器件建模
安捷伦为直流和射频半导体器件表征及建模提供硬件和软件解决方案。当前大多数领先的半导体制造商和集成器件制造商（IDMs）都采用安捷伦工具来获得器件建模方案，以便用于芯片 CMOS、Bipolar、混合砷化镓（GaAs）、氮化镓（GaN）和许多其它器件技术。
器件建模挑战
- 随着器件几何尺寸越来越小，使用精确模型并控制器件处理性能中的统计变量这种需求显得越来越重要。
- 电路设计人员需要在直流以及射频和微波频率范围内可以精确预测器件行为的模型。
- 不同的处理技术需要大量的可以迅速适应独特程序的模型。
- 建模测量通常耗时数个小时甚至数天，测量控制软件也必须与探测器和仪器协同工作，以便在不同温度条件下执行自动测量。
1-25 / 31
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Measurement Based FET Modeling using Artifical Neural Networks (ANN)
This presentation was given by Jianjun Xu with introduction by David Root as part of the Innovations in EDA Webcast Series.
研讨会演示 2012-02-07 |
PDF
2.51 MB
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Agilent EEsof EDA 客户教育与服务
Brief overview of Agilent EEsof EDA Customer Education and Services.
培训资料 2012-02-02 |
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Setting up IC-CAP WaferPro for On-Wafer Measurements
IC-CAP WaferProIs is an extremely powerful test plan suite, for on-Wafer DC/CV and RF device modeling measurements.
研讨会演示 2011-06-22 |
PDF
3.07 MB
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Agilent EEsof EDA Customer Education and Services
Brief overview of Agilent EEsof EDA Customer Education and Services.
培训资料 2010-08-11 |
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Presentation on DC & AC Characterization of Semiconductors
This Presentation focuses on basics of device measurement and modeling techniques from DC to RF, special aspects of network analyzer calibration, de-embedding and required dummy structures.
研讨会演示 2003-01-28 |
PDF
893 KB
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无源模型程序库发生器（PMLG）的演示
This Presentation by Dr. Thomas Gneiting (Advanced Modeling Solution) was presented at Agilent EEsof EDA Seminar, April 04, 2001 details the structure of BSIM3v3, BSIMSOI and BSIM4 RF models.
研讨会演示 2001-04-04 |
PDF
1.49 MB
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Presentation on BSIM4, BSIM3v3 and BSIMSOI RF MOS Modeling
This Presentation by Dr. Thomas Gneiting (Advanced Modeling Solution) was presented at Agilent EEsof EDA Seminar, April 04, 2001 details the structure of BSIM3v3, BSIMSOI and BSIM4 RF models.
研讨会演示 2001-04-04 |
PDF
1.49 MB
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New impedance measurement solutions & apps using 5 Hz to 3 GHz VNA
Originally broadcast April 19, 2011
网上直播 -- 已存档的 |
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Breakthrough in High Speed Interconnect Analysis and Compliance Testing
Originally broadcast April 27, 2011
网上直播 -- 已存档的 |
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Genesys 网络研讨会－－“如何设计”系列
Originally broadcast in 2009. Access the 6 WebEX recordings
网上直播 -- 已存档的 |
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高速数字器件的先进产品设计和测试，网上研讨会
Original broadcast Jan 18, 2012
网上直播 -- 已存档的 |
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IMS 2011 (IEEE MTT-S) – Connect, Expert to Expert, at Agilent Avenue
2011 show, last June, 2011; Baltimore Convention Center
展览会 |
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IC-CAP User Training
This 3-day course will show device modelers how to use Agilent EEsof EDA's IC-CAP software. Click on link to view full course description and class dates and locations.
课堂培训 |
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Optimizing PXI Modular Functional Test System Throughput Webcast
Originally broadcast April 27, 2011
网上直播 -- 已存档的 |
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Advanced Product Design & Test for High-Speed Digital Devices Webcast
Original broadcast Jan 18, 2012
网上直播 -- 已存档的 |
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Agilent EEsof EDA 客户教育与服务
Agilent EEsof MMIC Design Symposium
研讨会 |
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Hybrid-Active Load Pull with PNA-X and Maury Microwave
Original broadcast Jun 12, 2012
网上直播 -- 已存档的 |
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PCI Express(R) 3.0 Strategies for Transmitter and Receiver Validation
Originally broadcast Feb 10, 2011
网上直播 -- 已存档的 |
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IMS 2012 年研讨会（IEEE MTT-S） - 在 Agilent Avenue 架起业界专家与领先公司之间的桥梁
June 17-22, 2012 in Montréal, Canada
展览会 |
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Nonlinear Characterization and Modeling Through Pulsed IV/S-Parameters
Original broadcast Mar 27, 2012
网上直播 -- 已存档的 |
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EMC 2013 - IEEE International Symposium on Electromagnetic Compatibility
August 5- 9, 2013; Denver, CO
展览会 |
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Genesys Webcasts - "How-To-Design" series
Originally broadcast in 2009. Access the 6 WebEX recordings
网上直播 -- 已存档的 |
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Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast
Original broadcast May 7, 2013
网上直播 -- 已存档的 |
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Setting Up IC-CAP WaferPro For On-Wafer Measurements
originally broadcast June 22, 2011
网上直播 -- 已存档的 |
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设置 IC-CAP WaferPro，以便进行晶圆上测量
originally broadcast June 22, 2011
网上直播 -- 已存档的 |
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