Digital Design & Interconnect Standards

Achieve your best design with Agilent. Investigate specific solutions for high speed standards plus solutions for your high-speed digital design cycle (design, simulation, analysis, debug compliance and signal integrity) challenges.

Explore YouTube Videos

What's New

Refine the List

Alle detailierte Suchkriterien entfernen

Nach Applikation

By Type of Content

Document Library
- Application Notes
  - Application Note (164)

Nach Produkt Kategorie

Oscilloscopes, Analyzers, Meters (114)
- Oscilloscopes (46)
- Spectrum Analyzers (Signal Analyzers) (18)
- Network Analyzers (21)
- Logic Analyzers (10)
- Protocol Analyzers and Exercisers (9)
- EMI/EMC, Phase Noise, Physical Layer Test Systems (9)
- Bit Error Ratio Test (BERT) Solutions (27)
- Frequency Counter Products (3)
- DC Power Analyzers (1)
Generators, Sources, Supplies (26)
- Signal Generators (Signal Sources) (1)
- Function / Arbitrary Waveform Generators (3)
- Pulse Generator Products (21)
- Data Generators & Analyzers (23)
- DC Power Supplies (1)
- Source Measure Units (1)
Software (44)
- Agilent EEsof EDA Software (11)
- Application Software for Instruments (37)
PXI, AXIe, DAQ & Modular Solutions (7)
- PXI Products & Solutions (1)
- AXIe Products & Solutions (2)
- Data Acquisition Modules - DAQ (1)
- VXI Products & Solutions (3)
Additional Test & Measurement Products (60)
- Application-Specific Test Systems & Components (4)
- Photonic Test & Measurement Products (58)

126-150 of 164

Debugging Parallel RapidIO Designs Application Note 2003-01-09	PDF 356 KB Sprachen English \| 2003-01-09 \| PDF 356 KB 日本語 \| 2003-04-25 \| PDF 1.41 MB
Improving Usability and Performance in High-Bandwidth Active Oscilloscope Probes (AN 1419-02) Understand how to get minimal probe loading and highest-possible-performance representation of your signal. Application Note 2002-11-01	PDF 912 KB Sprachen English \| 2002-11-01 \| PDF 912 KB 中文（简体） \| 2003-06-05 \| PDF 1.20 MB 日本語 \| 2003-02-10 \| PDF 443 KB 中文（繁體） \| 2002-12-10 \| PDF 1.08 MB 한국어 \| 2002-11-01 \| PDF 806 KB
Time Domain Reflectometry Theory (AN 1304-2) This application note discusses the fundamentals of TDR and then relates these fundamentals to the parameters that can be measured in actual test situations. Application Note 2002-08-29	PDF 190 KB Sprachen English \| 2002-08-29 \| PDF 190 KB 日本語 \| 2000-03-01 \| PDF 1.42 MB
Understanding FireWire New Serial Interface Promises Easier, Faster, and Cheaper Instrument Control Scaleable, flexible, and plug-and-play, FireWire (aka IEEE specification 1394.1995) is an ideal interface to connect... Application Note 2002-06-27
Loop Bandwidth and Clock Data Recovery in Oscilloscope Measurements (AN 1304-6) This application note describes loop bandwidth and clock data recovery in oscilloscope measurements. Application Note 2002-05-30	PDF 600 KB
The Quest For a New Generation Analyzer Compatibility testing and the integration into a tightly coupled system of several Compact PCI cards within one backplane. Application Note 2002-05-13
Speeding and Easing Validation Testing with PCI Verification Tools With the help of powerful PCI cards and analyzers, such as the E2925 and E2926 PCI Series of Computer Verification Tools Application Note 2002-05-13
PCI Performance Measurements: Concepts and Practical Application It identifies the key metrics for measuring overall PCI and device performance and illustrates how to perform these measurements. Application Note 2002-05-13
Meeting the Challenge of Computer System Validation This white paper shows the approach of using exerciser test cards to accomplish this objective. Application Note 2002-05-13
Understanding Signal Integrity This is a technical note that was featured in the AMS Newsletter, Volume 1, Issue 2. This technical note discusses the problems that engineers have with signal integrity and solutions to help address the problems. Application Note 2002-04-18	PDF 287 KB
VNA-Based System Tests Differential Components, AN 1382-7 Signal integrity is an issue of growing importance as digital networks increase in speed and bandwitdth. In recent years, digital signals are passing that barrier more and more (approx. 1 Gb/s) between being conventional... Application Note 2002-04-15	PDF 845 KB Sprachen English \| 2002-04-15 \| PDF 845 KB 日本語 \| 2002-05-27 \| PDF 710 KB
Finding Hidden Problems Using Aglent's Deep-Memory Oscilloscope: How IBM Solved a Mystery AN IBM CUSTOMER SUCCESS STORY As far as you can see everything is working properly - the right signals are getting to the right places at the right time, the firmware is doing what it is supposed to do and everything else is in order - and yet the system still doesn't function properly. Application Note 2002-04-03	PDF 1.34 MB Sprachen English \| 2002-04-03 \| PDF 1.34 MB 日本語 \| 2002-10-25 \| PDF 812 KB
Saving Time with Multiple-Channel Signal Integrity Measurements, (AN 1382-8) System complexity continues to grow exponentially. This results in more buses with more high-speed signals, which translates into more chances of signal integrity problems. Complex protocols, varying data payloads, and multiple operating modes create more opportunities for signal integrity to be... Application Note 2002-03-14	PDF 1.29 MB Sprachen English \| 2002-03-14 \| PDF 1.29 MB 日本語 \| 2002-04-04 \| PDF 1.54 MB
8 Hints for Debugging and Validating High-speed Buses 8 Hints for Debugging High-speed Buses Application Note 2002-03-05	PDF 2.24 MB
How to use the Agilent 81200 together with Agilent VEE This attached Product Note shows how to use the Agilent 81200 Data Generator/Analyzer together with Agilent VEE for Signal Integrity Analysis. Application Note 2002-01-28	PDF 383 KB
Measuring Differential Impedance with TDR to Improve High-Speed Bus Designs, (AN 1382-5) Improving High-Speed Bus Designs with TDR Application Note 2001-12-20	PDF 2.30 MB Sprachen English \| 2001-12-20 \| PDF 2.30 MB 日本語 \| 2002-04-02 \| PDF 1.58 MB
Designing and Validating High-Speed Memory Buses (AN 1382-2) DDR SDRAM (double data rate synchronous dynamic random access memory) is quickly becoming an accepted technology in the PC (personal computer) industry. Its low cost, high performance, and increasingly wide availability make it very desirable for PC memory buses and embedded designs such as high... Application Note 2001-12-20	PDF 1.51 MB Sprachen English \| 2001-12-20 \| PDF 1.51 MB 日本語 \| 2002-04-04 \| PDF 633 KB
Application Note 1382-4: I/O System and Chip Validation in PCI and PCI-X Systems (AN 1382-4) Validation of computer systems and subsystems is becoming increasingly complex as input/output (I/O) systems and peripherals become more intelligent. The role of data-transfer is being delegated to the I/O systems instead of the CPU, causing data traffic to move in several directions... Application Note 2001-12-20	PDF 920 KB Sprachen English \| 2001-12-20 \| PDF 920 KB 日本語 \| 2002-04-03 \| PDF 489 KB
Low Voltage Differential Signaling, (AN 1382-6) Using LVDS for High Speed Data Transmission Application Note 2001-12-17	PDF 2.53 MB Sprachen English \| 2001-12-17 \| PDF 2.53 MB 日本語 \| 2002-03-29 \| PDF 991 KB
Functional Test & Data Acquisition I/O Benchmarks The following benchmarks compare computer I/O performance in functional test and data acquisition applications. Application Note 2001-12-04
Characterization of Balanced Digital Components and Communication Paths Application Note 2001-11-19	PDF 1.01 MB
Spectral Analysis Using a Deep Memory Oscilloscope FFT (AN 1383-1)) Many of today's digital oscilloscopes include a Fast Fourier Transform (FFT) for frequency-domain analysis. This feature is especially valuable for oscilloscope users who have limited or no access to a spectrum analyzer yet occasionally need frequency-domain analysis capability. An integrated... Application Note 2001-11-15	PDF 1.54 MB Sprachen English \| 2001-11-15 \| PDF 1.54 MB 日本語 \| 2002-04-08 \| PDF 962 KB
Application Note4: Read and write register values of your device before a driver is available The Agilent PCI/PCI-X Exerciser, a combination of testcard and software, simplifies the task of reading values from (peek) and writing values into (poke) registers or memory before a driver is available. Aims of this Application Note To show how to access registers of a device before a... Application Note 2001-10-05	PDF 363 KB
Application Note2: Verify if a device can stand all kinds of protocol variations Validating servers and workstations that contain various I/O systems, various peripherals and high and low-speed devices, has become a sophisticated task. If you are a validation engineer, you have to ensure that server products can stand all possible protocol variations; that corner cases... Application Note 2001-10-04	PDF 556 KB
High-Speed Source Synchronous Interface Design presents considerations for high-speed interface design using examples from a DDRSDRAM implementation. Application Note 2001-08-02

Previous 1 2 3 4 5 6 7 Next

Digital Design & Interconnect Standards

What's New

Related Links

Refine the List

Nach Applikation

By Type of Content

Nach Produkt Kategorie

126-150 of 164

Produkte und Dienstleistungen

Technischer Support

Applikationen & Lösungen

Über Agilent