Basics & Measurement Fundamentals
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51-75 of 271
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First pass Yield (FPY) and Alarm Triggers on the Agilent Medalist i3070 In-circuit Test System
This application note will explain some customizations and how to create alarm triggers.
Application Note 2008-09-26 |
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131 KB
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Setting Up HotKeys for AXI products on the Agilent Medalist Repair Tool
Users of the Agilent Medalist Repair Tool, also known as the Agilent Repair Tool (ART), can setup hot keys to increase the efficiency of image viewing in RT4.0 for their X-ray inspection products.
Application Note 2008-09-26 |
PDF
629 KB
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Build Operator Menu: Multiple Menu Configuration Control for 5DX Auto User Interface
The "Build Operator Menu" software replaces and extends the functionality found in the BLDOPMNU DOS command. This application note provides useful user information about this menu.
Application Note 2008-09-04 |
PDF
849 KB
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Fundamentals of RF and Microwave Power Measurements (Part 4) (AN 1449-4)
An Overview of Agilent Instrumentation for RF/Microwave Power Measurements
AN 1449-4, literature number 5988-9216EN
Application Note 2008-09-01 |
PDF
231 KB
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Quad Flat No Lead (QFN) Best Practices
The purpose of this application note and best practices guide is to describer the QFN-type component and provide testing methods to ensure robust testing on the Medalist 5DX Automated X-ray Inspection (AXI) System.
Application Note 2008-08-26 |
PDF
492 KB
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Procedure to backup ITF3.1.1 Database and DataStore and Restore Them in a New ITF Server with SQL200
This document is targeted at users who are archiving historical data or migrating to a more powerful server utilized to run Agilent’s ITF.
Application Note 2008-07-28 |
PDF
512 KB
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Merging Windowed Deposits in CamCad on Agilent’s Automated Optical Inspection (AOI) Systems
In many stencil designs, windowed deposits are used to apply paste to a large pad. This document provides some tips for dealing with this.
Application Note 2008-07-23 |
PDF
352 KB
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Adjusting the X-ray Surface Map parameters on the Medalist 5DX Automated X-ray System
Tips on obtaining the best images using the 5DX surface map parameters.
Application Note 2008-06-19 |
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Adjusting the Defect Analyzer detection parameters on the Medalist 5DX Automated X-ray System
Defect Analyzer operates by making a small change in the ‘z’ height of the board and re-testing suspect joints.
Application Note 2008-06-12 |
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Troubleshooting Medalist Intelligent Test Framework Port Problems
This document serves as a guide/reference to do preliminary analysis and troubleshooting when network/communication problems occur with the ITF server of the tester agent.
Application Note 2008-05-22 |
PDF
813 KB
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Using Extended Calibration Software for Wide Bandwidth Measurements (AN 1443)
This 16-page application note explains how to ensure accurate measurements with a vector signal analyzer using quick calibration methods.
Application Note 2008-05-22 |
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1.19 MB
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Using the Graphical Pin Locator on Agilent Medalist In-Circuit Test Systems
Enhancing productivity is the end result when the graphical version of "find pins" is utilized. This tool is called pin locator and is part of the Operator GUI Browser in version 7.0.
Application Note 2008-05-03 |
PDF
203 KB
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Using the Auto Optimizer on the Agilent Medalist In-Circuit Test Systems
Learn how to optimize throughput by using the auto optimizer tool.
Application Note 2008-05-03 |
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237 KB
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10 Hints for Getting the Most from your Frequency Counter
Maximize the results you get from your frequency counter through 10 hints from better from understanding the architecture to making faster measurements.
Application Note 2008-04-18 |
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Best of 8 Hints for Making Better Oscilloscopes Measurements
Agilent engineers sharing ideas of how to use the equipment they design
Application Note 2008-03-17 |
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320 KB
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Comparing CAD and BOM data for 5DX Use
Instructions for comparing CAD and BOM data to quickly deal with no load components.
Application Note 2008-01-04 |
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1.16 MB
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PNA - Pulsed-RF S-Parameter Measurements Using Wideband and Narrowband Detection (AN 1408-12)
Application Note 2007-11-28 |
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The Future of In-Circuit Testing in the High-speed, Complex Electronics Environment
As board complexity and node counts continue to rise and high speed differential signaling continues to grow in popularity, In-Circuit Test needs to move quickly beyond the traditional realms. This article explores this in detail.
Application Note 2007-10-31 |
PDF
176 KB
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Tips for X-ray Users On Exporting NDF’s With No Loads Set To False
Navigating CAD can be a time consuming process. Small tips can be extremely helpful in creating quality programs in a short amount of time.
Application Note 2007-10-18 |
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Making the Most of Agilent Throughput Multiplier on Medalist In-Circuit Test Systems
Agilent Throughput Multiplier reduces test time on in-circuit test systems by testing up to four boards of a single-board-type panel simultaneously. The tips in this application note will help users make the most of this valuable tool.
Application Note 2007-10-12 |
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Medalist SP50 User Tips for Nominal Paste Factor Field
Registered users, on valid support contracts, can login to learn about how using the Nominal Paste Factor appropriately can improve the system measurement results on the Medalist SP50 Solder Paste Inspection System.
Application Note 2007-10-11 |
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PNA-X Application: Power-Added Efficiency (PAE) 1408-16
Application Note 2007-10-09 |
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935 KB
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Medalist 3070 and Medalist i5000 System Recovery using Retrospect Express
This app note describes how to perform backups of the system hard disk for the Agilent Medalist 3070 and Agilent Medalist i5000 In-circuit Test systems that have been shipped with Retrospect Express 7.0 and Roxio Digital Media Plus 7.2 software.
Application Note 2007-07-10 |
PDF
628 KB
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How to Use IVI-COM Drivers in Agilent VEE Pro 8.0
This paper describe how easy to use IVI-COM driver in Agilent VEE Pro that allows instruments interchangeability while still providing quality and high performance.
Application Note 2007-06-08 |
PDF
295 KB
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8 Hints for Solving Common Debugging Problems with Your Logic Analyzer (AN 1326)
Application Note 2007-04-19 |
PDF
1000 KB
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