光学和光子
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Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.
应用说明 2009-03-24 |
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How to integrate switches and an optical attenuator in the amplifier test set-up
This application note discusses how to ensure an accurate characterization, and how to integrate the required measurement equipment.
应用说明 2002-09-02 |
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Improving the Accuracy of Optical Transceiver Extinction Ratio Measurements (AN 1550-9)
This paper discusses extinction ratio - measurement challenges and causes of measurement uncertainty & variability. In addition, it describes methods for reducing uncertainties caused by non-ideal performance of standard reference receivers.
应用说明 2009-02-21 |
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Introduction to BER Testing of WDM Systems (AN 1299)
Wavelength division multiplexing (WDM) is a new and exciting technology for migrating the core optical transmission network to higher bandwidths. The ability to transfer multiple optical carriers over the same span of fiber promises almost unlimited bandwidth. However, the ultimate test for any...
应用说明 1997-12-01 |
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ITU-T 0.172 Bridges the Generation Gap from PDH to SDH White Paper
This paper provides the background to ITU-T 0.172, its relationship with ITU-T 0.171, and the impact this new recommendation has for legacy network equipment.
应用说明 2000-06-06 |
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Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale
This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment.
应用说明 2005-06-15 |
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Laser Chirp
Chirp is a measure of the change in transmitter optical frequency as the transmitter is modulated.
应用说明 2008-06-04 |
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Lightwave Signal Analyzers Measure Relative Intensity Noise (PN 71400-1)
This product note describes techniques to measure laser intensity noise with the Agilent 714000C and 71410C lightwave signal analyzers. It includes RIN examples and measurements.
应用说明 2000-07-01 |
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Loop Bandwidth and Clock Data Recovery in Oscilloscope Measurements (AN 1304-6)
This application note describes loop bandwidth and clock data recovery in oscilloscope measurements.
应用说明 2002-05-30 |
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Making Time Resolve Chirp Measurements
This application note covers laser modulation methods, time-resolved chirp (TRC) measurement methods, and applications of TRC measurement data to predict laser perfomance in a transmission system.
应用说明 2002-03-12 |
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Measuring High Power Waveforms with the 86100A DCA and the 86101A or 86103A Reference Receiver
Product Note 86100-2 discusses the Agilent 86100A Digital Communications Analyzer (DCA)with the 86101A/103A plug-in module, designed to perform Gigabit Ethernet and Fibre Channel compliance testing.
应用说明 2000-06-14 |
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Measuring IL and PDL spectra with the fast-switching N7786B
The advantages and details of a new method for swept-wavelength IL and PDL measurement is introduced, including configuration details for the necessary instruments and software.
应用说明 2009-04-10 |
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Measuring Jitter in Digital Systems (AN 1448-1)
Measuring jitter and how to calculate total jitter.
应用说明 2008-01-30 |
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Measuring Polarization Dependent Loss of Passive Optical Components
A new document on the methods of characterizing passive optical components.
应用说明 2008-12-01 |
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Measuring the Dependence of Optical Amplifiers on Input Power Using an Attenuator
This application note describes the important optical amplifier properties of gain and noise figures and their dependence on the powers and wavelengths of the input signals.
应用说明 2002-03-11 |
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Method of Implementation (MOI) for DisplayPort Sink Compliance Test
Method of Implementation (MOI) for DisplayPort Sink Compliance Test
应用说明 2008-08-18 |
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MOI for SATA RSG Tests, SATA Interoperability Program Rev. 1.3
Agilent Method Of Implementation for SATA RSG Tests, Serial ATA Interoperability Program Revision 1.3
应用说明 2008-05-30 |
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Narrow-band PMD Measurements with the Agilent 8509C (PN 8509-2)
This product note provides information about making narrow-band Polarization Mode Dispersion (PMD) measurements using the Agilent 8509B Lightwave Polarization Analyzer.
应用说明 2001-02-01 |
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Packet over SONET/SDH (POS) Functional Testing Product Note
Packet over SONET/SDH (POS) has emerged as the technology of choice for high-speed routers as it enables efficient transmission of internet protocol (IP) packets directly over SONET/SDH.
应用说明 2000-09-01 |
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PCI Express® Revision 2 - Receiver Testing With J-BERT N4903A and 81150A Pulse
应用说明 2008-12-03 |
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Polarization Measurements of Signals and Components (PN-8509-1)
This product note discusses various types of polarization measurements, introduces related polarization phenomena, presents measurement setups, procedures and typical Agilent 8509 test results.
应用说明 2002-06-21 |
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Polarization-dependent Loss (PN 11896-2)
This product note discusses the concept of PDL and gives examples of typical values that are expected for common lightwave components.
应用说明 2000-06-01 |
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Precision Jitter Analysis Using the Agilent 86100C DCA-J (PN 86100C-1)
This product note provides a guide to making jitter measurements with the Agilent 86100C DCA-J.
应用说明 2007-03-07 |
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Precision Jitter Transmitter
This paper introduces a precisely calibrated jitter source capable of applying a wide variety of jitter signals in different combinations at adjustable amplitudes. The system, calibration techniques, and examples are discussed.
应用说明 2005-06-20 |
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Probing High-Speed Signals with the 86100 Series of Wide-Bandwidth Sampling Oscilloscopes (86100-6)
Product Note 86100-6 discusses three important measurement accessories that help make probe-based measurements both simple and accurate for the Agilent 86100 Wide-Bandwidth Oscilloscope.
应用说明 2011-07-28 |
