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Jitter Fundamentals: Jitter Tolerance Testing with Agilent ParBERT 81250
This applicaiton note describes gain fast and efficient insight into the operation and performance of CDR, clock system and jitter tolerance.
應用手冊 2003-12-02 |
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3.18 MB
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Limitations and Accuracies of Time and Frequency Domain Analysis of Physical Layer Devices
應用手冊 2005-11-01 |
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2.83 MB
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Loop Bandwidth and Clock Data Recovery in Oscilloscope Measurements (AN 1304-6)
This application note describes loop bandwidth and clock data recovery in oscilloscope measurements.
應用手冊 2002-05-30 |
PDF
600 KB
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Low Voltage Differential Signaling, (AN 1382-6)
Using LVDS for High Speed Data Transmission
應用手冊 2001-12-17 |
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2.53 MB
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Measurement Uncertainty of VNA based TDR/TDT Measurement Application Note
This application note explains the theory of measurement uncertainty in TDR/TDT measurement with the ENA Option TDR.
應用手冊 2011-07-08 |
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1.77 MB
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Measuring Characteristic Impedance of Short Rambus Motherboard Traces (AN 1304-4)
This application note tells you how to perform characteristic impedance measurements on Rambus motherboards and SO-RIMM's using TDR with normalization and verification.
應用手冊 2000-11-01 |
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Measuring Jitter in Digital Systems (AN 1448-1)
Measuring jitter and how to calculate total jitter.
應用手冊 2008-01-30 |
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1.91 MB
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Measuring Jitter with the Agilent E4874A Characterization Software Components
The Product Note shows how to measuring jitter with the Agilent E4874A Characterization Software Components on the Agilent 81200 Data Generator/Analyzer Platform. See also R & D Central at: http://www.agilent.com/find/randd Select "Bit Error Ratio Testing (BERT)" on that page. Then...
應用手冊 2000-06-01 |
PDF
102 KB
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Method of Implementation (MOI) for DisplayPort Sink Compliance Test
Method of Implementation (MOI) for DisplayPort Sink Compliance Test
應用手冊 2008-08-18 |
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1.87 MB
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Microprobing with the Agilent 86100A Infiniium DCA (AN 1304-3)
A guide to making accurate measurements with the Agilent 86100A Infiniium DCA and Time Domain Reflectometer using Cascade Microtech high frequency probes.
應用手冊 2000-11-01 |
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1.84 MB
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Mixed Analog & Digital Signal Debug and Analysis Using a Mixed-Signal Oscilloscope
Using a mixed analog and digital 32 bit WLAN application example, this note shows how an MSO with deep memory makes debugging today’s mixed analog and digital designs easier than ever before.
應用手冊 2009-06-01 |
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Network Analysis - De-embedding and Embedding S-Parameter Networks (1364-1)
At RF and microwave frequencies, it becomes difficult to directly measure devices with nonstandard connectors (for example, devices using surface-mount packaging).
應用手冊 2004-06-01 |
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Next Generation I/O Bus PCI Express BER Test Solution
PCI Express increases data transport efficiency and data quality. It uses an 8b/10b encoding methodology to embed the clock signal ...
應用手冊 2005-05-25 |
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2 MB
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On-Chip Design Verification with Xilinx FPGAs
Xilinx Virtex-II Pro devices have redefined FPGAs.
應用手冊 2003-04-30 |
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Optimizing VCO/PLL evaluations and PLL synthesizer designs AN 1330-1
This application note clarifies the role and performance requirements of the synthesized oscillator used in wireless communication equipment, and introduces our test solution for VCO/PLL evaluation.
應用手冊 2000-09-01 |
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1.04 MB
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PCI Express Receiver Design Validation Test with 81134A / 81250A
Describes functional validation and compliance and stress tests for PCI Express receiver design
應用手冊 2005-03-18 |
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2.01 MB
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PCI Express Transmitter Electrical Validation and Compliance Testing - Application Note
This application note is intended for digital designers and developers validating electrical
performance of PCI Express-based designs and working toward electrical compliance of PCI Express products.
應用手冊 2011-10-28 |
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1.01 MB
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Planning Your Design for Debug: FPGA Dynamic Probe
應用手冊 2005-01-26 |
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Power Toolbox for Embedded System Designs
Properly Powering On and Off Multiple Power Inputs in Embedded Designs
應用手冊 2009-06-01 |
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Precision Jitter Analysis Using the Agilent 86100C DCA-J (PN 86100C-1)
This product note provides a guide to making jitter measurements with the Agilent 86100C DCA-J.
應用手冊 2007-03-07 |
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Precision Jitter Transmitter
This paper introduces a precisely calibrated jitter source capable of applying a wide variety of jitter signals in different combinations at adjustable amplitudes. The system, calibration techniques, and examples are discussed.
應用手冊 2005-06-20 |
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387 KB
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Preselector Tuning for Amplitude Accuracy in Microwave Spectrum Analysis
This 8 page application note introduces the technique for broadband modulated signals employed in the new MXA signal analyzer.
應用手冊 2009-08-14 |
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Probing High-Speed Signals with the 86100 Series of Wide-Bandwidth Sampling Oscilloscopes (86100-6)
Product Note 86100-6 discusses three important measurement accessories that help make probe-based measurements both simple and accurate for the Agilent 86100 Wide-Bandwidth Oscilloscope.
應用手冊 2011-07-28 |
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Quick Identification of Periodic Jitter Sources (AN 1200-4)
The Agilent 53310A is an easy-to-use, inexpensive tool for displaying time interval measurements versus time. Any repetitive pattern in the jitter is immediately apparent. The 53310A's analysis features readily give peak-to-peak and periodic rate information. Taking all of these clues together...
應用手冊 2000-08-01 |
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S-parameter Series: Practical Application of the InfiniiSim Waveform Transformation Toolset Applicat
Presents and addresses five of the most common problems that confront engineers when trying to measure performance on high speed links, using an oscilloscope.
應用手冊 2012-08-21 |
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