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Basics & Measurement Fundamentals

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Fundamentals of Signal Analysis Series (AN 1405-1) 
This Application Note is a primer for those who are unfamiliar with the advantages of analysis in the frequency and modal domains.

Application Note 2002-05-24

PDF PDF 1.26 MB
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Fundamentals of Signal Analysis Series (AN 1405-2) 
This application note is a primerfor those who are unfamiliar with the class of analyzers we call dynamic signal analyzers. These instruments are particularly appropriate for the analysis of signals in the range of a few millihertz to about a hundred kilohertz.

Application Note 2002-08-06

PDF PDF 654 KB
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Fundamentals of the Electronic Counters (AN 200) 
This classic Application Note is aimed at introducing to the reader the basic concepts, techniques and the underlying principles that constitute the common denominator of this myriad of counter products. It discusses the fundamentals of the conventional counter, the types of measurements it can...

Application Note 1997-03-01

PDF PDF 242 KB
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Fundamentals of the z-Domain and Mixed Analog/Digital Measurements (AN 243-4) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1989-08-01

PDF PDF 1.13 MB
Fundamentals of Time and Frequency Standards (AN 52-1) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1974-10-01

PDF PDF 15.46 MB
Fundamentals of Time Interval Measurements (AN 200-3) 
This classic Application Note provides a fundamental background on measurements of time-related events with electronic time interval counters. This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1997-06-01

PDF PDF 897 KB
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Ground Bounce Basics and Best Practices 
This article offers a description of the physical properties that result in ground bounce during board test.

Application Note 2003-01-28

PDF PDF 138 KB
Handling Surface Mapping with Varying Board Construction 
This paper describes a method for dealing with lot-to-lot or supplier-to-supplier variations in board construction. Often the variations in board construction result in different color boards which otherwise cause problems with surface mapping.

Application Note 2004-12-02

PDF PDF 1.02 MB
How To Float, or Series, Agilent 3070 DUT Supplies 
The Agilent 3070 development software does an amazing job of calculating the wiring needed to build fixtures. Even so there are occasionally cases which require wiring that the standard Agilent 3070 software can not handle.

Application Note 1997-01-23

PDF PDF 34 KB
How to Get the Most from Agilent's Intelligent Yield Enhancement Test (IYET) 
This paper describes how to get the most from IYET for Agilent board test systems.

Application Note 2005-07-15

 
How to Use IVI-COM Drivers in Agilent VEE Pro 8.0 
This paper describe how easy to use IVI-COM driver in Agilent VEE Pro that allows instruments interchangeability while still providing quality and high performance.

Application Note 2007-06-08

PDF PDF 295 KB
How to use the Agilent 81200 together with Agilent VEE 
This attached Product Note shows how to use the Agilent 81200 Data Generator/Analyzer together with Agilent VEE for Signal Integrity Analysis.

Application Note 2002-01-28

PDF PDF 383 KB
How to use the Agilent N6700 Modular Power System to replace an Agilent 662xA (AN 1467)  
This is a high-level overview to help current 662xA owners easily convert to an Agilent N6700.

Application Note 2004-08-02

PDF PDF 220 KB
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How to Use VXI and PXI in Your New LXI Test System (AN 1465-23) 

Application Note 2006-06-06

PDF PDF 275 KB
Languages 
Hybrid32 Migration 
This document is provided to help users of HybridPlus Pin Cards more easily incorporate the Hybrid32 technology into their existing systems.

Application Note 2000-11-01

PDF PDF 61 KB
IEEE 1149.6 Standard Boundary Scan Testing on Agilent Medalist i3070 ICT Systems 
This paper introduces the latest advancements in Boundary Scan test capabilities on the Agilent Medalist i3070 In-Circuit Test platform that supports the testing of IEEE 1149.6-compliant devices.

Application Note 2008-11-24

PDF PDF 297 KB
Impedance Matching Techniques for Mixers and Detectors (AN 963) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1980-08-01

PDF PDF 108 KB
Improved Fault Coverage in a Combined X-ray and In-Circuit Test Environment 
Cutting functional test failures in half and doubling the faults detected at process test! These are some of the case study results observed in combined X-ray and in-circuit test environments.

Application Note 2001-02-27

PDF PDF 575 KB
Improved Throughput in Network Analyzer Applications (AN 1287-5) 
This Application Note explores a variety of throughput issues and how they might affect different applications. It suggests ways to improve network analyzer performance for better throughput in specific situations, and how to get an accurate picture of how an analyzer's performance might impact...

Application Note 2010-03-15

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In-circuit Testing of Low Voltage Devices 
Core technical document summarizing issues regarding the testing of low voltage devices on the 3070 and i5000, including updated Safeguard information.

Application Note 2005-05-25

PDF PDF 172 KB
In-System Programming on the Agilent 3070 
In-System Programmable devices are more widely used on today's boards to provide flexibility to design engineers and to reduce the cost of a product.

Application Note 2001-07-02

PDF PDF 205 KB
Instrument Design Validation and Recommended Calibration Policy - White Paper 
Provides background information on the test philosophies and methods used when developing instrument verification and adjustment procedures.

Application Note 2012-11-08

PDF PDF 1.22 MB
Introduction to Test-System Design (AN 1465-1) 

Application Note 2005-01-20

PDF PDF 412 KB
Languages 
ISDN Testing Techniques (AN 397-1) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1990-09-01

PDF PDF 1.67 MB
Isolating Frequency Measurement Error and Sourcing Frequency by Robert Leiby 
When performing a calibration, the risk of incorrectly declaring a device as in-tolerance (false-accept risk) is dependent upon several factors such as the specified tolerance limit and guard band.

Application Note 2011-10-05

PDF PDF 3.42 MB

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