基本入門與量測基礎
移除所有細分101-125 / 271
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Fundamentals of RF and Microwave Power Measurements (Part 4) (AN 1449-4)
An Overview of Agilent Instrumentation for RF/Microwave Power Measurements
AN 1449-4, literature number 5988-9216EN
應用手冊 2008-09-01 |
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Fundamentals of Signal Analysis (AN 243)
This Application Note is a primer for those who are unfamiliar with the advantages of analysis in the frequency and modal domains and with the class of analyzers we call dynamic signal analyzers. It explains the time, frequency and modal domains and provides an overview of the major functions and...
應用手冊 2000-06-01 |
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Fundamentals of Signal Analysis Series (AN 1405-1)
This Application Note is a primer for those who are unfamiliar with the advantages of analysis in the frequency and modal domains.
應用手冊 2002-05-24 |
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Fundamentals of Signal Analysis Series (AN 1405-2)
This application note is a primerfor those who are unfamiliar with the class of analyzers we call dynamic signal analyzers. These instruments are particularly appropriate for the analysis of signals in the range of a few millihertz to about a hundred kilohertz.
應用手冊 2002-08-06 |
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Fundamentals of the Electronic Counters (AN 200)
This classic Application Note is aimed at introducing to the reader the basic concepts, techniques and the underlying principles that
constitute the common denominator of this myriad of counter products. It discusses the fundamentals of the conventional counter, the types of measurements it can...
應用手冊 1997-03-01 |
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Fundamentals of the z-Domain and Mixed Analog/Digital Measurements (AN 243-4)
This Application Note is for information only. Agilent no longer sells or supports these products.
應用手冊 1989-08-01 |
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1.13 MB
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Fundamentals of Time and Frequency Standards (AN 52-1)
This Application Note is for information only. Agilent no longer sells or supports these products.
應用手冊 1974-10-01 |
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15.46 MB
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Fundamentals of Time Interval Measurements (AN 200-3)
This classic Application Note provides a fundamental background on measurements of time-related events with electronic time interval counters. This Application Note is for information only. Agilent no longer sells or supports these products.
應用手冊 1997-06-01 |
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Ground Bounce Basics and Best Practices
This article offers a description of the physical properties that result in ground bounce during board test.
應用手冊 2003-01-28 |
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138 KB
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Handling Surface Mapping with Varying Board Construction
This paper describes a method for dealing with lot-to-lot or supplier-to-supplier variations in board construction. Often the variations in board construction result in different color boards which otherwise cause problems with surface mapping.
應用手冊 2004-12-02 |
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1.02 MB
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How To Float, or Series, Agilent 3070 DUT Supplies
The Agilent 3070 development software does an amazing job of calculating the wiring needed to build fixtures. Even so there are occasionally cases which require wiring that the standard Agilent 3070 software can not handle.
應用手冊 1997-01-23 |
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34 KB
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How to Get the Most from Agilent's Intelligent Yield Enhancement Test (IYET)
This paper describes how to get the most from IYET for Agilent board test systems.
應用手冊 2005-07-15 |
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How to Use IVI-COM Drivers in Agilent VEE Pro 8.0
This paper describe how easy to use IVI-COM driver in Agilent VEE Pro that allows instruments interchangeability while still providing quality and high performance.
應用手冊 2007-06-08 |
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295 KB
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How to use the Agilent 81200 together with Agilent VEE
This attached Product Note shows how to use the Agilent 81200 Data Generator/Analyzer together with Agilent VEE for Signal Integrity Analysis.
應用手冊 2002-01-28 |
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383 KB
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How to Use VXI and PXI in Your New LXI Test System (AN 1465-23)
應用手冊 2006-06-06 |
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Hybrid32 Migration
This document is provided to help users of HybridPlus Pin Cards more easily incorporate the
Hybrid32 technology into their existing systems.
應用手冊 2000-11-01 |
PDF
61 KB
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IEEE 1149.6 Standard Boundary Scan Testing on Agilent Medalist i3070 ICT Systems
This paper introduces the latest advancements in Boundary Scan test capabilities on the Agilent Medalist i3070 In-Circuit Test platform that supports the testing of IEEE 1149.6-compliant devices.
應用手冊 2008-11-24 |
PDF
297 KB
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Impedance Matching Techniques for Mixers and Detectors (AN 963)
This Application Note is for information only. Agilent no longer sells or supports these products.
應用手冊 1980-08-01 |
PDF
108 KB
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Improved Fault Coverage in a Combined X-ray and In-Circuit Test Environment
Cutting functional test failures in half and doubling the faults detected at process test! These are some of the case study results observed in combined X-ray and in-circuit test environments.
應用手冊 2001-02-27 |
PDF
575 KB
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Improved Throughput in Network Analyzer Applications (AN 1287-5)
This Application Note explores a variety of throughput issues and how they might affect different applications. It suggests ways to
improve network analyzer performance for better throughput in specific situations, and how to get an accurate picture of how an analyzer's performance might impact...
應用手冊 2010-03-15 |
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In-circuit Testing of Low Voltage Devices
Core technical document summarizing issues regarding the testing of low voltage devices on the 3070 and i5000, including updated Safeguard information.
應用手冊 2005-05-25 |
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172 KB
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In-System Programming on the Agilent 3070
In-System Programmable devices are more widely used on today's boards to provide flexibility to design engineers and to reduce the cost of a product.
應用手冊 2001-07-02 |
PDF
205 KB
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Instrument Design Validation and Recommended Calibration Policy - White Paper
Provides background information on the test philosophies and methods used when developing instrument verification and adjustment procedures.
應用手冊 2012-11-08 |
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1.22 MB
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Introduction to Test-System Design (AN 1465-1)
應用手冊 2005-01-20 |
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ISDN Testing Techniques (AN 397-1)
This Application Note is for information only. Agilent no longer sells or supports these products.
應用手冊 1990-09-01 |
PDF
1.67 MB
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