Control & Automation of Instruments & Systems

126-150 of 184

System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note Using LAN in Test Systems: PC Configuration,the third note in the series, describes the additional capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10. Application Note 2004-10-19	PDF 204 KB
System Issues in Boundary-Scan Board Test While Boundary-Scan is a powerful test tool, test engineers are finding out that yesterday's DFT rules and test approaches may actually be detrimental to successfully testing systems on a board. Application Note 2003-01-28	PDF 37 KB
Taking and Using Diagnostic Images Storing images can be a helpful method for trouble-shooting and collaboration with support. This document explains the methods for taking images. In addition to the software revisions named, the document applies to all 5DX software versions. Application Note 2001-05-17	PDF 61 KB
Test and Inspection as Part of the Lead-free Manufacturing Process The paper addresses issues that will impact defect levels and defect spectrum during the transition to lead-free manufacturing. It also addresses different test and inspection systems’ readiness to test lead-free printed circuit board assemblies. Application Note 2005-02-22	PDF 421 KB
Test Coverage: What Does It Mean when a Board Test Passes? Originally presented at the 2002 International Test Conference -- Characterizing board test coverage as a percentage of devices or nodes having tests does not accurately portray coverage, especially in a limited access testing environment. Application Note 2003-07-28	PDF 266 KB
Test Strategy for Complex Printed Circuit Board Assemblies This paper proposes a new test strategy for complex boards since the trend in Printed Circuit Board Assembly (PCBA) technology is towards higher complexity. Application Note 1999-02-22	PDF 195 KB
Test System Developement Guide Notes 1465-1 through 1465-8 Application Note 2005-01-15	PDF 1.89 MB
Test-System Computer I/O Considerations (AN 1465-2) - Application Note The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing Application Note 2004-12-09	PDF 189 KB
Test-System Development Guide: Operational Maintenance (AN 1465-8) Application Note 2004-12-21	PDF 217 KB Langues English \| 2004-12-21 \| PDF 217 KB 中文（简体） \| 2006-09-01 \| PDF 829 KB 日本語 \| 2004-07-20 \| PDF 893 KB
Test-System Development Guide: A Comprehensive Handbook for Test Engineers Test-System Development Guide Application Note 2012-05-07	PDF 5.04 MB Langues English \| 2012-05-07 \| PDF 5.04 MB 中文（简体） \| 2007-06-27 \| PDF 4.82 MB 中文（繁體） \| 2007-06-27 \| PDF 4.82 MB
Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note This application note answers common questions about the use of drivers and direct I/O to send commands from a PC application to the test instrument. Application Note 2004-12-21	PDF 374 KB
Testing FPGullwing Misalignment Across the Pad A technique is described which enables detection of misalignment of gullwing joints across the joint using duplicate components and FPGullwing Misalignment. Application Note 2004-12-08	PDF 1.58 MB
Testing Transformers on Unpowered Systems This paper explains how to test basic analog parts, using unpowered systems. Application Note 2003-03-21	PDF 10 KB
Testing Uninterruptible Power Supplies Using Agilent 6800 Series ac Power Source/Analyzers This Product Note describes how Agilent ac sources can be used to help test uninterruptible power supplies in many different environments, including research and development, manufacturing, and incoming inspection. Application Note 2001-01-16	PDF 430 KB
The Benefits of Updating Your 3499A/B/C Switching System to the 34980A Switch/Measure Unit This application note will describe differences and advantages of the new 34980A as compared to the 3499A/B/C. Application Note 2006-11-27	PDF 646 KB Langues English \| 2006-11-27 \| PDF 646 KB 中文（简体） \| 2004-10-05 \| PDF 646 KB 日本語 \| 2004-10-18 \| PDF 756 KB
The Future of In-Circuit Testing in the High-speed, Complex Electronics Environment As board complexity and node counts continue to rise and high speed differential signaling continues to grow in popularity, In-Circuit Test needs to move quickly beyond the traditional realms. This article explores this in detail. Application Note 2007-10-31	PDF 176 KB Langues English \| 2007-10-31 \| PDF 176 KB 日本語 \| 2008-01-22 \| PDF 587 KB
The Importance of Test and Inspection When Implementing Lead-Free Manufacturing Many papers, articles, and studies have been written about process issues, reliability issues, repair issues, and the merits of different alloys. This paper addresses the impacts on test and inspection when going lead-free. Application Note 2004-08-20	PDF 260 KB
The Life of a 5DX Inspection C# File The {Hashed Panel Name}.C# file is basically cad information about a panel program. It is used in conjunction with various utilities to overlay cad data on images or provide cad data for filters. Application Note 2001-10-16	PDF 97 KB
The Why, Where, What, How, and When of X-ray Test How do the different AXI technologies work? What are the appropriate uses of 2D vs 3D X-ray? Where in the mfg process should AXI be placed? How can AXI be used to improve the mfg process? Application Note 2000-11-01	PDF 1.30 MB
Tips and Tricks for Using USB, LAN and GPIB This 12-page application note provides a variety of tips and tricks that will help you create flexible test systems that can easily incorporate USB, LAN, GPIB and RS-232C. Application Note 2006-05-03	PDF 277 KB
Tips for Optimizing Test System Performance in Linux Soft Real-Time Applications (AN 1465-31) This application note offers several tips for optimizing the soft real-time performance of off-the-shelf Linux systems. Application Note 2008-02-19	PDF 671 KB Langues English \| 2008-02-19 \| PDF 671 KB 日本語 \| 2008-04-09 \| PDF 1.55 MB
Tips for X-ray Users On Exporting NDF’s With No Loads Set To False Navigating CAD can be a time consuming process. Small tips can be extremely helpful in creating quality programs in a short amount of time. Application Note 2007-10-18
Tips in Using Agilent GPIB Solutions in National Instrument’s LabVIEW Environment Tips for using Agilent GPIB solutions in National Instrument’s LabVIEW environment. Application Note 2009-03-04	PDF 711 KB Langues English \| 2009-03-04 \| PDF 711 KB 日本語 \| 2009-05-25 \| PDF 1.12 MB
Transitioning from GPIB to LXI (AN 1465-22) This note compares GPIB and LXI, sketches hybrid system architectures, outlines a step-by-step approach to system set-up, and describes how to easily modify existing system software to work with LXI devices. Application Note 2006-04-03	PDF 299 KB Langues English \| 2006-04-03 \| PDF 299 KB 日本語 \| 2006-05-01 \| PDF 507 KB 中文（繁體） \| 2006-08-07 \| PDF 572 KB
Tying a Power Supply to Multiple Boards in a Panel If you have a situation with multiple boards on a panel, and you need to wire one or more power supplies to each board, you often can wind up with problems wiring power and ground. Usually, you'll see warnings of the type FXT66. Application Note 2001-06-12	PDF 16 KB

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