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Optical Interconnect Test

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Next Generation SONET/SDH devices - the driver for multi-port, muli-channel test This application note describes next generation SONET/SDH telecomm network equipment and some of the new challenges faced in testing the behavior and characteristics of such equipment. アプリケーション・ノート 2002-11-12	PDF 1.67 MB 言語 English \| 2002-11-12 \| PDF 1.67 MB 中文（简体） \| 2004-06-04 \| PDF 3.85 MB
On-Wafer Testing of Opto-Electronic Components Using LCA's This document describes the principles of on-wafer measurements on opto-electronic components アプリケーション・ノート 2008-08-13	PDF 1.57 MB 言語 English \| 2008-08-13 \| PDF 1.57 MB 中文（简体） \| 2008-12-01 \| PDF 1.78 MB
Packet over SONET/SDH (POS) Functional Testing Product Note Packet over SONET/SDH (POS) has emerged as the technology of choice for high-speed routers as it enables efficient transmission of internet protocol (IP) packets directly over SONET/SDH. アプリケーション・ノート 2000-09-01	PDF 2 KB
PCI Express® Revision 2 - Receiver Testing With J-BERT N4903A and 81150A Pulse アプリケーション・ノート 2008-12-03	PDF 1000 KB
Polarization Measurements of Signals and Components (PN-8509-1) This product note discusses various types of polarization measurements, introduces related polarization phenomena, presents measurement setups, procedures and typical Agilent 8509 test results. アプリケーション・ノート 2002-06-21	PDF 1.36 MB
Polarization-dependent Loss (PN 11896-2) This product note discusses the concept of PDL and gives examples of typical values that are expected for common lightwave components. アプリケーション・ノート 2000-06-01	PDF 202 KB
Precision Jitter Transmitter This paper introduces a precisely calibrated jitter source capable of applying a wide variety of jitter signals in different combinations at adjustable amplitudes. The system, calibration techniques, and examples are discussed. アプリケーション・ノート 2005-06-20	PDF 387 KB
Rigorous Stressing of SONET/SDH Alarms Using Programmable 3-Stage Sequences In this Product Note the testing the alarm and pointer processing algorithms of a SONET or SDH network element (NE), requires more sophisticated testing techniques, such as the 3-stage alarm sequencing facility of the Agilent 75000 Series 90 Modular Telecom Analyzer. アプリケーション・ノート 1996-06-01	PDF 237 KB
Testing 10-Gb/s SONET/SDH Equipment and Components This Product Note describes key features of the Agilent 71612A 12 Gb/s error performance analyzer that are particularly beneficial in the development and production testing of components and sub-systems for SONET/SDH transmission equipment. The creation and real-time editing of custom patterns... アプリケーション・ノート 2001-07-18	PDF 684 KB
The Benefits of and Considerations for the Embedded CDR in the N5980A アプリケーション・ノート 2008-09-16	PDF 591 KB
Total Jitter Measurements at Low Probability Levels, Using Optimized BERT Scan Method This paper describes an optimized technique based on probabliity and statistics theory that enables accurate TJ measurements at the 1e-12 bit error ratio level in about 20 minutes at 10 Gbit/s. アプリケーション・ノート 2005-07-11	PDF 894 KB
Transient Optical Power Measurements with the N7744A and N7745A This note shows how to measure transient and time-dependent optical signals, both of which are related to the fast sample rate and data throughput of the N7744A and N7745A multiport power meters. アプリケーション・ノート 2010-11-12	PDF 1.23 MB
Tunable SONET/SDH BERT for 2.488 Gb/x WDM This Product Note describes how the Agilent 75000 Series 90 Modular Telecom Analyzer can perform bit error measurements on individual channels of a wavelength division multiplexing (WDM) signal, by using the Agilent 71451B optical spectrum analyzer's monochromator as a tunable, bandwidth... アプリケーション・ノート 1996-06-01	PDF 181 KB
Upgrade to PCI Express 2.0© Receiver Test The 15431A is a filter set for the 81150A. It generates the random jitter profile for testing PCI Express 2.0 receivers, to be used in conjunction with the N4903A. This fact sheet explains the upgrade. アプリケーション・ノート 2008-10-24	PDF 348 KB
Variable Optical Attenuator in BER Test Applications This application note will help users of optical attenuators to understand the key features of Agilent’s new attenuator family. アプリケーション・ノート 2001-08-23	PDF 409 KB 言語 English \| 2001-08-23 \| PDF 409 KB 中文（简体） \| 2001-08-23 \| PDF 409 KB
WDM System Test with the Agilent 86120 Multi-Wavelength Meter ( PN 86120-1) This product note addresses the WDM system, the design and maintenance issues warranting measurement, and how the Agilent 86120 Multi-Wavelength Meter can be used to easily... アプリケーション・ノート 2000-08-01	PDF 435 KB
What is the difference between an equivalent time sampling oscilloscope and a real-time oscilloscope This document will discuss how each type of scope samples the incoming waveform and explain the trigger requirements. A summary detailing the advantages of each scope is provided at the end. アプリケーション・ノート 2008-07-08	PDF 605 KB 言語 English \| 2008-07-08 \| PDF 605 KB 中文（简体） \| 2008-12-01 \| PDF 552 KB 한국어 \| 2008-07-08 \| PDF 605 KB