Digital Design & Interconnect Standards
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- Application Note (164)
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76-100 of 164
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Improving the Accuracy of Optical Transceiver Extinction Ratio Measurements (AN 1550-9)
This paper discusses extinction ratio - measurement challenges and causes of measurement uncertainty & variability. In addition, it describes methods for reducing uncertainties caused by non-ideal performance of standard reference receivers.
Application Note 2009-02-21 |
PDF
672 KB
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Improving Usability and Performance in High-Bandwidth Active Oscilloscope Probes (AN 1419-02)
Understand how to get minimal probe loading and highest-possible-performance representation of your signal.
Application Note 2002-11-01 |
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In-circuit Debug of FPGAs
This application note covers key methods of debugging FPGAs along with technologies that reduce the number of pins needed for debug.
Application Note 2003-05-01 |
PDF
1.43 MB
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InfiniBand System Level Debugging (AN 1382-1)
This application note is written for R & D engineers developing InfiniBand processors and InfiniBand system designers and integrators. It covers key concepts underlying system-level debug and validation of InfiniBand systems.
Application Note 2004-03-17 |
PDF
2.10 MB
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Integrated Debugging-A New Approach to Troubleshooting Your Designs with Real-Time Oscilloscopes
Traditional debugging can be time consuming and inefficient. With Agilent Infiniium oscilloscopes,
“integrated debugging” is a reality, and it leads you directly to the root cause of problems.
Application Note 2008-01-30 |
PDF
1.17 MB
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Jitter Analysis Techniques for High Data Rates (AN 1432)
This new application note describes the basic jitter measurements and the specific measurement techniques used in SONet/SDH/OTN and Gigabit Ethernet applications.
Application Note 2003-02-03 |
PDF
4 MB
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Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale
This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment.
Application Note 2005-06-15 |
PDF
515 KB
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Jitter Fundamentals: Jitter Tolerance Testing with Agilent ParBERT 81250
This applicaiton note describes gain fast and efficient insight into the operation and performance of CDR, clock system and jitter tolerance.
Application Note 2003-12-02 |
PDF
3.18 MB
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Limitations and Accuracies of Time and Frequency Domain Analysis of Physical Layer Devices
Application Note 2005-11-01 |
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2.83 MB
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Loop Bandwidth and Clock Data Recovery in Oscilloscope Measurements (AN 1304-6)
This application note describes loop bandwidth and clock data recovery in oscilloscope measurements.
Application Note 2002-05-30 |
PDF
600 KB
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Low Voltage Differential Signaling, (AN 1382-6)
Using LVDS for High Speed Data Transmission
Application Note 2001-12-17 |
PDF
2.53 MB
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Maximizing DDR BGA probe Bandwidth for Superior Signal Fidelity
The use of BGA probes for probing DDR DRAM is becoming more popular and almost a requirement as memory design gets more complex and compact and data rate gets higher. DDR3 and DDR4 data rate is increasing from 800MT/s to possibly 3200MT/s.
Application Note 2012-01-31 |
PDF
1.40 MB
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Measurement Uncertainty of VNA based TDR/TDT Measurement Application Note
This application note explains the theory of measurement uncertainty in TDR/TDT measurement with the ENA Option TDR.
Application Note 2011-07-08 |
PDF
1.77 MB
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Measuring Characteristic Impedance of Short Rambus Motherboard Traces (AN 1304-4)
This application note tells you how to perform characteristic impedance measurements on Rambus motherboards and SO-RIMM's using TDR with normalization and verification.
Application Note 2000-11-01 |
PDF
426 KB
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Measuring Close-In AM in the Presence of FM (PN 8590-5)
This Product Note explains how to use the FFT function in 8590 C/E/L-series Spectrum Analyzers with Fast Fourier Transform (FFT). FFT simplifies AM analysis by providing a smart user interface.
AM measurements of RF or microwave signals are quick, continuous, and repeatable even when FM is...
Application Note 2000-07-01 |
PDF
137 KB
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Measuring Differential Impedance with TDR to Improve High-Speed Bus Designs, (AN 1382-5)
Improving High-Speed Bus Designs with TDR
Application Note 2001-12-20 |
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2.30 MB
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Measuring Jitter in Digital Systems (AN 1448-1)
Measuring jitter and how to calculate total jitter.
Application Note 2008-01-30 |
PDF
1.91 MB
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Measuring Jitter with the Agilent E4874A Characterization Software Components
The Product Note shows how to measuring jitter with the Agilent E4874A Characterization Software Components on the Agilent 81200 Data Generator/Analyzer Platform. See also R & D Central at: http://www.agilent.com/find/randd Select "Bit Error Ratio Testing (BERT)" on that page. Then...
Application Note 2000-06-01 |
PDF
102 KB
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Measuring Third-Order Intermodulation, N dB Bandwidth, and Percent AM with Built-In Functions (PN...
This Product Note explains how to use three of the advanced functions found in all 8590 C/E/L-series Spectrum Analyzers. The three functions are:
Contents
Third-Order Intermodulation
N dB Bandwidth
Percent AM
Application Note 2000-07-01 |
PDF
86 KB
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Meeting the Challenge of Computer System Validation
This white paper shows the approach of using exerciser test cards to accomplish this objective.
Application Note 2002-05-13 |
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Method of Implementation (MOI) for DisplayPort
Agilent Method of Implementation (MOI) for DisplayPort Sink Compliance Tests
Application Note 2007-11-03 |
PDF
1.99 MB
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Method of Implementation (MOI) for DisplayPort Sink Compliance Test
Method of Implementation (MOI) for DisplayPort Sink Compliance Test
Application Note 2008-08-18 |
PDF
1.87 MB
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Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test
Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test Using Agilent E5071C ENA Network Analyzer Option TDR.
Application Note 2013-04-24 |
PDF
2.02 MB
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Microprobing with the Agilent 86100A Infiniium DCA (AN 1304-3)
A guide to making accurate measurements with the Agilent 86100A Infiniium DCA and Time Domain Reflectometer using Cascade Microtech high frequency probes.
Application Note 2000-11-01 |
PDF
1.84 MB
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Mixed Analog & Digital Signal Debug and Analysis Using a Mixed-Signal Oscilloscope
Using a mixed analog and digital 32 bit WLAN application example, this note shows how an MSO with deep memory makes debugging today’s mixed analog and digital designs easier than ever before.
Application Note 2009-06-01 |
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