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Design and Simulation of High-Speed Digital

Agilent tools provide views into the time and frequency domains, revealing the underlying problems and ensuring compliant designs. With Agilent, you'll achieve your best design.

Invest in your future and update your technical knowledge with our Tutorials in Signal Integrity Webcast series.

High Speed Digital Design Challenges

  • Analyzing complete chip-to-chip links by co-simulating individual components, each at its most appropriate level of abstraction: channel-, circuit- or physical-level
  • Importing backplane S-parameter models accurately into circuit and channel simulations, avoiding causality and passivity issues
  • Correlating measured and simulated data before using simulation to interpolate between measurement planes and extrapolating to virtual prototypes

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Successful High-Speed Digital Design for PC board using ADS 
A hands-on workshop on how to solve increasingly difficult signal integrity and power integrity challenges using Advanced Design System.

Seminar Materials 2014-02-27

 
High-Speed Digital Design & Verification Seminar 
A methodology for predictable design closure in the high speed digital era.

Seminar Materials 2013-11-22

PDF PDF 5.45 MB
How to Characterize and Debug High-Speed Digital Links on Your Physical Prototype 
What part of your design is eating up your Eye margins?

Seminar Materials 2013-11-22

PDF PDF 3.70 MB
How to Anticipate Signal Integrity Issues 
Improve channel simulation by using an electromagnetic based model

Seminar Materials 2013-11-22

PDF PDF 9.21 MB
Solving New High-Speed Design Challenges with ADS 2013.06 
In this seminar, leading Agilent EEsof R&D Designers provide a first-hand look at the new HSD features for the world class ADS transient and channel convolution simulators.

Seminar Materials 2013-07-10

 
Introduction to EMI/EMC Challenges and Their Solution 
Agilent EEsof EDA presentation on how to, "Overcome High Speed Digital Design Challenges".

Seminar Materials 2012-02-16

PDF PDF 3.46 MB
Overcome PI Challenges on Perforated Power/Groung Planes 
This presentation explains a different approach that's applicable to PI analysis on cost reduced consumer boards whose power/ground planes are perforated with signal traces.

Seminar Materials 2012-01-19

PDF PDF 2.30 MB
Overcome Signal Integrity Challenges in the multigigabit(s) Era 
When digital signals reach gigabit/s speeds, the unpredictable becomes the norm. The process of getting your project back on track starts with the best tools for the job.

Seminar Materials 2011-12-15

PDF PDF 781 KB
Design and Test Challenges in Next Generation High-Speed Serial Standards 
Attend this FREE education workshop at DesignCon 2012, brought to you by Agilent Technologies, Official Host Sponsor of the conference.

Training Materials 2011-11-29

 
Overcoming Return-Path-Discontinuity in DDR3 and GDDR5 Memory-Controller Packages 
A day in the life of a Memory Architect.

Seminar Materials 2011-10-24

PDF PDF 1.86 MB
Successful High Speed Digital Design with ADS, EMPro, and SystemVue 
The materials in this self-guided workshop will show you the latest high speed digital capabilites in ADS 2011.

Seminar Materials 2011-09-29

 
Signal Integrity Design Using Channel Simulation and EM Co-design 
The materials in this self-guided workshop will show you the “what if” design space exploration workflow that our new statistical eye diagram channel simulator enables

Seminar Materials 2010-04-21

 
ADMF: Facing the challenges of Super speed USB 3.0 Product Development  
Agilent Digital Measurement Forum (ADMF): Facing the challenges of Super speed USB Product Development

Seminar Materials 2008-11-12

PDF PDF 1.78 MB
Innovations in EDA: Multi-Technology RF Design Using the New Advances in ADS 2011 
Originally broadcast March 1, 2011

Webcast - recorded

 
Overcome High Speed Digital Design Challenges Webcast Series 
Series of live and on-demand webcasts

Webcast - recorded

 
Digital and Photonics Webcast Series 
Originally broadcast 2010, 2011. Access the recordings of many broadcasts

Webcast - recorded

 
High-Sensitivity Current Measurements using an Oscilloscope Webcast 
Original broadcast April 17, 2013

Webcast - recorded

 
Understanding Cross Modulation Effects in a Full Duplex LTE Transceiver 
Originally broadcast July 22, 2010

Webcast - recorded

 
IMS 2013 (IEEE MTT-S) – Connect, Expert to Expert, at Agilent Avenue 
ORDER the CD of the MicroApps presented at the show!

Tradeshow

 
Fixture De-embedding Techniques for 28 Gb/s Transmitter Measurements Webcast 
Live broadcast January 23, 2014; 10am PT/1pm ET/19:00 CET

Webcast - recorded

 
Ethernet Compliance Testing: Become More Green and Energy Efficient Webcast 
Original broadcast March 20, 2013

Webcast - recorded

 
Test & Measurement events in Europe, Middle East & Africa 
Test & Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.

Seminar

 
Signal Integrity: Include Post-layout PCB Artwork into your Eye Diagram and BER Contour Simulation 
Originally broadcast May 5, 2010. Part of the Series: Signal Integrity for High Speed Digital Interconnects.

Webcast - recorded

 
What on Earth is Jitter Amplification, and Why Should I Care Webcast 
Original broadcast April 9, 2013

Webcast - recorded

 
Tutorials in Signal Integrity Webcast Library  
Upcoming, live webcasts and past, on-demand webcasts.

Webcast

 

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