RF & Microwave
For most of your RF & Microwave measurement needs, you can find application & solution information here.
Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.
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- RF & Microwave Design (15)
- X-parameters (4)
- Passive Intermodulation (PIM) (1)
- Noise Figure Measurements (18)
- Design & Test Integration (20)
- Pulsed-RF Measurements (12)
- EMI & EMC (9)
- Signal Monitoring, Geolocation (1)
- Impedance (30)
- ESL Design (16)
- Phase-Locked Loops (10)
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- Notes d’application
- Notes d’application (210)
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- Notes d’application
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Network Analysis Basics - 10 Hints for Making Better Network Analyzer Measurements (AN 1291-1B)
This Application Note contains hints to help you understand and improve your use of network analyzers, and a summary
of network analyzers and their capabilities.
Notes d’application 2001-09-17 |
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Network Analysis Solutions Advanced Filter Tuning Using Time Domain Transforms (AN 1287-10)
Tuning multi-stage, coupled-resonator band-pass filters is difficult due to interactions between resonator and coupling tuning. To achieve the proper pass-band response and to get low return loss you must precisely tune the frequency of each resonator and precisely set each coupling between the...
Notes d’application 2003-05-25 |
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Network, Spectrum, and Impedance Evaluation of Electronic Circuits and Components (AN 1308-1)
This Application Note describes how the Agilent 4395A/96B can be used to contribute fast cycle time for electronic circuit/component development.
Notes d’application 2001-12-19 |
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New Generation Analyzer Offers Exceptional and Powerful Analysis Functions for RF...(PN E4991A-1)
This Product Note describes the key technology of RF impedance measurement, today's RF component evaluation methodologies and advanced features of the E4991A product.
Notes d’application 2001-05-24 |
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New Technologies for Accurate Impedance Measurement (40Hz to 110MHz)
Auto-balancing bridge method is the best technique to make an accurate impedance measurement in LF frequency. The recent technical innovation successfully expanded its upper frequency limitation from 40MHz to 110MHz. This Product Note discusses how its made and other new technologies included in...
Notes d’application 2008-11-20 |
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New Test Methodologies Improve EMI Testing Efficiency
This 7 page application note discusses a sampling of PSA features of interest to the EMI community that will increase both the quality of data and speed by which results can be derived.
Notes d’application 2008-05-28 |
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NFA Series Noise Figure Analyzer, Programming Examples
This Product Note contains programming examples of measurement scenarios written in pseudo code, to enable the automated control of the NFA Series Noise Figure Analyzers using SCPI standard commands.
Notes d’application 2000-11-27 |
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Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Noise figure is a key performance parameter in many RF systems. This application note covers many topics related to noise figure measurements including the Y-factor method.
Notes d’application 2013-04-12 |
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Noise Figure Measurements of Frequency Converting Devices, AN 1487
"This application note provides details and examples about how the Agilent NFA Series noise figure analyzer (NFA) performs measurements in amplifier, downconverter and upconverter measurement mode".
Notes d’application 2004-02-06 |
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Noise Figure Primer (AN 57)
This Application Note is for information only. Agilent no longer sells or supports these products.
Notes d’application 1965-01-01 |
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Noise Figure Uncertainty Calculator
The noise figure uncertainty calculator has been created to aid your design work, from components through to systems, helping you meet the continued demand for higher system performance.
Outil d'analyse 2012-10-18 |
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Noise Power Ratio Measurements Using Agilent E2507B/E2508A Communications Signal Simulator (PN E2507B & PN E2508A)
The NPR measurement requires a stimulus source to generate conditioned noise and a measurement receiver to analyze the changes in the noise after it passes through the device under test.
This Product Note shows how the Agilent E2507B or E2508A Multi-format Communications Signal Simulator...
Notes d’application 2000-08-01 |
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Non-Zero Noise Figure After Calibration (AN 1484)
This Application Note attempts to explain the reasons behind the zero-error and shows with examples that it does not have a compromising effect on instrument accuracy in a measurement situation.
Notes d’application 2004-01-20 |
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Obtain Flat-Port Power with Agilent's PSG User Flatness Correction or External Leveling Functions
The PSG series is ideally suited for design and test systems with high frequencies, wide bandwidths and complex modulation formats. This Product Note explains how to obtain flat...
Notes d’application 2003-02-04 |
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On-Wafer SOLT Calibration Using a 4-port, 20 GHz, PNA-L Network Analyzer
This documentation is intended for on-wafer applications using the 4-port, 20 GHz, PNA-L network analyzer with two dual probes to achieve full 4-port on-wafer calibrations manually.
Notes d’application 2006-10-17 |
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Optimized Impedance Standard Substrate Designs for Dual and Differential Applications
by Cascade Microtech
Notes d’application 2003-12-09 |
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Optimizing Electronic Component and Material Impedance Measurements (AN 369-1)
Impedance measurements are a basic means of evaluating materials and electronic components that support the technical innovations of electronic instruments and equipment. Impedance characteristics of the components used in circuits or of materials vary with frequency, signal level, or the signal...
Notes d’application 2000-10-01 |
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Optimizing Spectrum Analyzer Amplitude Accuracy (AN 1316)
This Application Note covers the factors affecting the accuracy (or uncertainty)
of amplitude measurements made with spectrum analyzers, and explains how to calculate worst-case uncertainty in general situations. It will help you analyze a measurement and decide what procedure to follow to...
Notes d’application 2000-08-01 |
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Optimizing Spectrum Analyzer Dynamic Range (AN 1315)
The dynamic range of a spectrum analyzer is traditionally defined as the ratio, in dB, of the largest to the smallest signals simultaneously present at the input of the spectrum analyzer that allows measurement of the smaller to a given degree of uncertainty. The signals of interest can either be...
Notes d’application 2000-05-01 |
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Optimizing Spectrum Analyzer Measurement Speed (AN 1318)
Whether you are installing a new, high-speed production line, making transmitter measurements in the field, or designing a new low-noise amplifier, the speed of your spectrum analyzer will greatly affect your productivity. With the speed that the latest generation of spectrum analyzers offers...
Notes d’application 2000-05-01 |
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Optimizing VCO/PLL evaluations and PLL synthesizer designs AN 1330-1
This application note clarifies the role and performance requirements of the synthesized oscillator used in wireless communication equipment, and introduces our test solution for VCO/PLL evaluation.
Notes d’application 2000-09-01 |
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P-Series Measurement Uncertainty Calculator
Measurement Uncertainty Calculator for the N1911A and N1912A Power Meters and the N1921A and N1922A Power Sensors.
Notes d’application 2008-11-01 |
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Pager Testing Using the 8648A with an Internal Pager Encoder, Option 1EP (PN 8648A-1)
This Product Note covers three main topics: paging theory overview; paging tests; and recommended test equipment. The topics examined extend beyond testing and provide a general overview of paging. The goal of this paper is to assist you in repairing pagers.
Contents:
Introduction...
Notes d’application 1996-07-01 |
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Peak Deviation and Center Frequency Measurements for CT2 and DECT Radios (AN 1200-12)
The use of digital modulation in mobile communications systems is growing rapidly. Information in the form of 1s and 0s is often transmitted as two different frequencies. This is known as minimum shift keying or GMSK if the data is filtered. Measuring the deviation accurately on a bursted signal...
Notes d’application 2000-08-01 |
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Performance Spectrum Analyzer Series: Swept and FFT Analysis Application Note
This Product Note covers the measurement speed and other benefits of advanced signal processing in the new PSA Performance Spectrum Analyzer Series.
Notes d’application 2004-10-19 |
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