基本入門與量測基礎
移除所有細分26-50 / 271
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A New Process for Measuring and Displaying Board Test Coverage
Written by Kenneth P. Parker, Agilent Technologies. First presented at Apex 2003, Anaheim, California.
應用手冊 2003-01-01 |
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116 KB
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A Software Algorithm for Implementing Automatic Power Ranging in the 8960 Series 10 Wireless...
This Product Note presents a software algorithm for performing automatic power ranging in the Agilent 8960 Series 10 wireless communications test set with the Agilent E1960A GSM mobile test application installed. Agilent E1960A GSM mobile test application revisions, up to and including, A.01.04...
應用手冊 1999-04-01 |
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311 KB
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A Technique for Calibrating Phase Shifters to High Accuracy (AN 19)
This Application Note is for information only. Agilent no longer sells or supports these products.
應用手冊 1966-05-01 |
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3.84 MB
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Achieving Fast Design Cycle Time
This application note describes how fast cycle time is achieved using the impedance analyzer such as the E4991A and 4294A with the Electronic Design Automation (EDA) tools.
應用手冊 2008-11-13 |
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Adjusting the Defect Analyzer detection parameters on the Medalist 5DX Automated X-ray System
Defect Analyzer operates by making a small change in the ‘z’ height of the board and re-testing suspect joints.
應用手冊 2008-06-12 |
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Adjusting the X-ray Surface Map parameters on the Medalist 5DX Automated X-ray System
Tips on obtaining the best images using the 5DX surface map parameters.
應用手冊 2008-06-19 |
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Advanced impedance measurement capability of the RF I-V method (AN 1369-2)
This application note describes the difference between the network analyzer and impedance analyzer for the measurement principle and actual measurement performance.
應用手冊 2001-07-26 |
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Advanced TDR Techniques (AN 62-3)
This Application Note is for information only. Agilent no longer sells or supports these products.
應用手冊 1990-04-01 |
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2.73 MB
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Agilent 3070 Now Powered by Industrial PC Controllers
The Agilent 3070 is now controlled by PCs similar to others used in your production and office environment lowering system administration and learning costs.
應用手冊 2003-01-23 |
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207 KB
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Agilent 3070 Outsource Series Pay-Per-Use Board Test System
With an Agilent 3070 Outsource Pay-Per-Use System, you can define your system according to the products you have to test.
應用手冊 2002-03-08 |
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247 KB
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Agilent TestJet Technology White Paper
This paper describes the Agilent TestJet technique, which makes use of a property of most digital ICs in use in the mid-1990s: the lead frame.
應用手冊 2000-01-01 |
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An Internet-Enabled Primary Impedance Measurement System - White Paper
iPIMMS allows microwave network analyser users to achieve uncertainties which are equivalent to those of measurementsperformed at the National Physical Laboratory (NPI).
應用手冊 2012-09-26 |
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440 KB
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An Introduction to Multiport and Balanced Device Measurements (AN 1373-1)
The increase in integration in the wireless communications and electronics industries and the need to decrease size, cost, weight, and power consumption is driving design engineers to replace discrete components with more complex modules.
應用手冊 2002-11-11 |
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AOI - A Strategy for Closing the Loop
This paper describes a set of defect prevention solutions centered on the availability of high-quality inspection and measurements data from an AOI system and a few carefully engineered software applications
應用手冊 2006-04-16 |
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291 KB
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Applications and Operations of the 8970A Noise Figure Meter (PN8970A-1)
Part Number: 08970-99000 (Nov81). The 8970A is a discontinued product; this product note is provided for information only.
應用手冊 1981-11-01 |
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7.65 MB
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Applying a New In-Circuit Probing Technique for High-Speed/High Density Printed Circuit Boards
Bead probes were used to obtain additional test access on a high-density production printed circuit board. This case study includes practical information and key bead-specific learnings discovered during the process of outsourcing.
應用手冊 2006-10-24 |
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Attenuation Measurement of Step Attenuators
Describes the T-matrix measurement method for achieving high accuracy in calibrating step attenuators.
應用手冊 2012-10-02 |
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440 KB
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AXI and Lead-Free Process Characterization
How to use Automated X-ray Inspection as a tool to characterize new lead-free soldering processes.
應用手冊 2005-06-21 |
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Best of 8 Hints for Making Better Oscilloscopes Measurements
Agilent engineers sharing ideas of how to use the equipment they design
應用手冊 2008-03-17 |
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320 KB
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Bluetooth® RF Measurement Fundamentals (AN 1333-1)
Bluetooth® is an open specification for a wireless personal area network. It provides limited range RF connectivity for voice and data transmissions between information appliances.
應用手冊 2006-10-12 |
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Boosting PLL Design Efficiency From free-running VCO characterizations to closed-loop PLL evaluation
This application note describes introduces practical solutions for VCO/PLL performance evaluation and gives actual examples of parameter measurements using the E5052B.
應用手冊 2008-11-21 |
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Boundary Scan Ground Bounce Suppression
Boundary-Scan circuitry, while in the process of testing interconnections, can set up and excite current surges on a board. This in turn can cause "ground bounce".
應用手冊 1998-04-24 |
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14 KB
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Boundary Scan Helps EMS Companies Cut Test Costs and Increase Revenues
Electronics Manufacturing Services (EMS) providers can utilize boundary-scan to reduce test cost expenses and also generate additional revenue opportunities.
應用手冊 2003-03-01 |
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242 KB
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Boundary-Scan Technology, Justification, and Test Implementation for Designers
This paper provides practical insight for designers on the merits, design, and test implementation of Boundary-Scan Technology.
應用手冊 1998-05-27 |
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29 KB
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Build Operator Menu: Multiple Menu Configuration Control for 5DX Auto User Interface
The "Build Operator Menu" software replaces and extends the functionality found in the BLDOPMNU DOS command. This application note provides useful user information about this menu.
應用手冊 2008-09-04 |
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849 KB
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