プリント基板（PCB）のテストと検査

When to Use AOI, When to Use AXI, and When to Use Both by Stig Oresjo, senior test strategy consultant at Agilent Technologies. アプリケーション・ノート 2002-12-01	PDF 70 KB
Windows & Unix Feature Comparison The Windows & Unix 3070 Feature Comparison document provides a detailed listing of features translated to the Windows based 3070 from the Unix based 3070. アプリケーション・ノート 2002-07-31	PDF 71 KB
Writing Flash Memory with Agilent 3070 Systems Flash memory is traditionally programmed on PROM programmers, but some manufacturers report a one percent damage rate due to the extra handling steps required! アプリケーション・ノート 2001-05-18	PDF 31 KB
“Shotgunning”, a Bad Fit for Lead-Free Test Shotgunning, a common repair technique in functional test, will be negatively affected by lead-free processes. This article explores the technique and draws broad conclusions regarding the impact of lead-free on electronics manufacturing test アプリケーション・ノート 2006-02-07	PDF 44 KB