범용 & 측정 기초
상세분류 제거201-225 / 271
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Simplified Filter Tuning Using Time Domain (AN 1287-8)
This Application Note describes a method of tuning a filter using the time-domain
response of its return loss, which makes filter tuning vastly easier.
어플리케이션 노트 2000-07-01 |
PDF
769 KB
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Solder Paste Inspection - Organize the Pieces
Published in Global SMT & Packaging, November 2003
어플리케이션 노트 2003-11-01 |
PDF
818 KB
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Solder Paste Inspection for the SMT line: 3D In-line Systems Come of Age
Published in Electronic Production & Test, May 2003.
어플리케이션 노트 2003-05-01 |
PDF
115 KB
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Specifications Guidelines - White Paper
Agilent Technologies has definitions for its Test & Measurement product specifications and how they are presented. The following material is extracted from these manufacturing recommendations.
어플리케이션 노트 2012-12-21 |
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1.80 MB
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Specifying Calibration Standards and Kits for Agilent Vector Network Analyzers (AN 1287-11)
This paper discusses calibration standard definitions, calibration kit content, and its structure requirements for Agilent's vector network analyzers. Also provided are set up examples and how to modify an existing calibration kit definition file.
어플리케이션 노트 2011-03-28 |
PDF
3.79 MB
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Spectrum Analysis Basics: From 1997 Back to Basics Seminar
This paper covers everything from a definition of spectrum to the types of instruments used to make the measurements. Topics include resolution, amplitude measurements sensitivity, dynamic range, LO stability, and the use of spectrum analyzers....
어플리케이션 노트 1997-04-01 |
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3.16 MB
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Spectrum Analysis: Noise Measurements (AN 150-4)
Application Note 150-4
어플리케이션 노트 1974-04-01 |
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10.46 MB
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Spectrum Analyzer Basics (AN 150)
Fundamentals of spectrum analyzer measurements
어플리케이션 노트 2006-08-02 |
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Swept Frequency Techniques (AN 65)
This Application Note is for information only. Agilent no longer sells or supports these products.
어플리케이션 노트 1965-08-01 |
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8.35 MB
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Swept-Frequency Group Delay Measurements (AN 77-4)
Application Note 77-4
어플리케이션 노트 1968-09-01 |
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1.12 MB
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Synchronizing 3070 System Clocks
These instructions are for synchronizing the system clocks of several network-connected UX workstations in the absence of an existing timeserver.
어플리케이션 노트 2001-09-27 |
PDF
66 KB
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System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note
Using LAN in Test Systems: PC
Configuration,the third note in
the series, describes the additional
capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.
어플리케이션 노트 2004-10-19 |
PDF
204 KB
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System Issues in Boundary-Scan Board Test
While Boundary-Scan is a powerful test tool, test engineers are finding out that yesterday's DFT rules and test approaches may actually be detrimental to successfully testing systems on a board.
어플리케이션 노트 2003-01-28 |
PDF
37 KB
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TDR Fundamentals for Use With the 54120T Digitizing Oscilloscope and TDR (AN 62)
This Application Note is for information only. Agilent no longer sells or supports these products.
어플리케이션 노트 1964-01-01 |
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9.11 MB
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TDR Techniques for Differential Systems (AN 62-2)
This Application Note is for information only. Agilent no longer sells or supports these products.
어플리케이션 노트 1990-10-01 |
PDF
1.96 MB
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Techniques & Applications for High Throughput & Stable Characterization (AN 356-1)
This Application Note is for information only. Agilent no longer sells or supports these products.
어플리케이션 노트 1988-08-01 |
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3.32 MB
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Techniques for Programming the 892X Family of Instruments (PN 892X)
This Product Note describes some key programming techniques for the Agilent 892X family of products. This Note can be used as a training tool for users that are new to programming test equipment, or it can be used by experienced programmers that need to know about unique programming required for...
어플리케이션 노트 2000-09-01 |
PDF
186 KB
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Test and Inspection as Part of the Lead-free Manufacturing Process
The paper addresses issues that will impact defect levels and defect spectrum during the transition to lead-free manufacturing. It also addresses different test and inspection systems’ readiness to test lead-free printed circuit board assemblies.
어플리케이션 노트 2005-02-22 |
PDF
421 KB
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Test and Measurement Instrument Security
This document describes security features and the steps to perform a security erase for select Agilent test and measurement instruments.
어플리케이션 노트 2009-04-14 |
PDF
167 KB
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Test Coverage: What Does It Mean when a Board Test Passes?
Originally presented at the 2002 International Test Conference -- Characterizing board test coverage as a percentage of devices or nodes having tests does not accurately portray coverage, especially in a limited access testing environment.
어플리케이션 노트 2003-07-28 |
PDF
266 KB
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Test Strategy for Complex Printed Circuit Board Assemblies
This paper proposes a new test strategy for complex boards since the trend in Printed Circuit Board Assembly (PCBA) technology is towards higher complexity.
어플리케이션 노트 1999-02-22 |
PDF
195 KB
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Test-System Computer I/O Considerations (AN 1465-2) - Application Note
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing
어플리케이션 노트 2004-12-09 |
PDF
189 KB
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Test-System Development Guide: Operational Maintenance (AN 1465-8)
어플리케이션 노트 2004-12-21 |
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Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note
This application note answers common questions
about the use of drivers and direct I/O to send commands from a PC application to the test instrument.
어플리케이션 노트 2004-12-21 |
PDF
374 KB
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Testing FPGullwing Misalignment Across the Pad
A technique is described which enables detection of misalignment of gullwing joints across the joint using duplicate components and FPGullwing Misalignment.
어플리케이션 노트 2004-12-08 |
PDF
1.58 MB
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