Discuter avec un expert

Digital Design & Interconnect Standards

Achieve your best design with Agilent. Investigate specific solutions for high speed standards plus solutions for your high-speed digital design cycle (design, simulation, analysis, debug compliance and signal integrity) challenges.

Explorer les vidéos YouTube 

Nouveautés

Liens associés

Affiner la liste

retirer tout le raffinement

Par application

Par type de contenu

Par catégorie de produit

1-25 sur 165

Sort:
10 Hints for Getting the Most from your Frequency Counter 
Maximize the results you get from your frequency counter through 10 hints from better from understanding the architecture to making faster measurements.

Notes d’application 2008-04-18

PDF PDF 263 KB
Langues 
10 Reasons to Upgrade to a 16800 or 16900 Series Logic Analyzer 
10 Reasons to Upgrade to a 16800 or 16900 Series Logic Analyzer

Notes d’application 2007-12-03

PDF PDF 999 KB
Langues 
6 Hints for Better SATA and SAS Measurements 
These 6 Hints for better SATA and SAS measurements cover Tx, Rx, Impedance and Return Loss, and Host/Device Digital testing challenges.

Notes d’application 2012-02-02

PDF PDF 1.59 MB
8 Hints for Debugging and Validating High-speed Buses 
8 Hints for Debugging High-speed Buses

Notes d’application 2002-03-05

PDF PDF 2.24 MB
8 Hints for Debugging Siemens MCU-based Designs 
A new type of instrument, the mixed signal oscilloscope (MSO), closes the gap in MCU debugging tools. The Agilent 54645D from Hewlett-Packard combines two analog scope channels with 16 digital logic channels, so you can monitor analog and digital lines at the same time. This MSO offers more...

Notes d’application 1998-11-01

PDF PDF 736 KB
A Simple, Powerful Method to Characterize Differential Interconnects 
The Automatic Fixture Removal (AFR) process is a new technique to extract accurate, high bandwidth models of interconnects that is both simple and accurate.

Notes d’application 2011-06-17

PDF PDF 3.48 MB
A Time-Saving Method for Analyzing Signal Integrity in DDR Memory Buses 
This application note covers new tools and measurement techniques for characterizing and validating signal integrity of DDR (double data rate synchronous dynamic random access memory) signals.

Notes d’application 2008-09-10

PDF PDF 792 KB
Langues 
Accurate Calibration of Receiver Stress Test Signals for PCI Express® Rev. 3.0 
This paper describes the calibration of the receiver-stress signal according to the base specification of PCIe3. The calibration of the RX test signal is different from PCIe 2.0.

Notes d’application 2011-06-22

PDF PDF 4.82 MB
Langues 
Advanced Jitter Generation and Analysis Product Note 
This product note shows how the Agilent pulse generators can be used with the DCA-J Oscilloscope.

Notes d’application 2004-10-04

PDF PDF 549 KB
Advanced Memory Buffer (AMB), Characterization of Timing and Voltage Specification 
Advanced Memory Buffer (AMB), Characterization of Timing and Voltage Specification

Notes d’application 2005-09-22

PDF PDF 812 KB
Advanced Techniques for PCIe 3.0 Receiver Testing-Paper 
Advanced Techniques for PCIe 3.0 Receiver Testing-Paper

Notes d’application 2011-09-01

PDF PDF 2.20 MB
Advanced VNA-Based Test Systems for Analysis of High-Speed Digital Interconnect - Application Note 
Discusses interconnect testing and present solutions based on the latest generation of test software (PLTS2011) for Agilent's line of performance network analyzers (PNAs) focused on Software.

Notes d’application 2012-01-19

PDF PDF 2.22 MB
Langues 
Agilent HDMI 1.4 Whole Solution 
Media Recommended in CTS 1.4

Notes d’application 2009-11-20

PDF PDF 1.89 MB
Agilent Method of Implementation (MOI) for 10GBASE-T Ethernet Cable Tests 
Agilent Method of Implementation (MOI) for 10GBASE-T Cable Tests Using Agilent E5071C ENA Option TDR

Notes d’application 2013-05-21

PDF PDF 2.13 MB
Agilent Method of Implementation (MOI) for DisplayPort Cable-Connector Assembly Compliance Test 
Agilent Method of Implementation (MOI) for DisplayPort Cable-Connector Assembly Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR

Notes d’application 2013-02-18

PDF PDF 1.29 MB
Agilent Method of Implementation (MOI) for MHL Cables Compliance Tests 
Agilent Method of Implementation (MOI) for MHL Cable Compliance Tests Using Agilent E5071C ENA Network Analyzer Option TDR

Notes d’application 2013-02-14

PDF PDF 1.76 MB
Langues 
Agilent Method of Implementation (MOI) for MIPI D-PHY Conformance Tests 
Agilent Method of Implementation (MOI) for MIPI D-PHY Conformance Tests Using Agilent E5071C ENA Network Analyzer Option TDR

Notes d’application 2011-12-01

PDF PDF 920 KB
Agilent Method of Implementation (MOI) for MIPI M-PHY Conformance Tests 
Agilent Method of Implementation (MOI) for MIPI M-PHY Conformance Tests Using Agilent E5071C ENA Network Analyzer Option TDR

Notes d’application 2011-12-01

PDF PDF 918 KB
Agilent Method of Implementation (MOI) for PCI Express 3.0 PCB Differential Trace Impedance Test 
Agilent Method of Implementation (MOI) for PCI Express 3.0 PCB Differential Trace Impedance Test Using Agilent E5071C ENA Network Analyzer Option TDR

Notes d’application 2012-10-16

PDF PDF 1.62 MB
Agilent Method of Implementation (MOI) for SATA RXTX Compliance Test 
Agilent Method of Implementation (MOI) for SATA RXTX Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR

Notes d’application 2011-01-12

PDF PDF 1.19 MB
Agilent Method of Implementation (MOI) for SATA SI Compliance Test 
Agilent Method of Implementation (MOI) for SATA SI Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR

Notes d’application 2011-01-12

PDF PDF 1.41 MB
Agilent Method of Implementation (MOI) for USB3.0 Cable-Connector Assembly Compliance Test 
Agilent Method of Implementation (MOI) for USB3.0 Cable-Connector Assembly Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR

Notes d’application 2012-12-17

PDF PDF 1.82 MB
Agilent MOI for SATA SI (Cable) Tests Using Agilent E5071C with Option TDR 
-

Notes d’application 2011-01-12

PDF PDF 1.41 MB
Agilent MOI for SATA TXRX Tests Using Agilent 86100C TDR 

Notes d’application 2009-09-10

PDF PDF 479 KB
Agilent MOI for SATA TXRX Tests Using Agilent E5071C ENA with Option TDR 
-

Notes d’application 2011-01-12

PDF PDF 1.19 MB

1 2 3 4 5 6 7 Page suivante