Control & Automation of Instruments & Systems

26-50 of 184

Boundary Scan Ground Bounce Suppression Boundary-Scan circuitry, while in the process of testing interconnections, can set up and excite current surges on a board. This in turn can cause "ground bounce". Application Note 1998-04-24	PDF 14 KB
Boundary Scan Helps EMS Companies Cut Test Costs and Increase Revenues Electronics Manufacturing Services (EMS) providers can utilize boundary-scan to reduce test cost expenses and also generate additional revenue opportunities. Application Note 2003-03-01	PDF 242 KB
Boundary-Scan Technology, Justification, and Test Implementation for Designers This paper provides practical insight for designers on the merits, design, and test implementation of Boundary-Scan Technology. Application Note 1998-05-27	PDF 29 KB
Breakthrough Innovations: Agilent Automated Silicon Nails Automated Silicon Nails takes the popular IEEE 1149.1 Boundary-Scan standard even further by using Boundary-Scan chains to automatically test non-Boundary-Scan devices. Application Note 2001-08-15	PDF 460 KB
Building Hybrid Test Systems Part 1: Laying the groundwork for a successful transition Application Note 2008-03-19	PDF 270 KB
Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance Application Note 2008-10-15	PDF 281 KB Sprachen English \| 2008-10-15 \| PDF 281 KB 中文（简体） \| 2008-10-15 \| PDF 281 KB 日本語 \| 2008-10-15 \| PDF 1020 KB
Calibrating Signal Paths in RF/Microwave Test Systems (AN 1465-19) Application Note 2005-10-31	PDF 126 KB Sprachen English \| 2005-10-31 \| PDF 126 KB 日本語 \| 2006-01-18 \| PDF 503 KB
Canning Process Characterization Following the description of the canning process application, measurement and control requirements for characterizing the process are discussed, then in this Application Note, Agilent data acquisition equipment suitable for such an application is listed. Description In the canning industry... Application Note 1997-11-01	PDF 94 KB
Cathodic Protection of Steel in Concrete Using LXI This document discusss Cathodic protection as a remarkable technique that can substantially extend the life of a building structure by impeding corrosion. Application Note 2007-04-25	PDF 390 KB
CDPD MDBS Cell Site Test Software Troubleshooting This Product Note is a troubleshooting guide designed to answer the most problematic and typical questions that occur when testing a CDPD MDBS with the Agilent Technologies 8921A CDPD test solution. General situations Data collection does not work A parameter you changed does not... Application Note 1997-06-01	PDF 102 KB
Choosing Your Test System Software Architecture (AN 1465-4) Application Note 2004-12-21	PDF 409 KB Sprachen English \| 2004-12-21 \| PDF 409 KB 中文（简体） \| 2006-09-01 \| PDF 1.09 MB 日本語 \| 2004-07-14 \| PDF 791 KB 中文（繁體） \| 2004-05-07 \| PDF 528 KB 한국어 \| 2004-05-07 \| PDF 528 KB
Choosing Your Test-System Hardware Architecture & Instrumentation (AN 1465-5) Application Note 2004-12-21	PDF 230 KB Sprachen English \| 2004-12-21 \| PDF 230 KB 中文（简体） \| 2006-09-01 \| PDF 937 KB 日本語 \| 2004-01-19 \| PDF 686 KB
Commercial Energy Conservation In this Application Note following the description of the commercial energy conservation application measurement and control requirements for characterizing the process are discussed. Then, Agilent VXI-based data acquisition equipment suitable for such an application is listed. Description... Application Note 1997-11-01	PDF 106 KB
Comparing AOI and AXI Choosing the right technology requires looking at board mix, capital budget and other business considerations. But most of all, you need to understand the typical characteristics of each technology. Application Note 2001-07-25	PDF 42 KB
Connecting a UPS to a 3070 Controller This paper describes how to connect a UPS to the 3070 testhead controller. It uses the Advanced Power Conversion Smart-UPS with PowerChute Plus software. Application Note 2003-01-07	PDF 87 KB
Considerations for Surface Map Setup The concept of delta-Zs is perhaps the most difficult thing to understand about the surface map process. Application Note 2006-08-08
Dealing with Board Thickness Variations The Agilent 5DX has the capability to be implemented such that it can accommodate thickness variations on a board-by-board basis. NOTE: Content described is in the 5DX Reference Guide but is no longer in Chapter 7 as mentioned herein. Application Note 2001-05-16	PDF 31 KB
Defining three classes of LAN eXtensions for Instrumentation (LXI) The LXI standard defines three types of instruments that can be readily mixed and matched within a test system. Application Note 2006-01-12
Design Considerations for PC Board Carriers for Use in the Agilent 5DX There are several reasons why it may be necessary or desirable to use a carrier to transport printed circuit assemblies through the 5DX. This paper discusses these and some considerations for the design of suitable carriers. Application Note 2005-07-13	PDF 918 KB
Design for Testability - Test for Designability This paper addresses testability considerations, both physical and logical, and focuses on both the new constraints and the new freedoms of modern manufacturing test in the ever-changing challenge. Application Note 2003-01-28	PDF 852 KB
Discharge on Unpowered Agilent 3070 Systems This paper is applicable to both powered and unpowered Agilent 3070 systems, but does not explain how a discharge routine is created on an Unpowered system. Application Note 2003-06-13
Discreet Analog Device Testing The Agilent 3070 series has quite a few built in features to make developing board tests easier, while protecting the operator, the board under test, and the 3070 itself from harm. Application Note 1998-10-29	PDF 26 KB
E6280A PNNI Signalling Test Software for the Broadband Series Test System Designed for Agilent's industry-standard Broadband Series Test System, this product facilitates analysis and verification of both the PNNI routing protocol, used to distribute netwrk topology and routing information between ATM network switch responses within private ATM networks. Go to: http... Application Note 2000-02-01	PDF 125 KB
Effective Multitap Transformer Testing Using a Scanner (AN 1224-5) This Application Note shows an effective multi-tap transformer measurement using a scanner and the Agilent 4263B LCR Meter. Application Note 2001-11-05	PDF 945 KB Sprachen English \| 2001-11-05 \| PDF 945 KB 日本語 \| 2002-06-18 \| PDF 604 KB
Effects of Lead Free Solders on Imaging Characteristics of the Agilent 5DX Laminographic X-ray Test The electronics industry is under pressure to migrate solder processes away from the usage of eutectic tin-lead solder and towards utilization of lead-free compounds. Application Note 1998-05-01	PDF 83 KB

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