基本入門與量測基礎
移除所有細分151-168 / 168
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The Why, Where, What, How, and When of X-ray Test
How do the different AXI technologies work? What are the appropriate uses of 2D vs 3D X-ray? Where in the mfg process should AXI be placed? How can AXI be used to improve the mfg process?
應用手冊 2000-11-01 |
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1.30 MB
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Timing Considerations in Clock Distribution Networks (AN 1210-10)
This Application Note discusses the different causes of skew in a clock distribution network. It shows how to use the Agilent 8133A and 54720A to measure and analyze the causes.
應用手冊 1992-09-01 |
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253 KB
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Understanding the Effects of Racking & System Interconnections (AN 1465-6)
應用手冊 2004-12-21 |
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235 KB
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Understanding the Fundamental Principles of Vector Network Analysis - Application Note 1287-1
This application note explores the fundamental principles of vector network analysis. The discussion includes the common parameters (S-parameters). RF fundamentals such as transmission lines and the Smith chart will also be reviewed.
應用手冊 2012-12-07 |
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Up-and-Down Programming DUT Power Supplies
There seems to be some confusion on what the current limits are when using the DUT supplies in the Agilent 3070 system. While this article is not meant to be an exhaustive treatise on the subject, a little clarification might help.
應用手冊 2001-05-17 |
PDF
23 KB
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Using Boundary Scan to Link Design and Manufacturing Test
By leveraging boundary-scan tests generated in Design and re-using them at Manufacturing Test, manufacturers can produce long-term benefits in terms of lower costs, greater efficiencies and higher quality products.
應用手冊 2003-03-01 |
PDF
502 KB
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Using LAN in Test Systems - Network Configuration (AN 1465-10) - Application Note
The decision to use LAN in a test system delivers important benefits to your company and your team.
From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking
應用手冊 2004-09-14 |
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Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note
The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test.
應用手冊 2004-07-29 |
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270 KB
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Using LAN in Test Systems: Applications (1465-14) - Application Note and Example Programs
Topics include balancing cost,
convenience and security in three
common LAN scenarios: sharing
instruments, remote monitoring and
data acquisition, and functional test
systems. Includes downloadable example programs.
應用手冊 2005-04-01 |
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Using LAN in Test Systems: Setting up System I/O (AN 1465-15) - Application Note
This set of application notes shows
you how to simplify test system
integration by utilizing open connectivity standards such as local area networking (LAN). The collective goal of these notes is to help you produce reliable results, meet your throughput requirements and stay within your budget.
應用手冊 2005-03-29 |
PDF
263 KB
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Using Lead-Free PCB Finishes at Manufacturing In-circuit Test Stage
The purpose of this document is to share experiences and educate engineers regarding different PCB surface finishes and the specific changes required in the PCB build process to allow for ICT.
應用手冊 2004-08-08 |
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102 KB
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Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note
Using SCPI and Direct I/O vs. Drivers,
the fifth note in the series, outlines
the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems
應用手冊 2004-12-13 |
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408 KB
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Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note
Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today
for connecting modern instrumentation to computers are GPIB, LAN, and USB.
應用手冊 2004-11-19 |
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194 KB
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Validating Transceiver FPGAs Using Advanced Calibration Techniques
應用手冊 2005-04-27 |
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1.37 MB
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VNA and TDR Techniques for Circuit Board Characterization
by Gigatest Labs. Review the value of using both TDR and VNA measurements to extract useful information about the properties of transmission lines.
應用手冊 2002-04-01 |
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231 KB
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What to Consider When Selecting the Optimal Test Strategy
This paper addresses several issues for selecting the optimal inspection strategy, presenting data from many studies that Agilent has performed in the quest to find the optimal test / inspection strategy.
應用手冊 2003-03-01 |
PDF
175 KB
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When to Use AOI, When to Use AXI, and When to Use Both
by Stig Oresjo, senior test strategy consultant at Agilent Technologies.
應用手冊 2002-12-01 |
PDF
70 KB
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“Shotgunning”, a Bad Fit for Lead-Free Test
Shotgunning, a common repair technique in functional test, will be negatively affected by lead-free processes. This article explores the technique and draws broad conclusions regarding the impact of lead-free on electronics manufacturing test
應用手冊 2006-02-07 |
PDF
44 KB
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