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Understanding and Configuring the 5DX Selftest and Black/White Level Tests 
This paper discusses the theory and practice of 5DX automatic compensation tools, Selftest and gray level correction.

Application Note 2004-12-01

PDF PDF 158 KB
Understanding the Effects of Racking & System Interconnections (AN 1465-6) 

Application Note 2004-12-21

PDF PDF 235 KB
Understanding the PCAP Polarity Reject Signal 
This paper describes the algorithm used to determine if polarized capacitors are properly oriented.

Application Note 2004-12-02

PDF PDF 1.09 MB
UNIX vs. Windows Differences for 3070 Users 
This documentation serves as a PC transition guide to help existing 3070 customers migrate from the Unix platform to the PC platform.

Application Note 2002-09-19

 
Up-and-Down Programming DUT Power Supplies 
There seems to be some confusion on what the current limits are when using the DUT supplies in the Agilent 3070 system. While this article is not meant to be an exhaustive treatise on the subject, a little clarification might help.

Application Note 2001-05-17

PDF PDF 23 KB
Use of the Test Results Command Processor 
TRCMDPRO processes the results from the Agilent 5DX in a way that is specified by a command file. This file is TRCMDPRO.CMD. In addition to the software revisions named, the document applies to all 5DX software versions.

Application Note 1998-01-12

PDF PDF 20 KB
Use of Wrong Thickness Technique Gives Bad Test Results 
Beginning with release 6.0, there are two techniques for measurement of solder thickness on the Agilent 5DX, each based on use of a different Confirmation & Adjustment panel.

Application Note 2000-12-31

 
Using .NET Methods to Add Functionality to IVI-COM Drivers  
This application note discusses the use of .NET methods to add functionality to IVI-COM drivers to access a deeper set of instrument functionality with minimal programming.

Application Note 2012-03-01

PDF PDF 335 KB
Languages 
Using Boundary Scan to Link Design and Manufacturing Test 
By leveraging boundary-scan tests generated in Design and re-using them at Manufacturing Test, manufacturers can produce long-term benefits in terms of lower costs, greater efficiencies and higher quality products.

Application Note 2003-03-01

PDF PDF 502 KB
Using IVI For Your Instrument Driver 
This application note describes the use of IVI drivers in your test system to determine when IVI is the right choice

Application Note 2008-11-14

PDF PDF 344 KB
Languages 
Using LAN in Test Systems - Network Configuration (AN 1465-10) - Application Note 
The decision to use LAN in a test system delivers important benefits to your company and your team. From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking

Application Note 2004-09-14

PDF PDF 182 KB
Languages 
Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note 
The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test.

Application Note 2004-07-29

PDF PDF 270 KB
Using LAN in Test Systems: Applications (1465-14) - Application Note and Example Programs 
Topics include balancing cost, convenience and security in three common LAN scenarios: sharing instruments, remote monitoring and data acquisition, and functional test systems. Includes downloadable example programs.

Application Note 2005-04-01

 
Using Lead-Free PCB Finishes at Manufacturing In-circuit Test Stage 
The purpose of this document is to share experiences and educate engineers regarding different PCB surface finishes and the specific changes required in the PCB build process to allow for ICT.

Application Note 2004-08-08

PDF PDF 102 KB
Using Linux in Your Test Systems: Linux Basics (AN 1465-27) 
If you haven’t used Linux in test applications, this document will provide a detailed overview. Topics include: A brief Linux history, why use Linux, free tools available for application development and an instrument control overview.

Application Note 2007-05-08

PDF PDF 303 KB
Languages 
Using Linux To Control LXI Instruments Through TCP (AN 1465-29) 
TCP is one of two alternative protocols used by most LAN-based instruments. It is the more elegant from a programming standpoint. This application note explains how instrument control works through TCP.

Application Note 2007-06-13

PDF PDF 160 KB
Languages 
Using Linux to Control LXI Instruments Through VXI-11 (AN 1465-28) 
VXI-11 is one of two alternative protocols used by most LAN-based instruments. It is based on RPC (Remote Procedure Calls). This application note explains how VXI-11 works and discusses a number of programming examples.

Application Note 2007-07-08

PDF PDF 200 KB
Languages 
Using Linux to Control USB Instruments (AN 1465-30) 
Agilent’s USB instruments are compatible with USBTMC, a vendor-independent device class for test and measurement resources. This application note explains how USBTMC works and how you can use the generic services to control your USB instruments.

Application Note 2007-11-07

PDF PDF 239 KB
Languages 
Using LXI to Boost Throughput in Semiconductor Manufacturing 
This document is a case study that discusses the successful customer implementation of an Agilent LXI solution for a multinational semiconductor manufacturer

Application Note 2007-04-25

PDF PDF 234 KB
Using LXI to go beyond GPIB, PXI and VXI (AN 1465-20) 
This application note focuses on the key attributes of the LXI standard, the major challenges in system development, the ways in which LXI addresses the key challenges, and the new possibilities in testing enabled by LXI devices.

Application Note 2006-01-17

PDF PDF 308 KB
Languages 
Using NDFCOL.EXE, the NDF "Line Up the Columns" Utility 
NDFCOL.EXE is a handy little utility that will form neat columns of data in NDF files.

Application Note 2002-06-06

 
Using Pop-up Windows 
There are occasions where the use of a pop-up window would be advantageous while testing boards on the Agilent 3070. This article is meant to highlight one method that can be used to obtain that end.

Application Note 1996-01-01

PDF PDF 18 KB
Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note 
Using SCPI and Direct I/O vs. Drivers, the fifth note in the series, outlines the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems

Application Note 2004-12-13

PDF PDF 408 KB
Using Synthetic Instruments in Your Test System (AN 1465-24) 
This note represents a brief history of SI, compares a rack-and-stack system to an SI-based system, descibes the initial applications of SIs, and illustrates the emulation of conventional instruments with SIs.

Application Note 2006-08-28

PDF PDF 290 KB
Languages 
Using the VISA COM I/O API in .NET - Application Note 
The Microsoft .NET architecture has many features that make it an excellent environment for Test & Measurement programmers. VISA COM I/O is an update of the older VISA C API to work in and with COM technology.

Application Note 2007-03-16

PDF PDF 345 KB

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