基本入門與量測基礎
移除所有細分126-150 / 271
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Isolating Frequency Measurement Error and Sourcing Frequency by Robert Leiby
When performing a calibration, the risk of incorrectly declaring a device as in-tolerance (false-accept risk) is dependent upon several factors such as the specified tolerance limit and guard band.
應用手冊 2011-10-05 |
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3.42 MB
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Jitter Analysis Techniques for High Data Rates (AN 1432)
This new application note describes the basic jitter measurements and the specific measurement techniques used in SONet/SDH/OTN and Gigabit Ethernet applications.
應用手冊 2003-02-03 |
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Jitter Fundamentals: Jitter Tolerance Testing with Agilent ParBERT 81250
This applicaiton note describes gain fast and efficient insight into the operation and performance of CDR, clock system and jitter tolerance.
應用手冊 2003-12-02 |
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3.18 MB
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Language of Specifications - White Paper
This paper explains some of the arcane language used in describing a product's characteristics.
應用手冊 2013-01-08 |
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508 KB
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LCR/Impedance Measurement Basics
presents impedance, component value definitions, typical measurement problemsand their solutions, and error correction and compensation techniques.
應用手冊 2001-03-28 |
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Learned Data for the 5DX
The Agilent 5DX uses learned data in several ways to improve algorithm performance. There are basically 2 different forms of learned data.
應用手冊 2000-11-01 |
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Logic Analyzer Probing Techniques for High-Speed Digital Systems (AN 1450)
Discusses the impact of adding logic analysis testability to PCB's. Examples of today's logic analyzer probing solutions are presented and the advantages and disadvantages of each solution are discussed.
應用手冊 2003-03-24 |
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Loop Gain Measurements with the 3577A Network Analyzer (PN35772A-2)
Part Number: 3677-5131 (Mar83).
The 3577A is no longer sold by Agilent; this product note is provided for information only.
應用手冊 1983-03-01 |
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248 KB
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Making the Most of Agilent Throughput Multiplier on Medalist In-Circuit Test Systems
Agilent Throughput Multiplier reduces test time on in-circuit test systems by testing up to four boards of a single-board-type panel simultaneously. The tips in this application note will help users make the most of this valuable tool.
應用手冊 2007-10-12 |
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Maximising Test Coverage with Agilent Medalist VTEP v2.0
This paper describes how to get the most from Agilent Technologies’ industry-leading vectorless test innovation, the Medalist VTEP v2.0 which is a suite of solution comprising VTEP, iVTEP and NPM.
應用手冊 2007-04-17 |
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Maximizing Accuracy in Noise Figure Measurements (PN 85719A-1)
This Product Note discusses factors that affect accuracy with the 85719A Noise Figure Measurement System. Statistically generated curves of noise figure measurements uncertainly are also included.
應用手冊 2000-10-01 |
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661 KB
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Maximizing System Throughput and Optimizing System Deployment (AN 1465-7)
應用手冊 2004-12-21 |
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Measurement Wizard Assistant software for ENA
This application note explains how using MWA software on the ENA simplifies measurements and reduces the setup time of complicated measurements. It provides you with a step-by-step guide to the MWA and useful measurement tips for using the ENA and E5092A configurable multiport test set.
應用手冊 2008-09-30 |
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Measuring Close-In AM in the Presence of FM (PN 8590-5)
This Product Note explains how to use the FFT function in 8590 C/E/L-series Spectrum Analyzers with Fast Fourier Transform (FFT). FFT simplifies AM analysis by providing a smart user interface.
AM measurements of RF or microwave signals are quick, continuous, and repeatable even when FM is...
應用手冊 2000-07-01 |
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137 KB
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Medalist 3070 and Medalist i5000 System Recovery using Retrospect Express
This app note describes how to perform backups of the system hard disk for the Agilent Medalist 3070 and Agilent Medalist i5000 In-circuit Test systems that have been shipped with Retrospect Express 7.0 and Roxio Digital Media Plus 7.2 software.
應用手冊 2007-07-10 |
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628 KB
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Medalist i3070 Test Throughput Optimization
This application note explores some factors which cause test time to increase on the Medalist i3070 In-Circuit Test system, and methods which users can employ to reduce the test time and increase throughput on the Medalist i3070 ICT system.
應用手冊 2008-11-24 |
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Medalist SP50 User Tips for Nominal Paste Factor Field
Registered users, on valid support contracts, can login to learn about how using the Nominal Paste Factor appropriately can improve the system measurement results on the Medalist SP50 Solder Paste Inspection System.
應用手冊 2007-10-11 |
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Merging Windowed Deposits in CamCad on Agilent’s Automated Optical Inspection (AOI) Systems
In many stencil designs, windowed deposits are used to apply paste to a large pad. This document provides some tips for dealing with this.
應用手冊 2008-07-23 |
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352 KB
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Modulation Domain Techniques for Measuring Complex Radar Singals (AN 358-9)
This Application Note is for information only. Agilent no longer sells or supports these products.
應用手冊 1989-10-01 |
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713 KB
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NDF and RTF - Hashed Names
There have been many questions about hashed directory names. This is a brief explanation of why they are, and how they are generated.
應用手冊 1998-06-30 |
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Network Analysis - Balanced and Multiport Device Measurements (1373-2)
The use of differential components such as surface acoustic wave (SAW) filters and differential amplifiers is becoming more common in the wireless industry because they have greater performance than their single-ended counterparts.
應用手冊 2002-03-08 |
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1.09 MB
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Network Analysis - Balanced Measurement Example: Baluns (1373-6)
Differential circuits are becoming more widely
used in RF circuits for the same reasons that they have been used for years in lower frequency
analog circuits.
應用手冊 2001-09-17 |
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Network Analysis - Balanced Measurement Example: Differential Amplifiers (1373-7)
This Application Note describes Agilent balanced-measurement solutions they have developed that offer the most accurate method available for measuring differential RF circuits.
應用手冊 2001-09-10 |
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Network Analysis - Balanced Measurement Example: SAW Filters (1373-5)
SAW filters are commonly used in wireless
communication products because of their very
sharp response characteristics, relatively low
insertion loss, and low cost.
應用手冊 2001-09-17 |
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Network Analysis - Characterize High-Power Components (AN 1287-6)
This Application Note describes linear and nonlinear measurements of high-power components and how to use a network analyzer for making them.
應用手冊 2003-03-12 |
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199 KB
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