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Design Considerations for PC Board Carriers for Use in the Agilent 5DX 
There are several reasons why it may be necessary or desirable to use a carrier to transport printed circuit assemblies through the 5DX. This paper discusses these and some considerations for the design of suitable carriers.

Application Note 2005-07-13

PDF PDF 918 KB
Design for Testability - Test for Designability 
This paper addresses testability considerations, both physical and logical, and focuses on both the new constraints and the new freedoms of modern manufacturing test in the ever-changing challenge.

Application Note 2003-01-28

PDF PDF 852 KB
Discharge on Unpowered Agilent 3070 Systems 
This paper is applicable to both powered and unpowered Agilent 3070 systems, but does not explain how a discharge routine is created on an Unpowered system.

Application Note 2003-06-13

 
Discreet Analog Device Testing 
The Agilent 3070 series has quite a few built in features to make developing board tests easier, while protecting the operator, the board under test, and the 3070 itself from harm.

Application Note 1998-10-29

PDF PDF 26 KB
Effective Multitap Transformer Testing Using a Scanner (AN 1224-5) 
This Application Note shows an effective multi-tap transformer measurement using a scanner and the Agilent 4263B LCR Meter.

Application Note 2001-11-05

PDF PDF 945 KB
Languages 
Effects of Lead Free Solders on Imaging Characteristics of the Agilent 5DX Laminographic X-ray Test  
The electronics industry is under pressure to migrate solder processes away from the usage of eutectic tin-lead solder and towards utilization of lead-free compounds.

Application Note 1998-05-01

PDF PDF 83 KB
Electrical In-circuit Test Methods for Limited-access Boards 
This paper surveys the various electrical test methods and tools available to address testing boards that lack full electrical access.

Application Note 2001-02-27

PDF PDF 47 KB
Electronic Heater Valves Testing (AN 1270-4) 
Production testing of heater/air conditioning system valves is performed on high speed HP automatic test systems with minimum operator interface. This Application Note describes a typical HP VXI system configuration for testing automotive heater/air-conditioning system valves.

Application Note 1995-06-01

PDF PDF 39 KB
Essential Testability Guidelines for Current Technology 
This paper addresses essential testability considerations, both electrical and mechanical, and focuses on new requirements of current technologies.

Application Note 1993-04-22

PDF PDF 55 KB
Fixture Interface Pin (MINT Pin) Maintenance 
Fixture Interface Pins (MINT Pins) used in production testing will eventually get dirty enough to cause contact problems.

Application Note 1998-03-01

PDF PDF 20 KB
Gauge Repeatability on 5DX X-ray System 
Summary of 5DX repeatability capability, factors that influence the repeatability capabilities of the 5DX, impacts to gauge repeatability and reproducibility (GR&R) results.

Application Note 2005-03-09

PDF PDF 102 KB
Ground Bounce Basics and Best Practices 
This article offers a description of the physical properties that result in ground bounce during board test.

Application Note 2003-01-28

PDF PDF 138 KB
Handling Surface Mapping with Varying Board Construction 
This paper describes a method for dealing with lot-to-lot or supplier-to-supplier variations in board construction. Often the variations in board construction result in different color boards which otherwise cause problems with surface mapping.

Application Note 2004-12-02

PDF PDF 1.02 MB
High Node Count Fixturing Solutions for Agilent Short-Wire Test Fixtures 
This paper discusses problems encountered in building large, high node count vacuum actuated test fixtures for the Agilent 3070 family of board test systems.

Application Note 2008-04-30

PDF PDF 67 KB
How and Why: Confirmation and Adjustments 
This paper describes the process of and reason for periodic adjustment of a 5DX system using the confirmation and adjustment panel.

Application Note 2004-12-01

PDF PDF 636 KB
How To Float, or Series, Agilent 3070 DUT Supplies 
The Agilent 3070 development software does an amazing job of calculating the wiring needed to build fixtures. Even so there are occasionally cases which require wiring that the standard Agilent 3070 software can not handle.

Application Note 1997-01-23

PDF PDF 34 KB
How to Get the Most from Agilent's Intelligent Yield Enhancement Test (IYET) 
This paper describes how to get the most from IYET for Agilent board test systems.

Application Note 2005-07-15

 
How to use the Agilent N6700 Modular Power System to replace an Agilent 662xA (AN 1467)  
This is a high-level overview to help current 662xA owners easily convert to an Agilent N6700.

Application Note 2004-08-02

PDF PDF 220 KB
Languages 
Hybrid32 Migration 
This document is provided to help users of HybridPlus Pin Cards more easily incorporate the Hybrid32 technology into their existing systems.

Application Note 2000-11-01

PDF PDF 61 KB
Improved Fault Coverage in a Combined X-ray and In-Circuit Test Environment 
Cutting functional test failures in half and doubling the faults detected at process test! These are some of the case study results observed in combined X-ray and in-circuit test environments.

Application Note 2001-02-27

PDF PDF 575 KB
In-circuit Testing of Low Voltage Devices 
Core technical document summarizing issues regarding the testing of low voltage devices on the 3070 and i5000, including updated Safeguard information.

Application Note 2005-05-25

PDF PDF 172 KB
In-System Programming on the Agilent 3070 
In-System Programmable devices are more widely used on today's boards to provide flexibility to design engineers and to reduce the cost of a product.

Application Note 2001-07-02

PDF PDF 205 KB
Increase Automotive ECU Test Throughput (AN 1505) 

Application Note 2004-10-22

PDF PDF 58 KB
Languages 
Increase DC-input Battery Adapter Test Throughput by Several-fold (AN 1506) 

Application Note 2004-10-22

PDF PDF 80 KB
Languages 
Increasing dc Power Supply Test System Throughput 
This Product Note describes some of the ways this new family of electronic loads can be used to achieve maximum throughput for your dc power supply test system.

Application Note 2000-05-01

PDF PDF 157 KB

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