X-parameters
Agilent’s X-parameters* functionality represents a new category of nonlinear network parameters for high-frequency design. X-parameters:
- Are applicable to both large-signal and small-signal conditions, and for linear and nonlinear components.
- Characterize the amplitudes and relative phase of harmonics generated by components under large input power levels at all ports.
- Correctly characterize impedance mismatches and frequency mixing behavior to allow accurate simulation of cascaded nonlinear X-parameter blocks, such as amplifiers and mixers in wireless design.
- Functionality was included in the Nonlinear Vector Network Analyzer (NVNA), and the Advanced Design System in 2008.
- X-parameter model support was added to the SystemVue environment in 2010. SystemVue connects X-parameter models into RF system-level analysis, as well as full physical layer baseband/DSP simulations
- X-parameter model support was added to the Genesys RF and Microwave simulation environment for circuit and system design in 2010.
Agilent's X-parameters functionality can help you overcome a key challenge in RF engineering, namely that of nonlinear impedance differences, harmonic mixing, and nonlinear reflection effects that occur when components are cascaded under large signal operating conditions. X-parameters help solve this complex cascading problem: if you measure the X-parameters of a set of components individually, you can calculate the X-parameters and hence the nonlinear transfer function of any cascade made from them. Calculations based on X-parameters are usually performed within a harmonic balance simulator environment.
See Measurement Solution Example: X-Parameter Measurements
* "X-parameters" is a trademark of Agilent Technologies, Inc. The X-parameters format and underlying equations are open and documented. For more information, refer to X-parameters Open Documentation, Trademark Usage & Partnerships.
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Agilent EEsof EDA at European Microwave Week 2011
Europe's Premier Microwave, RF, Wireless and Radar Event. The week provides an opportunity for both academia and industry to consider the latest trends and developments that are widening the field of application of microwaves.
Seminar Materials 2011-10-28 |
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Webcast Slides: X-Parameter Case Study: GaN High Power Amplifier (HPA) Design
This Webcast illustrates a high power (>45 dBm) amplifier design based on X-parameter measurements of a GaN transistor.
Seminar Materials 2011-01-11 |
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Agilent EEsof EDA Customer Education and Services
Brief overview of Agilent EEsof EDA Customer Education and Services.
Training Materials 2010-08-11 |
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Redefine How You Measure & Simulate Nonlinear Devices Using X-Parameters
Seminar Materials 2010-05-26 |
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Accurate Mixer Measurements Using Multi-tone X-parameter Models
IMS 2010 MicroApps presentation by Mihai Marcu and Radoslaw M. Biernacki
Seminar Materials 2010-05-26 |
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X-Parameters
Seminar Materials 2008-12-15 |
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A Practical Approach to Verifying RFICs with Fast Mismatch Analysis
Originally broadcast October 28, 2010
Webcast - recorded |
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RF Power Amplifier Design Series: Part 4 - RF Module Design using Amalfi CMOS PA
Original broadcast November 15, 2012
Webcast - recorded |
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RF Power Amplifier Design Series - Part 2: End-to-End Design and Simulation of Handset PA Modules
Original broadcast Mar 1, 2012
Webcast - recorded |
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Innovations in EDA: High Performance Digital Pre-Distortion (DPD) for Wideband Systems
Original broadcast Sept 1, 2011
Webcast - recorded |
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Innovations in EDA: Freescale’s Power Amplifier Design Methodology Innovations Webcast
Original broadcast January 10, 2013
Webcast - recorded |
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Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast
Original broadcast May 7, 2013
Webcast - recorded |
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Using Simulated and Measured Load Pull for Optimal Performance in RF Power Amplifier Design
Originally broadcast Nov 3, 2011
Webcast - recorded |
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Innovations in EDA: Accelerating Radar/EW System Design using Wideband Virtual Scenarios Webcast
Original broadcast April 4, 2013
Webcast - recorded |
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Hybrid-Active Load Pull with PNA-X and Maury Microwave
Original broadcast Jun 12, 2012
Webcast - recorded |
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Antenna Design Automation with Scripting and Parameterized EM Analysis Webcast
Original broadcast February 7, 2013
Webcast - recorded |
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RF Power Amplifier Design Series: Part 5: Envelope Tracking Simulation and Analysis
Original broadcast December 13, 2012
Webcast - recorded |
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Innovations in EDA: How to Make Your Designs More Robust
Original broadcast July 28, 2011
Webcast - recorded |
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IMS 2013 (IEEE MTT-S) – Connect, Expert to Expert, at Agilent Avenue
June 2 - 7, 2013 in Seattle, WA
Tradeshow |
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Innovations in EDA: Applying the Latest Technologies to MMIC Design
Originally broadcast Nov 11, 2010
Webcast - recorded |
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Eventi di Agilent Italia
Benvenuti nella pagina degli eventi di Agilent Italia
Seminar |
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GaN on SiC: RFMD High Power Doherty Design, Modeling & Measurement Webcast
Original broadcast March 7, 2013
Webcast - recorded |
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Innovations in EDA: IC, Laminate, Package Multi-Technology PA Module Design Methodology
Original broadcast August 2, 2012
Webcast - recorded |
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Test & Measurement events in Europe, Middle East & Africa
Test & Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.
Seminar |
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Fast Characterization of Power Amplifier Performance with Modulated Signals
Original broadcast Apr 5, 2012
Webcast - recorded |

