RF 및 마이크로웨이브
상세 분류
상세분류 제거어플리케이션별
- RF & Microwave Design (15)
- X-parameters (4)
- PIM(Passive Intemodulation) (1)
- 노이즈 피겨 측정 및 솔루션 (18)
- 설계 및 테스트 통합 (20)
- 펄스 RF 측정 (12)
- EMI 및 EMC (9)
- Signal Monitoring, Geolocation (1)
- 임피던스 (30)
- ESL Design (16)
- Phase-Locked Loops (10)
분야별 검색결과
제품 카테고리별
51-75 / 211
|
Solutions for Addressing SDR Design and Measurement Challenges
This "solutions for" application brief discusses how to use COTS technology and an integrated design-to-test flow to quickly develop optimal SDRs.
어플리케이션 노트 2009-08-03 |
PDF
986 KB
|
|
Practical RF Amp. Design Using the Available Gain Procedure & the ADS EM/Circuit Co-Sim. Capability
This white paper features a method of designing a low noise RF amplifier for an 802.11b receiver application and contains an Avago ATF54143 PHEMT transistor.
어플리케이션 노트 2009-06-25 |
|
|
Fundamentals of RF and Microwave Power Measurements (AN 1449)
Agilent's Fundamentals of RF and Microwave Power Measurements, application note (AN 1449-1/2/3/4).
어플리케이션 노트 2009-06-05 |
|
|
Extension of X-parameters to Include Long-Term Dynamic Memory Effects
IEEE MTT-S International Microwave Symposium Digest, Boston
어플리케이션 노트 2009-06-05 |
|
|
Techniques and Trends in Signal Monitoring, Frequency Management and Geolocation of Wireless
This application note reviews various issues, techniques and associated equipment required for signal monitoring and frequency management of RF spectrum in the VHF/UHF frequency range.
어플리케이션 노트 2009-04-27 |
|
|
RF/IF -To- Digital Connected Solutions Bit Error Rate Using Agilent's ADS
This Application Note describes how test and measurement hardware and EDA software from Agilent Technologies can be connected to verify Bit Error Rate for RF/IF-to-digital receiver topologies.
어플리케이션 노트 2009-03-20 |
|
|
GoldenGate Technical Notes (requires login)
Technical Support Documents & Examples related to Agilent EEsof EDA's GoldenGate RFIC Simulation Software
어플리케이션 노트 2009-03-16 |
|
|
Impedance Measurements - Evaluating EMC Components with DC Bias Superimposed
This application note gives an overview on how to evaluate electromagnetic compatible (EMC) components in a way that satisfies strict EMC requirements. It also introduces various EMC measurement solutions.
어플리케이션 노트 2009-02-03 |
PDF
1.33 MB
|
|
LTE Reference Vector
A fresh approach to Comms PHY system design challenges.
어플리케이션 노트 2008-12-15 |
PDF
234 KB
|
|
Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Agilent 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.
어플리케이션 노트 2008-12-10 |
|
|
Wide-Range DC Current Biased Inductance Measurement (AN 369-8)
This application note describes DC current biased inductance measurements that are more accurate and made over a wider frequency range than was previously possible.
어플리케이션 노트 2008-11-21 |
|
|
Boosting PLL Design Efficiency From free-running VCO characterizations to closed-loop PLL evaluation
This application note describes introduces practical solutions for VCO/PLL performance evaluation and gives actual examples of parameter measurements using the E5052B.
어플리케이션 노트 2008-11-21 |
|
|
Effective Transformer/LF Coil Testing (AN 1305-3)
Transformers/LF coils have gradually become miniaturized and are used in power supply circuits and digital networks(for example, ISDN), and are manufactured in increasing volume. QA and manufacturing have to improve evaluation of transformers/LF coils, but they are faced with big measurement...
어플리케이션 노트 2008-11-20 |
|
|
Characterizing Clock Jitter through Phase Noise Measurements Speeds up Design Verification Process
This white paper discusses a new measurement method for obtaining highly accurate low random jitter (RJ) measurements and performing real-time analysis of RJ and periodic jitter (PJ) of components.
어플리케이션 노트 2008-11-20 |
|
|
New Technologies for Accurate Impedance Measurement (40Hz to 110MHz)
Auto-balancing bridge method is the best technique to make an accurate impedance measurement in LF frequency. The recent technical innovation successfully expanded its upper frequency limitation from 40MHz to 110MHz. This Product Note discusses how its made and other new technologies included in...
어플리케이션 노트 2008-11-20 |
|
|
State of the Art in EM Software for Microwave Engineers
This article discusses the three most established EM simulation technologies: MoM, FEM, and FDTD, linking the simulation technology to solving specific applications.
어플리케이션 노트 2008-11-20 |
PDF
628 KB
|
|
Achieving Fast Design Cycle Time
This application note describes how fast cycle time is achieved using the impedance analyzer such as the E4991A and 4294A with the Electronic Design Automation (EDA) tools.
어플리케이션 노트 2008-11-13 |
|
|
P-Series Measurement Uncertainty Calculator
Measurement Uncertainty Calculator for the N1911A and N1912A Power Meters and the N1921A and N1922A Power Sensors.
어플리케이션 노트 2008-11-01 |
XLS
92 KB
|
|
Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers (AN 1369-1)
This presents the technologies and methods for measuring permittivity and permeability. Primarily on methods that employ the impedance measurement technology.
어플리케이션 노트 2008-10-28 |
PDF
1.65 MB
|
|
Characterizing phase-locked-loop signal transition behaviors of Microphonic/Phase-hit
This paper discusses how Agilent's Signal Source Analyzer helps you to identify unwanted phase-locked-loop transition "phase-hits", and achieve easy, comprehensive and accurate phase-locked-loop characterization in both linear and nonlinear regions.
어플리케이션 노트 2008-10-02 |
|
|
Large-Signal LDMOS Model Simulation Using Agilent Genesys
This application note guides the user through simulation of DC IV, S-parameters and swept power data of an LDMOS transistor (NEC NE5511279A) using Agilent Genesys software.
어플리케이션 노트 2008-08-21 |
|
|
Data Mining 12-Port S-Parameters
어플리케이션 노트 2008-08-11 |
PDF
830 KB
|
|
New Test Methodologies Improve EMI Testing Efficiency
This 7 page application note discusses a sampling of PSA features of interest to the EMI community that will increase both the quality of data and speed by which results can be derived.
어플리케이션 노트 2008-05-28 |
PDF
801 KB
|
|
주파수 카운터의 최대한 활용을 위한 10가지 힌트
아키텍처 이해에서 보다 빠른 측정 수행에 이르기까지 10가지 힌트를 통해 주파수 카운터에서 얻는 결과를 극대화하십시오.
어플리케이션 노트 2008-04-18 |
|
|
Balanced Circuit Measurement with an Impedance Analyzer/LCR Meter/Network Analyzer (AN 346-2)
This application note describes the difference between a balanced circuit and an unbalanced circuit, and also explains how to make an unbalanced circuit measurement by the unbalanced instrument step by step.
어플리케이션 노트 2008-04-10 |
PDF
116 KB
|
myAgilent에 등록
제품 등록
왜 애질런트 일까요?