Digital Design & Interconnect Standards

Achieve your best design with Agilent. Investigate specific solutions for high speed standards plus solutions for your high-speed digital design cycle (design, simulation, analysis, debug compliance and signal integrity) challenges.

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  - Application Note (164)

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26-50 of 164

Advanced VNA-Based Test Systems for Analysis of High-Speed Digital Interconnect - Application Note Discusses interconnect testing and present solutions based on the latest generation of test software (PLTS2011) for Agilent's line of performance network analyzers (PNAs) focused on Software. Application Note 2012-01-19	PDF 2.22 MB Languages English \| 2012-01-19 \| PDF 2.22 MB 中文（简体） \| 2012-01-19 \| PDF 2.22 MB 한국어 \| 2012-01-19 \| PDF 2.22 MB
Effective Reflection Characterization for Active Devices Using ENA Option TDR Application Note This application note describes Hot TDR measurement, which is an effective characterization method for the reflection of transmitter and receiver. Application Note 2012-01-12	PDF 416 KB Languages English \| 2012-01-12 \| PDF 416 KB 日本語 \| 2012-02-27 \| PDF 1.45 MB
Agilent Method of Implementation (MOI) for MIPI D-PHY Conformance Tests Agilent Method of Implementation (MOI) for MIPI D-PHY Conformance Tests Using Agilent E5071C ENA Network Analyzer Option TDR Application Note 2011-12-01	PDF 920 KB
Agilent Method of Implementation (MOI) for MIPI M-PHY Conformance Tests Agilent Method of Implementation (MOI) for MIPI M-PHY Conformance Tests Using Agilent E5071C ENA Network Analyzer Option TDR Application Note 2011-12-01	PDF 918 KB
How to Pass Receiver Test According to PCI Express® 3.0 CEM Specification This paper provides insight into the calibration method and tests, as well as the tools available. The biggest change between PCIe 2.x and rev. 3.0 is that RX test on cards will now be normative. Application Note 2011-11-30	PDF 3.22 MB Languages English \| 2011-11-30 \| PDF 3.22 MB 日本語 \| 2012-07-20 \| PDF 4.98 MB
Simulating High-Speed Serial Channels with IBIS-AMI Models This paper reviews some of the benefits and limitations of using IBIS models and introduces the new AMI extensions to the latest IBIS version 5.0 specification. Application Note 2011-11-15	PDF 327 KB Languages English \| 2011-11-15 \| PDF 327 KB 中文（简体） \| 2011-11-15 \| PDF 327 KB 日本語 \| 2012-03-09 \| PDF 1.16 MB
PCI Express Transmitter Electrical Validation and Compliance Testing - Application Note This application note is intended for digital designers and developers validating electrical performance of PCI Express-based designs and working toward electrical compliance of PCI Express products. Application Note 2011-10-28	PDF 1.01 MB
Advanced Techniques for PCIe 3.0 Receiver Testing-Paper Advanced Techniques for PCIe 3.0 Receiver Testing-Paper Application Note 2011-09-01	PDF 2.20 MB
Probing High-Speed Signals with the 86100 Series of Wide-Bandwidth Sampling Oscilloscopes (86100-6) Product Note 86100-6 discusses three important measurement accessories that help make probe-based measurements both simple and accurate for the Agilent 86100 Wide-Bandwidth Oscilloscope. Application Note 2011-07-28	PDF 651 KB Languages English \| 2011-07-28 \| PDF 651 KB 日本語 \| 2007-04-10 \| PDF 578 KB
Measurement Uncertainty of VNA based TDR/TDT Measurement Application Note This application note explains the theory of measurement uncertainty in TDR/TDT measurement with the ENA Option TDR. Application Note 2011-07-08	PDF 1.77 MB
Accurate Calibration of Receiver Stress Test Signals for PCI Express® Rev. 3.0 This paper describes the calibration of the receiver-stress signal according to the base specification of PCIe3. The calibration of the RX test signal is different from PCIe 2.0. Application Note 2011-06-22	PDF 4.82 MB Languages English \| 2011-06-22 \| PDF 4.82 MB 日本語 \| 2011-07-27 \| PDF 3.05 MB
A Simple, Powerful Method to Characterize Differential Interconnects The Automatic Fixture Removal (AFR) process is a new technique to extract accurate, high bandwidth models of interconnects that is both simple and accurate. Application Note 2011-06-17	PDF 3.48 MB
Soft Touch Connectorless Logic Analyzer Probes Application Note 2011-03-14	PDF 193 KB Languages English \| 2011-03-14 \| PDF 193 KB 日本語 \| 2006-11-27 \| PDF 680 KB 한국어 \| 2006-11-01 \| PDF 193 KB
MOI for SATA PHY, TSG and OOB Tests - Application Note 2011-01-20	PDF 7.10 MB
Agilent MOI for SATA SI (Cable) Tests Using Agilent E5071C with Option TDR - Application Note 2011-01-12	PDF 1.41 MB
Agilent Method of Implementation (MOI) for SATA SI Compliance Test Agilent Method of Implementation (MOI) for SATA SI Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR Application Note 2011-01-12	PDF 1.41 MB
Agilent Method of Implementation (MOI) for SATA RXTX Compliance Test Agilent Method of Implementation (MOI) for SATA RXTX Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR Application Note 2011-01-12	PDF 1.19 MB
Agilent MOI for SATA TXRX Tests Using Agilent E5071C ENA with Option TDR - Application Note 2011-01-12	PDF 1.19 MB
An Overview of the Electrical Validation of 10BASE-T, 100BASE-TX, and 1000BASE-T The technology used in these ports, commonly known as “LAN” or “NIC” ports, is usually one of the 10BASE-T, 100BASE-TX, and 1000BASE-T standards or a combination of them. Application Note 2011-01-11	PDF 1.21 MB Languages English \| 2011-01-11 \| PDF 1.21 MB 日本語 \| 2008-10-02 \| PDF 5.96 MB
Understanding the Kramers-Kronig Relation Using A Pictorial Proof The Kramers-Kronig relation lets us build a causal time-domain model from bandlimited s-parameters. This pictorial proof aids understanding of the physics of causality and hence the validity of this approach. Application Note 2010-03-31	PDF 238 KB Languages English \| 2010-03-31 \| PDF 238 KB 中文（简体） \| 2010-03-31 \| PDF 238 KB
Agilent HDMI 1.4 Whole Solution Media Recommended in CTS 1.4 Application Note 2009-11-20	PDF 1.89 MB
USB Design and Test - A Better Way Brochure covering Agilent's USB 2.0 and 3.0 test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these. Application Note 2009-11-03	PDF 821 KB Languages English \| 2009-11-03 \| PDF 821 KB 日本語 \| 2010-02-26 \| PDF 4.56 MB
Using ADS for Signal Integrity Optimization This white paper shows how to replace a multi-dimensional sweep of a long running PRBS time-domain simulation (including manual data evaluation) by short, channel-pulse characterization in the Advanced Design System to efficiently optimize a channel. Application Note 2009-10-19	PDF 275 KB Languages English \| 2009-10-19 \| PDF 275 KB 中文（简体） \| 2009-10-19 \| PDF 275 KB
Agilent MOI for SATA TXRX Tests Using Agilent 86100C TDR Application Note 2009-09-10	PDF 479 KB
Preselector Tuning for Amplitude Accuracy in Microwave Spectrum Analysis This 8 page application note introduces the technique for broadband modulated signals employed in the new MXA signal analyzer. Application Note 2009-08-14	PDF 387 KB Languages English \| 2009-08-14 \| PDF 387 KB 日本語 \| 2006-11-24 \| PDF 645 KB

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