of their very sharp response characteristics, relatively low insertion loss, and low cost. Application Note 2001-09-17	PDF 446 KB Sprachen English \| 2001-09-17 \| PDF 446 KB 日本語 \| 2001-10-10 \| PDF 692 KB
Network Analysis - Characterize High-Power Components (AN 1287-6) This Application Note describes linear and nonlinear measurements of high-power components and how to use a network analyzer for making them. Application Note 2003-03-12	PDF 199 KB Sprachen English \| 2003-03-12 \| PDF 199 KB 日本語 \| PDF

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