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ENA/PNA - Mixers - Comparing Mixer Measurement Techniques (1408-2) 
This paper compares techniques and instruments for measuring conversion loss and group delay on a single stage converter with an embedded low pass filter. Conversion loss using a: spectrum, scalar, and vector network analyzer.

Application Note 2004-01-28

PDF PDF 265 KB
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ENA/PNA - Mixers - New Vector Characterization Techniques 
This paper presents a novel method for characterizing RF mixers, yielding magnitude, phase, and group delay response of the conversion loss, as well as the input match and output match.

Application Note 2002-10-04

PDF PDF 207 KB
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ENA/PNA - Mixers - Transmission Measurements using FCA (1408-1) 
Microwave PNA Series Network Analyzer Application Note, mixer transmission measurements using the frequency converter application note 1408-1

Application Note 2003-05-16

PDF PDF 1 MB
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Enhanced Log Records for the Agilent Medalist In-Circuit Test System 
Track changes made to your i3070 test programs to improve success.

Application Note 2009-03-04

PDF PDF 801 KB
Essential Testability Guidelines for Current Technology 
This paper addresses essential testability considerations, both electrical and mechanical, and focuses on new requirements of current technologies.

Application Note 1993-04-22

PDF PDF 55 KB
Establishing Traceability for Quantities Derived from Multiple Traceable Quantities by Jian Liu  
Provides method of developing traceability for measurements (eg. phase noise) that have no SI units.

Application Note 2012-06-15

PDF PDF 1.83 MB
Evaluation of the Performance of a State-of-the-Art Digital Multimeter - White Paper 
Describes several methods used to verify the performance of a very accurate automatically calibrated DMM, the HP 3458A.

Application Note 2012-10-02

PDF PDF 478 KB
Exposed Pad Algorithm for the Medalist x6000 AXI System 
This application note describes how to use the exposed pad algorithm in the Medalist x6000 AXI software to test all varieties of QFN and FET package types for defects such as Open and Voiding.

Application Note 2008-10-21

PDF PDF 1.83 MB
Extending the 8640B Frequency Down to DC (AN 171-2) 
Measurements with Signal Generators Application Note 171-2

Application Note 1974-09-01

PDF PDF 644 KB
First pass Yield (FPY) and Alarm Triggers on the Agilent Medalist i3070 In-circuit Test System 
This application note will explain some customizations and how to create alarm triggers.

Application Note 2008-09-26

PDF PDF 131 KB
Fixture Interface Pin (MINT Pin) Maintenance 
Fixture Interface Pins (MINT Pins) used in production testing will eventually get dirty enough to cause contact problems.

Application Note 1998-03-01

PDF PDF 20 KB
Fully-Automatic DMM Calibration System - White Paper 
Describes a fully-automatic calibration system for digtial multimeters (DMMs), including the uncertainty estimation of DC Voltage measurements.

Application Note 2012-10-14

PDF PDF 2.28 MB
Fundamentals of Microwave Frequency Counters (AN 200-1) 
This somewhat lengthy, classic Application Note addresses the microwave counter designer's need for down-conversion techniques. It describes and compares techniques and outlines additional considerations in choosing a microwave counter. Includes some applications of the Agilent 5342A.

Application Note 1997-05-01

PDF PDF 219 KB
Fundamentals of Modal Testing (AN 243-3) 
This modal test 56 page Application Note provides an verview of structural dynamics theory, the measurement process for acquiring frequency response data, parameter estimation (curve fitting), and the analytical techniques of structural analysis and their relation to experimental testing (such...

Application Note 2000-05-01

PDF PDF 793 KB
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Fundamentals of Quartz Oscillators (AN 200-2) 
The purpose of this classic Application Note is to provide a background on the crystal reference element and its impact in an oscillator circuit. It then explains the effects of the oscillator on the accuracy of a frequency measurement and frequency generation.

Application Note 1997-05-01

PDF PDF 250 KB
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Fundamentals of Quartz Oscillators (AN 200-2) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1977-01-01

PDF PDF 904 KB
Fundamentals of RF and Microwave Noise Figure (AN 57-1) 
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.

Application Note 2010-08-05

PDF PDF 864 KB
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Fundamentals of RF and Microwave Power Measurements (AN 64-1A) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1998-06-01

PDF PDF 720 KB
Fundamentals of RF and Microwave Power Measurements (AN 64-1C) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 2001-04-16

PDF PDF 2.21 MB
Fundamentals of RF and Microwave Power Measurements (AN 1449) 
Agilent's Fundamentals of RF and Microwave Power Measurements, application note (AN 1449-1/2/3/4).

Application Note 2009-06-05

 
Fundamentals of RF and Microwave Power Measurements (Part 1) (AN 1449-1) 
Introduction to Power, History, Definitions, International Standards, and Traceability AN 1449-1, literature number 5988-9213EN

Application Note 2003-04-17

PDF PDF 550 KB
Fundamentals of RF and Microwave Power Measurements (Part 2) (AN 1449-2) 
Power Sensors and Instrumentation AN 1449-2, literature number 5988-9214EN

Application Note 2006-07-05

PDF PDF 1010 KB
Fundamentals of RF and Microwave Power Measurements (Part 3) (AN 1449-3) 
Power Measurement Uncertainty per International Guides AN 1449-3, literature number 5988-9215EN

Application Note 2011-04-05

PDF PDF 525 KB
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Fundamentals of RF and Microwave Power Measurements (Part 4) (AN 1449-4) 
An Overview of Agilent Instrumentation for RF/Microwave Power Measurements AN 1449-4, literature number 5988-9216EN

Application Note 2008-09-01

PDF PDF 231 KB
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Fundamentals of Signal Analysis (AN 243) 
This Application Note is a primer for those who are unfamiliar with the advantages of analysis in the frequency and modal domains and with the class of analyzers we call dynamic signal analyzers. It explains the time, frequency and modal domains and provides an overview of the major functions and...

Application Note 2000-06-01

PDF PDF 3.37 MB
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