基本入門與量測基礎
移除所有細分176-200 / 271
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PNA - Banded Millimeter-Wave Measurements (AN 1408-15)
Contains banded millimeter-wave system configurations, system operation, system calibration, and typical measurement examples.
應用手冊 2009-11-24 |
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1.95 MB
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PNA - Pulsed Measurement Accuracy (1408-11)
應用手冊 2004-02-17 |
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1000 KB
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PNA - Pulsed-RF S-Parameter Measurements Using Wideband and Narrowband Detection (AN 1408-12)
應用手冊 2007-11-28 |
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PNA Automation - Software Application Development (1408-13)
應用手冊 2004-09-13 |
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961 KB
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PNA-X Application: Power-Added Efficiency (PAE) 1408-16
應用手冊 2007-10-09 |
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PNA-X Network Analyzer 10 MHz to 26.5 GHz Application Note
This application note describes accuracy considerations when using the Agilent PNA-X microwave network analyzer for two-tone intermodulation distortion measurements.
應用手冊 2012-03-05 |
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3.38 MB
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Power Supply Testing (AN 372-1)
An electronic load offers a broad range of operating modes, providing versatile loading configurations needed for characterizing and verifying DC power supply design specifications.
應用手冊 2002-02-22 |
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Pragmatic Method for Pass/Fail Conformance Reporting that Complies by Michael Dobbert & Robert Stern
Innovative approach to simultaneously meet (ISO 17025, ILAC-G8, Z540.3)
應用手冊 2010-03-01 |
PDF
350 KB
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Preparing a .cc File for Export to Test Link
This procedure describes the process of converting ECAD data into a form that can be used by Test Link.
應用手冊 2002-10-16 |
PDF
70 KB
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Printed Circuit Board Split-Pad Test Method and Design
This application note describes the split-pad concept for use with a bed of nails style test fixture.
應用手冊 1999-06-01 |
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50 KB
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Problem with Subtype Learning When Used with the Connector Algorithm in R7.0
5DX Technical Paper - Problem with Subtype Learning When Used with the Connector Algorithm in R7.0
應用手冊 2004-02-20 |
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16 KB
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Procedure to backup ITF3.1.1 Database and DataStore and Restore Them in a New ITF Server with SQL200
This document is targeted at users who are archiving historical data or migrating to a more powerful server utilized to run Agilent’s ITF.
應用手冊 2008-07-28 |
PDF
512 KB
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Quad Flat No Lead (QFN) Best Practices
The purpose of this application note and best practices guide is to describer the QFN-type component and provide testing methods to ensure robust testing on the Medalist 5DX Automated X-ray Inspection (AXI) System.
應用手冊 2008-08-26 |
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492 KB
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Realizing the Benefits of 3D Inline Solder Paste Inspection
Published in SMT Magazine/Germany, August 2003
應用手冊 2003-08-01 |
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67 KB
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Reducing Load Time for Loaderless Systems
For Series 2L systems, it may be possible to reduce the time it takes to load a panel.
應用手冊 1999-12-01 |
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Reducing Process Defect Escapes with Vectorless Test
Process defects that escape in-circuit test lead at best to increased repair costs, and at worst to a "bone pile1" problem.
應用手冊 2001-05-17 |
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512 KB
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Remote Network Connections Creation for the Operator Logon
Operator logon on the Agilent 5DX Series II System is limited, in that it does not allow Operator to make network connections that are required for sending images and res files to the PLR workstation.
應用手冊 2002-06-30 |
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Rotating Boards on a Panel
Rotating Boards on a Panel if often necessary. In addition to the software revisions named within, the explained technique in the document is utilized for for 4.x, 5.x, 6.x and 7.x. For 8.x Test Link deals with this automatically.
應用手冊 2001-05-17 |
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40 KB
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Running Rocky Mountain Basic from Board Test Basic
Many of you have existing programs written in Rocky Mountain Basic (RM-Basic), or have found the RM-Basic program examples given in Agilent manuals, and wish to use them to do external instrumentation control using the Agilent 3070 Board Test Family.
應用手冊 2001-05-17 |
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23 KB
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S-Parameter Techniques for Faster, More Accurate Network Design (AN 95-1)
This Application Note is for information only. Agilent no longer sells or supports these products.
應用手冊 1967-02-01 |
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3.10 MB
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Sampling on the Agilent 5DX
Sampling Mode allows test coverage to be optimized with line speed. This document explore the setup procedure for the Agilent 5DX for sampling.
應用手冊 2002-05-08 |
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Selecting a Calibration Vendor - White Paper
Cost is important but are there any other questions that need to be asked in selecting a calibration supplier?
應用手冊 2012-12-11 |
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1.38 MB
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SEMI S2 Standard Modifications for Agilent 3070 and Related Equipment
This document describes three items pertaining to the Agilent 3070 and the SEMI S2 standard. Each of them is related to a variance with the SEMI standard.
應用手冊 2006-06-15 |
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52 KB
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Sensitivity Analysis of One-port Characterized Devices in Vector Network Analyzer Calibrations
Results of a study on the use of characterized devices in microwave vector network analyzer (VNA) calibrations and measurements. A review of the theory of one-port characterized device calibration.
應用手冊 2012-10-14 |
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1.25 MB
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Setting Up HotKeys for AXI products on the Agilent Medalist Repair Tool
Users of the Agilent Medalist Repair Tool, also known as the Agilent Repair Tool (ART), can setup hot keys to increase the efficiency of image viewing in RT4.0 for their X-ray inspection products.
應用手冊 2008-09-26 |
PDF
629 KB
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