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Language of Specifications - White Paper 
This paper explains some of the arcane language used in describing a product's characteristics.

アプリケーション・ノート 2013-01-08

PDF PDF 508 KB
LCR/Impedance Measurement Basics 
presents impedance, component value definitions, typical measurement problemsand their solutions, and error correction and compensation techniques.

アプリケーション・ノート 2001-03-28

 
Learned Data for the 5DX 
The Agilent 5DX uses learned data in several ways to improve algorithm performance. There are basically 2 different forms of learned data.

アプリケーション・ノート 2000-11-01

 
Loop Gain Measurements with the 3577A Network Analyzer (PN35772A-2) 
Part Number: 3677-5131 (Mar83). The 3577A is no longer sold by Agilent; this product note is provided for information only.

アプリケーション・ノート 1983-03-01

PDF PDF 248 KB
Maximizing Accuracy in Noise Figure Measurements (PN 85719A-1) 
This Product Note discusses factors that affect accuracy with the 85719A Noise Figure Measurement System. Statistically generated curves of noise figure measurements uncertainly are also included.

アプリケーション・ノート 2000-10-01

PDF PDF 661 KB
Measuring Close-In AM in the Presence of FM (PN 8590-5) 
This Product Note explains how to use the FFT function in 8590 C/E/L-series Spectrum Analyzers with Fast Fourier Transform (FFT). FFT simplifies AM analysis by providing a smart user interface. AM measurements of RF or microwave signals are quick, continuous, and repeatable even when FM is...

アプリケーション・ノート 2000-07-01

PDF PDF 137 KB
Medalist 3070 and Medalist i5000 System Recovery using Retrospect Express 
This app note describes how to perform backups of the system hard disk for the Agilent Medalist 3070 and Agilent Medalist i5000 In-circuit Test systems that have been shipped with Retrospect Express 7.0 and Roxio Digital Media Plus 7.2 software.

アプリケーション・ノート 2007-07-10

PDF PDF 628 KB
Medalist i3070 Test Throughput Optimization 
This application note explores some factors which cause test time to increase on the Medalist i3070 In-Circuit Test system, and methods which users can employ to reduce the test time and increase throughput on the Medalist i3070 ICT system.

アプリケーション・ノート 2008-11-24

PDF PDF 163 KB
言語 
Medalist SP50 User Tips for Nominal Paste Factor Field  
Registered users, on valid support contracts, can login to learn about how using the Nominal Paste Factor appropriately can improve the system measurement results on the Medalist SP50 Solder Paste Inspection System.

アプリケーション・ノート 2007-10-11

 
Merging Windowed Deposits in CamCad on Agilent’s Automated Optical Inspection (AOI) Systems 
In many stencil designs, windowed deposits are used to apply paste to a large pad. This document provides some tips for dealing with this.

アプリケーション・ノート 2008-07-23

PDF PDF 352 KB
Modulation Domain Techniques for Measuring Complex Radar Singals (AN 358-9) 
This Application Note is for information only. Agilent no longer sells or supports these products.

アプリケーション・ノート 1989-10-01

PDF PDF 713 KB
NDF and RTF - Hashed Names 
There have been many questions about hashed directory names. This is a brief explanation of why they are, and how they are generated.

アプリケーション・ノート 1998-06-30

 
Network Analysis - Balanced and Multiport Device Measurements (1373-2) 
The use of differential components such as surface acoustic wave (SAW) filters and differential amplifiers is becoming more common in the wireless industry because they have greater performance than their single-ended counterparts.

アプリケーション・ノート 2002-03-08

PDF PDF 1.09 MB
Network Analyzer Basics 
This 94-page note covers the principles of measuring high-frequency electrical networks with network analyzers, including the types of measuremetns and how they allow you to characterize both linear and nonlinear behavior of your devices.

アプリケーション・ノート 2004-09-15

PDF PDF 5.82 MB
New Features in Version 5.0 Software for 3070 
Typically, when Agilent's Manufacturing Test Division introduces a new software revision for its flagship 3070 In-Circuit Tester, it only communicates with customers about the major new features.

アプリケーション・ノート 2003-01-28

PDF PDF 84 KB
New Techniques for Analyzing Phase Lock Loops (AN 164-3) 
This Application Note is for information only. Agilent no longer sells or supports these products.

アプリケーション・ノート 1975-06-01

PDF PDF 795 KB
Next-generation Test Systems: Advancing the Vision with LXI (AN 1465-16) 

アプリケーション・ノート 2006-05-01

PDF PDF 263 KB
Non-Volatile Memory Programming on the Agilent 3070 
The trend in non-volatile memory, like the general trend in electronic products, is to increase capability, reduce size, reduce cost, and get the final product to market faster than the competition.

アプリケーション・ノート 2003-05-29

PDF PDF 28 KB
Obtaining a Listing of Applications on Series II Systems 
There is currently no easy way to obtain a list of all resident applications on a 5DX System or TDW. It is difficult to match panel name with hash name and see when the application was last updated.

アプリケーション・ノート 2002-06-01

 
Optical Spectrum Analysis Basics (AN 1550-4) 
This Application Note is intended to provide the reader with a basic understanding of optical spectrum analyzers, their technologies, specifications, and applications. Chapter 1 describes interferometer-based and diffraction- grating-based optical spectrum analyzers. Chapter 2 defines many of the...

アプリケーション・ノート 2000-09-01

PDF PDF 222 KB
言語 
Optimizing Dynamic Range for Distortion Measurements 
This Product Note covers high dynamic range measurement techniques for the new PSA Performance Spectrum Analyzer Series. The Note describes the best way to use the PSA series to make distortion measurements such as ACP, intermodulation, and harmonic distortion.

アプリケーション・ノート 2011-10-27

PDF PDF
Paperless Calibration - White Paper 
Discusses the benefits of storing calibration records electronically rather than on paper in filing cabinets and explains why having a hard copy of these files is not necessary.

アプリケーション・ノート 2013-01-25

PDF PDF 1.97 MB
Photonics Connector Care: Effects of Damage Connectors and Interfaces in Fiber Optic Measurements 
To qualify or predict the effects of damaged fiber optic connectors or optical interfaces, a qualitative assessment can ensure that these connectors are kept in a condition of optimum performance.

アプリケーション・ノート 2012-10-14

PDF PDF 2.28 MB
PLD Programming on the Agilent 3070 Using the PLD ISP Product 
In-System Programmable PLDs are more widely used on today's boards to provide flexibility to design engineers and to reduce the cost of a product.

アプリケーション・ノート 2002-02-26

PDF PDF 242 KB
PLR and 5DX Customized Defect Names Implementation 
You can use customized defect names on both the 5DX and on the PLR. This is particularly valuable when you want to display defect names in a local language.

アプリケーション・ノート 2003-03-01

 

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