Optical & Photonic

Optical Interconnect Test

Agilent offers a wide-range of innovative test and measurement solutions to accelerate the progress of next-generation intelligent optical networks.

Agilent's mission in the optical market is to shorten time-to-market and reduce cost-of-test for customers in R&D and manufacturing, as well as enable new technologies which include innovative optical components, network elements & systems, and all-optical fiber networks.

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Lightwave Signal Analyzers Measure Relative Intensity Noise (PN 71400-1) This product note describes techniques to measure laser intensity noise with the Agilent 714000C and 71410C lightwave signal analyzers. It includes RIN examples and measurements. Application Note 2000-07-01	PDF 417 KB
Loop Bandwidth and Clock Data Recovery in Oscilloscope Measurements (AN 1304-6) This application note describes loop bandwidth and clock data recovery in oscilloscope measurements. Application Note 2002-05-30	PDF 600 KB
Making Time Resolve Chirp Measurements This application note covers laser modulation methods, time-resolved chirp (TRC) measurement methods, and applications of TRC measurement data to predict laser perfomance in a transmission system. Application Note 2002-03-12	PDF 500 KB
Measuring Extinction Ratio of Optical Transmitters (AN 1550-8) Optical transmitters used in high-speed digital communication systems are typically required to maintain a specific set of performance levels. Application Note 2001-01-01	PDF 312 KB Languages English \| 2001-01-01 \| PDF 312 KB 中文（简体） \| 2001-01-01 \| PDF 312 KB 日本語 \| 2002-09-30 \| PDF 587 KB
Measuring High Power Waveforms with the 86100A DCA and the 86101A or 86103A Reference Receiver Product Note 86100-2 discusses the Agilent 86100A Digital Communications Analyzer (DCA)with the 86101A/103A plug-in module, designed to perform Gigabit Ethernet and Fibre Channel compliance testing. Application Note 2000-06-14	PDF 453 KB
Measuring IL and PDL spectra with the fast-switching N7786B The advantages and details of a new method for swept-wavelength IL and PDL measurement is introduced, including configuration details for the necessary instruments and software. Application Note 2009-04-10	PDF 672 KB
Measuring Jitter in Digital Systems (AN 1448-1) Measuring jitter and how to calculate total jitter. Application Note 2008-01-30	PDF 1.91 MB
Measuring Polarization Dependent Loss of Passive Optical Components A new document on the methods of characterizing passive optical components. Application Note 2008-12-01	PDF 545 KB
Measuring the Dependence of Optical Amplifiers on Input Power Using an Attenuator This application note describes the important optical amplifier properties of gain and noise figures and their dependence on the powers and wavelengths of the input signals. Application Note 2002-03-11	PDF 260 KB
Method of Implementation (MOI) for DisplayPort Sink Compliance Test Method of Implementation (MOI) for DisplayPort Sink Compliance Test Application Note 2008-08-18	PDF 1.87 MB
MOI for SATA RSG Tests, SATA Interoperability Program Rev. 1.3 Agilent Method Of Implementation for SATA RSG Tests, Serial ATA Interoperability Program Revision 1.3 Application Note 2008-05-30	PDF 2.17 MB
Narrow-band PMD Measurements with the Agilent 8509C (PN 8509-2) This product note provides information about making narrow-band Polarization Mode Dispersion (PMD) measurements using the Agilent 8509B Lightwave Polarization Analyzer. Application Note 2001-02-01	PDF 830 KB
Next Generation SONET/SDH devices - the driver for multi-port, muli-channel test This application note describes next generation SONET/SDH telecomm network equipment and some of the new challenges faced in testing the behavior and characteristics of such equipment. Application Note 2002-11-12	PDF 1.67 MB Languages English \| 2002-11-12 \| PDF 1.67 MB 中文（简体） \| 2004-06-04 \| PDF 3.85 MB
On-Wafer Testing of Opto-Electronic Components Using LCA's This document describes the principles of on-wafer measurements on opto-electronic components Application Note 2008-08-13	PDF 1.57 MB Languages English \| 2008-08-13 \| PDF 1.57 MB 中文（简体） \| 2008-12-01 \| PDF 1.78 MB
Packet over SONET/SDH (POS) Functional Testing Product Note Packet over SONET/SDH (POS) has emerged as the technology of choice for high-speed routers as it enables efficient transmission of internet protocol (IP) packets directly over SONET/SDH. Application Note 2000-09-01	PDF 2 KB
PCI Express® Revision 2 - Receiver Testing With J-BERT N4903A and 81150A Pulse Application Note 2008-12-03	PDF 1000 KB
Polarization Measurements of Signals and Components (PN-8509-1) This product note discusses various types of polarization measurements, introduces related polarization phenomena, presents measurement setups, procedures and typical Agilent 8509 test results. Application Note 2002-06-21	PDF 1.36 MB
Polarization-dependent Loss (PN 11896-2) This product note discusses the concept of PDL and gives examples of typical values that are expected for common lightwave components. Application Note 2000-06-01	PDF 202 KB
Powering DC-to-DC Converters Using the Agilent N6705A DC Power Analyzer This application brief describes an example of how an R&D engineer can test DC-to-DC converters using capabilities of the N6705A DC Power Analyzer. Application Note 2007-04-11	PDF 188 KB Languages English \| 2007-04-11 \| PDF 188 KB 中文（简体） \| 2007-05-07 \| PDF 490 KB 日本語 \| 2007-05-29 \| PDF 362 KB 中文（繁體） \| 2007-08-17 \| PDF 188 KB
Precision Jitter Analysis Using the Agilent 86100C DCA-J (PN 86100C-1) This product note provides a guide to making jitter measurements with the Agilent 86100C DCA-J. Application Note 2007-03-07	PDF 1.64 MB Languages English \| 2007-03-07 \| PDF 1.64 MB 日本語 \| 2004-07-20 \| PDF 4.28 MB 한국어 \| 2007-03-07 \| PDF 1.64 MB
Precision Jitter Transmitter This paper introduces a precisely calibrated jitter source capable of applying a wide variety of jitter signals in different combinations at adjustable amplitudes. The system, calibration techniques, and examples are discussed. Application Note 2005-06-20	PDF 387 KB
Precision Waveform Analysis for High-Speed Digital Communications Technical Overview his document will discuss the Agilent 86108A precision waveform analyzer plug-in module with the Agilent 86100C DCA-J sampling oscilloscope mainframe for accurate analysis of high-speed digital communications signals. Application Note 2008-04-17	PDF 1.88 MB Languages English \| 2008-04-17 \| PDF 1.88 MB 中文（简体） \| 2008-04-17 \| PDF 1.88 MB 日本語 \| 2008-05-14 \| PDF 8.37 MB
Probing High-Speed Signals with the 86100 Series of Wide-Bandwidth Sampling Oscilloscopes (86100-6) Product Note 86100-6 discusses three important measurement accessories that help make probe-based measurements both simple and accurate for the Agilent 86100 Wide-Bandwidth Oscilloscope. Application Note 2011-07-28	PDF 651 KB Languages English \| 2011-07-28 \| PDF 651 KB 日本語 \| 2007-04-10 \| PDF 578 KB
Rigorous Stressing of SONET/SDH Alarms Using Programmable 3-Stage Sequences In this Product Note the testing the alarm and pointer processing algorithms of a SONET or SDH network element (NE), requires more sophisticated testing techniques, such as the 3-stage alarm sequencing facility of the Agilent 75000 Series 90 Modular Telecom Analyzer. Application Note 1996-06-01	PDF 237 KB
Testing 10-Gb/s SONET/SDH Equipment and Components This Product Note describes key features of the Agilent 71612A 12 Gb/s error performance analyzer that are particularly beneficial in the development and production testing of components and sub-systems for SONET/SDH transmission equipment. The creation and real-time editing of custom patterns... Application Note 2001-07-18	PDF 684 KB

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