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Basics & Measurement Fundamentals

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Maximising Test Coverage with Agilent Medalist VTEP v2.0 
This paper describes how to get the most from Agilent Technologies’ industry-leading vectorless test innovation, the Medalist VTEP v2.0 which is a suite of solution comprising VTEP, iVTEP and NPM.

Application Note 2007-04-17

PDF PDF 227 KB
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Using the VISA COM I/O API in .NET - Application Note 
The Microsoft .NET architecture has many features that make it an excellent environment for Test & Measurement programmers. VISA COM I/O is an update of the older VISA C API to work in and with COM technology.

Application Note 2007-03-16

PDF PDF 345 KB
Applying a New In-Circuit Probing Technique for High-Speed/High Density Printed Circuit Boards 
Bead probes were used to obtain additional test access on a high-density production printed circuit board. This case study includes practical information and key bead-specific learnings discovered during the process of outsourcing.

Application Note 2006-10-24

PDF PDF 723 KB
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Bluetooth® RF Measurement Fundamentals (AN 1333-1) 
Bluetooth® is an open specification for a wireless personal area network. It provides limited range RF connectivity for voice and data transmissions between information appliances.

Application Note 2006-10-12

PDF PDF 1.95 MB
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PNA - Amplifier Swept-Harmonic Measurements (1408-8) 
This application note cover testing an amplifiers harmonics, using (MW) PNA Series of vector network analyzers. Linear parameters, such as gain and return loss are covered in Application Note 1408-7.

Application Note 2006-08-14

PDF PDF 1.23 MB
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ENA/PNA - Mixers - Calibration Accuracy using FCA (1408-3) 
Improving Measurement and Calibration Accuracy Using the Frequency Converter Application - AN 1408-3

Application Note 2006-08-08

PDF PDF 1000 KB
Languages 
PNA - Amplifier Linear and Gain Compression Measurements (1408-7) 
Application note covering testing of an amplifier's linear S-parameters and gain compression using Agilent's microwave PNA Series of vector network analyzers.

Application Note 2006-08-08

PDF PDF 817 KB
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Considerations for Surface Map Setup 
The concept of delta-Zs is perhaps the most difficult thing to understand about the surface map process.

Application Note 2006-08-08

 
PNA - Amplifier-CW and Swept IMD Measurements (1408-9) 
This application note covers testing an amplifier's intermodulation-distortion products, using (MW) PNA Series of vector network analyzers.

Application Note 2006-08-08

PDF PDF 2.78 MB
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Spectrum Analyzer Basics (AN 150) 
Fundamentals of spectrum analyzer measurements

Application Note 2006-08-02

PDF PDF 3.71 MB
Languages 
8510 Calibration Standard Definitions (AN 8510-5B) 
This Product Note covers methods for specifying calibration standards and describes the procedures for their use with the Agilent 8510 Network Analyzer.

Application Note 2006-07-13

PDF PDF 1.12 MB
8510 Calibration - Measuring Noninsertable Devices (PN 8510-13) 
The majority of devices used in real-world microwave systems are noninsertable because of the connectors employed.

Application Note 2006-07-13

PDF PDF 261 KB
Fundamentals of RF and Microwave Power Measurements (Part 2) (AN 1449-2) 
Power Sensors and Instrumentation AN 1449-2, literature number 5988-9214EN

Application Note 2006-07-05

PDF PDF 1010 KB
SEMI S2 Standard Modifications for Agilent 3070 and Related Equipment 
This document describes three items pertaining to the Agilent 3070 and the SEMI S2 standard. Each of them is related to a variance with the SEMI standard.

Application Note 2006-06-15

PDF PDF 52 KB
How to Use VXI and PXI in Your New LXI Test System (AN 1465-23) 

Application Note 2006-06-06

PDF PDF 275 KB
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Next-generation Test Systems: Advancing the Vision with LXI (AN 1465-16) 

Application Note 2006-05-01

PDF PDF 263 KB
AOI - A Strategy for Closing the Loop 
This paper describes a set of defect prevention solutions centered on the availability of high-quality inspection and measurements data from an AOI system and a few carefully engineered software applications

Application Note 2006-04-16

PDF PDF 291 KB
Comparison of Different Jitter Analysis Techniques With a Precision Transmitter 
This white paper describes how various jitter analysis techniques give dissimilar results. Which is right? We built a precision jitter transmitter to compare results of different techniques where test sets were exposed to known levels of jitter.

Application Note 2006-04-06

PDF PDF 164 KB
8753ET/ES and 8719D/ET/ES, 8720D/ET/ES, and 8722D/ET/ES Network Analyzers Security Features 
Provides information concerning the structure, use, and clearing of user accessible memory inside the 8753ET/ES and 8719D/ET/ES, 8720D/ET/ES, and 8722D/ET/ES Network Analyzers.

Application Note 2006-02-15

PDF PDF 22 KB
“Shotgunning”, a Bad Fit for Lead-Free Test 
Shotgunning, a common repair technique in functional test, will be negatively affected by lead-free processes. This article explores the technique and draws broad conclusions regarding the impact of lead-free on electronics manufacturing test

Application Note 2006-02-07

PDF PDF 44 KB
Network Analysis - In-Fixture Measurements (1287-9) 

Application Note 2006-01-10

PDF PDF 920 KB
Languages 
PNA - Amplifier - High-Power Testing (1408-10) 

Application Note 2005-09-28

PDF PDF 888 KB
Languages 
How to Get the Most from Agilent's Intelligent Yield Enhancement Test (IYET) 
This paper describes how to get the most from IYET for Agilent board test systems.

Application Note 2005-07-15

 
PNA - Analyze Lightwave Components (1408-14) 

Application Note 2005-06-30

PDF PDF 471 KB
AXI and Lead-Free Process Characterization 
How to use Automated X-ray Inspection as a tool to characterize new lead-free soldering processes.

Application Note 2005-06-21

 

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