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Calibration of a Ratio Transformer - White Paper 
Describes a calibration technique for decade ratio transformers which is performed by comparison measurement at 1kHz.

Application Note 2011-11-16

PDF PDF 2.30 MB
Optimizing Dynamic Range for Distortion Measurements 
This Product Note covers high dynamic range measurement techniques for the new PSA Performance Spectrum Analyzer Series. The Note describes the best way to use the PSA series to make distortion measurements such as ACP, intermodulation, and harmonic distortion.

Application Note 2011-10-27

PDF PDF
Business Considerations of Equipment Refresh in a Calibration Laboratory by Richard Ogg 
Calibration laboratories operate in a world of constant change, and this is never more evident than in the products that are requested to be calibrated.

Application Note 2011-10-05

PDF PDF 316 KB
Languages 
Isolating Frequency Measurement Error and Sourcing Frequency by Robert Leiby 
When performing a calibration, the risk of incorrectly declaring a device as in-tolerance (false-accept risk) is dependent upon several factors such as the specified tolerance limit and guard band.

Application Note 2011-10-05

PDF PDF 3.42 MB
Calibration Process Innovation Using Non-Required Guard Banded Testing by Richard Ogg 
Calibration services vary as to how to set the acceptance limits compared to the required tolerance. Using a guard band to reduce the acceptance limit will increase the confidence in the calibration.

Application Note 2011-09-30

PDF PDF 582 KB
Uncertainty Analysis for Uncorrelated Input Quantities by Alberto Campillo 
Reference information for those who develop their own measurement uncertainties

Application Note 2011-08-01

PDF PDF 163 KB
Fundamentals of RF and Microwave Power Measurements (Part 3) (AN 1449-3) 
Power Measurement Uncertainty per International Guides AN 1449-3, literature number 5988-9215EN

Application Note 2011-04-05

PDF PDF 525 KB
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Specifying Calibration Standards and Kits for Agilent Vector Network Analyzers (AN 1287-11) 
This paper discusses calibration standard definitions, calibration kit content, and its structure requirements for Agilent's vector network analyzers. Also provided are set up examples and how to modify an existing calibration kit definition file.

Application Note 2011-03-28

PDF PDF 3.79 MB
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Setting and Using Specifications – An Overview, by Michael Dobbert 
This white paper presents techniques to set specifications and describes how metrologists use specifications in calibration.

Application Note 2010-09-01

PDF PDF 1.57 MB
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Fundamentals of RF and Microwave Noise Figure (AN 57-1) 
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.

Application Note 2010-08-05

PDF PDF 864 KB
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Improved Throughput in Network Analyzer Applications (AN 1287-5) 
This Application Note explores a variety of throughput issues and how they might affect different applications. It suggests ways to improve network analyzer performance for better throughput in specific situations, and how to get an accurate picture of how an analyzer's performance might impact...

Application Note 2010-03-15

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Pragmatic Method for Pass/Fail Conformance Reporting that Complies by Michael Dobbert & Robert Stern 
Innovative approach to simultaneously meet (ISO 17025, ILAC-G8, Z540.3)

Application Note 2010-03-01

PDF PDF 350 KB
PNA - Banded Millimeter-Wave Measurements (AN 1408-15) 
Contains banded millimeter-wave system configurations, system operation, system calibration, and typical measurement examples.

Application Note 2009-11-24

PDF PDF 1.95 MB
Languages 
8 Hints for Making Better Spectrum Analyzer Measurements (AN 1286-1) 
This application note provides eight pertinent hints for making better spectrum analyzer measurements such as measuring low level signals and indentifying internal distortion products.

Application Note 2009-09-07

PDF PDF 739 KB
Languages 
Fundamentals of RF and Microwave Power Measurements (AN 1449) 
Agilent's Fundamentals of RF and Microwave Power Measurements, application note (AN 1449-1/2/3/4).

Application Note 2009-06-05

 
Test and Measurement Instrument Security 
This document describes security features and the steps to perform a security erase for select Agilent test and measurement instruments.

Application Note 2009-04-14

PDF PDF 167 KB
Enhanced Log Records for the Agilent Medalist In-Circuit Test System 
Track changes made to your i3070 test programs to improve success.

Application Note 2009-03-04

PDF PDF 801 KB
Diagnostic Testing and the Medalist 5DX Automated X-ray Inspection System 
Users of the Medalist 5DX automated x-ray inspection system can benefit from running diagnostic tests on a regular basis. This application note provides some guidelines.

Application Note 2009-01-14

PDF PDF 188 KB
Medalist i3070 Test Throughput Optimization 
This application note explores some factors which cause test time to increase on the Medalist i3070 In-Circuit Test system, and methods which users can employ to reduce the test time and increase throughput on the Medalist i3070 ICT system.

Application Note 2008-11-24

PDF PDF 163 KB
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IEEE 1149.6 Standard Boundary Scan Testing on Agilent Medalist i3070 ICT Systems 
This paper introduces the latest advancements in Boundary Scan test capabilities on the Agilent Medalist i3070 In-Circuit Test platform that supports the testing of IEEE 1149.6-compliant devices.

Application Note 2008-11-24

PDF PDF 297 KB
Boosting PLL Design Efficiency From free-running VCO characterizations to closed-loop PLL evaluation 
This application note describes introduces practical solutions for VCO/PLL performance evaluation and gives actual examples of parameter measurements using the E5052B.

Application Note 2008-11-21

PDF PDF 2.91 MB
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Achieving Fast Design Cycle Time 
This application note describes how fast cycle time is achieved using the impedance analyzer such as the E4991A and 4294A with the Electronic Design Automation (EDA) tools.

Application Note 2008-11-13

PDF PDF 461 KB
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Exposed Pad Algorithm for the Medalist x6000 AXI System 
This application note describes how to use the exposed pad algorithm in the Medalist x6000 AXI software to test all varieties of QFN and FET package types for defects such as Open and Voiding.

Application Note 2008-10-21

PDF PDF 1.83 MB
Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not 
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Application Note 2008-10-15

PDF PDF 281 KB
Languages 
Measurement Wizard Assistant software for ENA 
This application note explains how using MWA software on the ENA simplifies measurements and reduces the setup time of complicated measurements. It provides you with a step-by-step guide to the MWA and useful measurement tips for using the ENA and E5092A configurable multiport test set.

Application Note 2008-09-30

PDF PDF 2.23 MB
Languages 

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