控制与自动化
去除所有优化151-175 / 184
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Tips for Optimizing Test System Performance in Linux Soft Real-Time Applications (AN 1465-31)
This application note offers several tips for optimizing the soft real-time performance of off-the-shelf Linux systems.
应用说明 2008-02-19 |
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Tips for X-ray Users On Exporting NDF’s With No Loads Set To False
Navigating CAD can be a time consuming process. Small tips can be extremely helpful in creating quality programs in a short amount of time.
应用说明 2007-10-18 |
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Tips in Using Agilent GPIB Solutions in National Instrument’s LabVIEW Environment
Tips for using Agilent GPIB solutions in National Instrument’s LabVIEW environment.
应用说明 2009-03-04 |
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Transitioning from GPIB to LXI (AN 1465-22)
This note compares GPIB and LXI, sketches hybrid system architectures, outlines a step-by-step approach to system set-up, and describes how to easily modify existing system software to work with LXI devices.
应用说明 2006-04-03 |
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Tying a Power Supply to Multiple Boards in a Panel
If you have a situation with multiple boards on a panel, and you need to wire one or more power supplies to each board, you often can wind up with problems wiring power and ground. Usually, you'll see warnings of the type FXT66.
应用说明 2001-06-12 |
PDF
16 KB
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Understanding and Configuring the 5DX Selftest and Black/White Level Tests
This paper discusses the theory and practice of 5DX automatic compensation tools, Selftest and gray level correction.
应用说明 2004-12-01 |
PDF
158 KB
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Understanding the Effects of Racking & System Interconnections (AN 1465-6)
应用说明 2004-12-21 |
PDF
235 KB
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Understanding the PCAP Polarity Reject Signal
This paper describes the algorithm used to determine if polarized capacitors are properly oriented.
应用说明 2004-12-02 |
PDF
1.09 MB
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UNIX vs. Windows Differences for 3070 Users
This documentation serves as a PC transition guide to help existing 3070 customers migrate from the Unix platform to the PC platform.
应用说明 2002-09-19 |
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Up-and-Down Programming DUT Power Supplies
There seems to be some confusion on what the current limits are when using the DUT supplies in the Agilent 3070 system. While this article is not meant to be an exhaustive treatise on the subject, a little clarification might help.
应用说明 2001-05-17 |
PDF
23 KB
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Use of the Test Results Command Processor
TRCMDPRO processes the results from the Agilent 5DX in a way that is specified by a command file. This file is TRCMDPRO.CMD. In addition to the software revisions named, the document applies to all 5DX software versions.
应用说明 1998-01-12 |
PDF
20 KB
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Use of Wrong Thickness Technique Gives Bad Test Results
Beginning with release 6.0, there are two techniques for measurement of solder thickness on the Agilent 5DX, each based on use of a different Confirmation & Adjustment panel.
应用说明 2000-12-31 |
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Using Boundary Scan to Link Design and Manufacturing Test
By leveraging boundary-scan tests generated in Design and re-using them at Manufacturing Test, manufacturers can produce long-term benefits in terms of lower costs, greater efficiencies and higher quality products.
应用说明 2003-03-01 |
PDF
502 KB
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Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note
The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test.
应用说明 2004-07-29 |
PDF
270 KB
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Using LAN in Test Systems: Applications (1465-14) - Application Note and Example Programs
Topics include balancing cost,
convenience and security in three
common LAN scenarios: sharing
instruments, remote monitoring and
data acquisition, and functional test
systems. Includes downloadable example programs.
应用说明 2005-04-01 |
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Using Lead-Free PCB Finishes at Manufacturing In-circuit Test Stage
The purpose of this document is to share experiences and educate engineers regarding different PCB surface finishes and the specific changes required in the PCB build process to allow for ICT.
应用说明 2004-08-08 |
PDF
102 KB
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Using Linux in Your Test Systems: Linux Basics (AN 1465-27)
If you haven’t used Linux in test applications, this document will provide a detailed overview. Topics include: A brief Linux history, why use Linux, free tools available for application development and an instrument control overview.
应用说明 2007-05-08 |
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Using Linux To Control LXI Instruments Through TCP (AN 1465-29)
TCP is one of two alternative protocols used by most LAN-based instruments. It is the more elegant from a programming standpoint. This application note explains how instrument control works through TCP.
应用说明 2007-06-13 |
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Using Linux to Control LXI Instruments Through VXI-11 (AN 1465-28)
VXI-11 is one of two alternative protocols used by most LAN-based instruments. It is based on RPC (Remote Procedure Calls). This application note explains how VXI-11 works and discusses a number of programming examples.
应用说明 2007-07-08 |
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Using Linux to Control USB Instruments (AN 1465-30)
Agilent’s USB instruments are compatible with USBTMC, a vendor-independent device class for test and measurement resources. This application note explains how USBTMC works and how you can use the generic services to control your USB instruments.
应用说明 2007-11-07 |
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Using LXI to Boost Throughput in Semiconductor Manufacturing
This document is a case study that discusses the successful customer implementation of an Agilent LXI solution for a multinational semiconductor manufacturer
应用说明 2007-04-25 |
PDF
234 KB
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Using NDFCOL.EXE, the NDF "Line Up the Columns" Utility
NDFCOL.EXE is a handy little utility that will form neat columns of data in NDF files.
应用说明 2002-06-06 |
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Using Pop-up Windows
There are occasions where the use of a pop-up window would be advantageous while testing boards on the Agilent 3070. This article is meant to highlight one method that can be used to obtain that end.
应用说明 1996-01-01 |
PDF
18 KB
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Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note
Using SCPI and Direct I/O vs. Drivers,
the fifth note in the series, outlines
the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems
应用说明 2004-12-13 |
PDF
408 KB
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Using the VISA COM I/O API in .NET - Application Note
The Microsoft .NET architecture has many features that make it an excellent environment for
Test & Measurement programmers. VISA COM
I/O is an update of the older VISA C API to work in and with COM technology.
应用说明 2007-03-16 |
PDF
345 KB
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