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Using Agilent 6690A Series System dc Power Supplies for Automobile Battery Simulation (PN 6690A-2) 
These power supplies are ideal for simulating the automobile battery under all loading conditions. It can also be used to test electronic equipment while simulating actual battery voltage fluctuations.

Notes d’application 2001-07-10

PDF PDF 81 KB
Using Battery Drain Analysis to Improve Mobile-Device Operating Time 
Using specialized tools and analysis techniques can help you create mobile-device designs that extend battery life.

Notes d’application 2002-09-19

PDF PDF 160 KB
Langues 
Using Boundary Scan to Link Design and Manufacturing Test 
By leveraging boundary-scan tests generated in Design and re-using them at Manufacturing Test, manufacturers can produce long-term benefits in terms of lower costs, greater efficiencies and higher quality products.

Notes d’application 2003-03-01

PDF PDF 502 KB
Using Lead-Free PCB Finishes at Manufacturing In-circuit Test Stage 
The purpose of this document is to share experiences and educate engineers regarding different PCB surface finishes and the specific changes required in the PCB build process to allow for ICT.

Notes d’application 2004-08-08

PDF PDF 102 KB
Using NDFCOL.EXE, the NDF "Line Up the Columns" Utility 
NDFCOL.EXE is a handy little utility that will form neat columns of data in NDF files.

Notes d’application 2002-06-06

 
Using Pop-up Windows 
There are occasions where the use of a pop-up window would be advantageous while testing boards on the Agilent 3070. This article is meant to highlight one method that can be used to obtain that end.

Notes d’application 1996-01-01

PDF PDF 18 KB
Using the 230A Power Amplifier (AN 76) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Notes d’application 1967-08-01

PDF PDF 1 MB
Using Two Power Supplies for Higher Current Solar Cell Characterizing  
This application note describes the Agilent 663XB Power Supplies connected in anti-series to achieve four-quadrant operation for Solar Cell and Module Testing.

Notes d’application 2009-04-29

PDF PDF 280 KB
Langues 
UWB Antenna Measurements with the 20 GHz E5071C ENA Network Analyzer 
This application note describes benefits of measuring UWB antennas with the E5071C 20 GHz option and introduces measurement tips for using the gating feature with the E5071C.

Notes d’application 2008-11-10

PDF PDF 278 KB
Langues 
Version 7.x ASAP Best Practices  
In an effort to standardize programming practices for the Agilent 5DX, Agilent has created a set of procedures representing 5DX "best practices" that address various aspects of the programming process.

Notes d’application 2001-07-25

 
What to Consider When Selecting the Optimal Test Strategy 
This paper addresses several issues for selecting the optimal inspection strategy, presenting data from many studies that Agilent has performed in the quest to find the optimal test / inspection strategy.

Notes d’application 2003-03-01

PDF PDF 175 KB
When to Use AOI, When to Use AXI, and When to Use Both 
by Stig Oresjo, senior test strategy consultant at Agilent Technologies.

Notes d’application 2002-12-01

PDF PDF 70 KB
Windows & Unix Feature Comparison 
The Windows & Unix 3070 Feature Comparison document provides a detailed listing of features translated to the Windows based 3070 from the Unix based 3070.

Notes d’application 2002-07-31

PDF PDF 71 KB
Writing Flash Memory with Agilent 3070 Systems 
Flash memory is traditionally programmed on PROM programmers, but some manufacturers report a one percent damage rate due to the extra handling steps required!

Notes d’application 2001-05-18

PDF PDF 31 KB
X-ray Test Users Utilize BOM Explorer to Change  
Automated X-ray Inspection 5DX Users can save time by implementing these quick and easy steps to use BOM explorer to change "no pops" to "untested".

Notes d’application 2007-10-12

 
Zero Volt Electronic Load 
Increasing demand for lower voltage power supplies is pressuring test system designers to identify electronic load test equipment designed to adequately perform at these lower voltages. In this Product Note read about how to configure Agilent DC Electronic Loads, with option J04, to perform...

Notes d’application 2001-06-07

PDF PDF 141 KB
“Shotgunning”, a Bad Fit for Lead-Free Test 
Shotgunning, a common repair technique in functional test, will be negatively affected by lead-free processes. This article explores the technique and draws broad conclusions regarding the impact of lead-free on electronics manufacturing test

Notes d’application 2006-02-07

PDF PDF 44 KB

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