控制与自动化
去除所有优化26-50 / 184
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用您的电源缩短测试时间的10项提示
用您的电源缩短测试时间的10项提示
应用说明 1999-10-12 |
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用新的Agilent 34410A 和34411A 高性能数字万用表代替Agilent 34401A
该应用指南对 Agilent 34401A 6 1/2 位数字万用表与新型 Agilent 34410A 及 34411A 6 1/2 位高性能数字万用表之间的差异进行了简要而透彻的说明。
应用说明 2005-12-01 |
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系统开发者指南:LAN在测试系统中的使用:网络配置
应用说明 2004-12-28 |
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转向LXI的10个好理由
本应用指南将帮助您顺利过渡到LXI。其中重点描述了LXI的10大主要属性，无论您是选择单独使用LXI，还是将LXI结合GPIB、VXI或PXI来共同使用，LXI都将成为您下一代测试系统的最佳选择。
应用说明 2006-07-01 |
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适用于元件制造商的连通性进展产品指南
应用说明 2004-02-05 |
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3070 Board Tests are Reliable, Repeatable and Transportable. Here's Why.
It would take a very long paper to discuss all of the factors that make Agilent 3070 tests so reliable, repeatable, and transportable. This paper selects a few of the important ones.
应用说明 2001-08-15 |
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223 KB
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3070 In System Programming (ISP) Family
On Board Programming, Bottom Line Benefits
应用说明 2002-07-25 |
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200 KB
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3070 Increasing Throughput
There are decisions one can make that causes an Agilent 3070 test program to be slower or faster than what Test Consultant generates automatically. This paper offers many tips about how to optimize your system's performance.
应用说明 1997-03-03 |
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41 KB
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3070 Series 3 Flash70 Programming Guide
This guide contains information about the procedures, tasks, and syntax required to perform flash programming with HP 3070 test systems.
应用说明 2001-09-12 |
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1.85 MB
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3D Inline Solder Paste Inspection - Benefit Realized
100% solder paste inspection helps to reduce the contribution from the print process to solder joint defects.
应用说明 2003-06-01 |
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59 KB
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5DX Virus Protection Software Policy
Agilent recognizes that customers require data protection for their PC workstations and computer controlled manufacturing equipment such as the 5DX Test System and associated workstations.
应用说明 2004-08-26 |
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8 Hints for Debugging Siemens MCU-based Designs
A new type of instrument, the mixed signal oscilloscope (MSO), closes the gap in MCU debugging tools. The Agilent 54645D from
Hewlett-Packard combines two analog scope channels with 16 digital logic channels, so you can monitor analog and digital lines at the
same time. This MSO offers more...
应用说明 1998-11-01 |
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736 KB
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8 More Hints for Making Better Scopes Measurements
This Application Note contains a variety of hints to help you understand and improve your use of oscilloscopes. It includes the following 8 hints: 1. Don't forget to check that probe 2. A quick, easy way to troubleshoot mixed hardware/software prototypes 3. Using scopes to measure noisy signals 4...
应用说明 1999-12-01 |
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840 KB
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A New Process for Measuring and Displaying Board Test Coverage
Written by Kenneth P. Parker, Agilent Technologies. First presented at Apex 2003, Anaheim, California.
应用说明 2003-01-01 |
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116 KB
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A Quality Test Demands A Quality Fixture
A Check List for getting a quality board test fixture first time, every time.
应用说明 2001-05-16 |
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26 KB
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Agilent 3070 Now Powered by Industrial PC Controllers
The Agilent 3070 is now controlled by PCs similar to others used in your production and office environment lowering system administration and learning costs.
应用说明 2003-01-23 |
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207 KB
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Agilent 3070 Outsource Series Pay-Per-Use Board Test System
With an Agilent 3070 Outsource Pay-Per-Use System, you can define your system according to the products you have to test.
应用说明 2002-03-08 |
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247 KB
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Agilent LXI Class-B E5818A Trigger Box - Understanding Its Capability and Use Cases
Learn more about the LXI Class B E5818A trigger box and its capabilities through this white paper. You will also discover how to create a precise time synchronization system over LAN or enhance trigger operations applications.
应用说明 2008-07-25 |
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424 KB
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Agilent TestJet Technology White Paper
This paper describes the Agilent TestJet technique, which makes use of a property of most digital ICs in use in the mid-1990s: the lead frame.
应用说明 2000-01-01 |
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Antilock Brakes and Traction Control Application
This Application Note describes the Antilock Brake System/Traction Control applications on Agilent TS-5400 Test System
应用说明 2006-11-13 |
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AOI - A Strategy for Closing the Loop
This paper describes a set of defect prevention solutions centered on the availability of high-quality inspection and measurements data from an AOI system and a few carefully engineered software applications
应用说明 2006-04-16 |
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291 KB
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Appliance Testing
In this Application Note following the description of the appliance testing application, measurement and control requirements for characterizing devices are discussed. Then, Agilent VXI-based data acquisition suitable for such an application is listed. Description Household and commercial...
应用说明 1997-11-01 |
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110 KB
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Application Note1: Check for PCI and PCI-X protocol rule violation
The Agilent Protocol Observer, in combination with the Agilent Analyzer, simplifies the task of detecting protocol rule violations; this is not easy ...
应用说明 2001-09-28 |
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412 KB
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Application Note3: Analyze how efficiently a device uses PCI/PCI-X resources
The Agilent PCI/PCI-X Performance Optimizer, a combination of testcard and software, provides help regarding performance analysis of extensive systems or signle devices.
If you perform benchmark tests, The Agilent PCI/PCI-X Performance Optimizer helps you quickly evaluate the performance of...
应用说明 2001-10-04 |
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469 KB
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Application Note5: Monitor how your device acts on the PCI/PCI-X bus
Monitoring traffic on the PCI/PCI-X bus is done easily, but if you are designing PCI/PCI-x devices, you need to monitor the traffic relating to a particular device. This application allows you to debug your system quickly and effectively.
The Agilent PCI/PCI-X Analyzer, a combination of...
应用说明 2001-10-04 |
PDF
406 KB
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