Fundamentals of Electronic Test & Measurement
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51-75 of 168
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How to Get the Most from Agilent's Intelligent Yield Enhancement Test (IYET)
This paper describes how to get the most from IYET for Agilent board test systems.
Application Note 2005-07-15 |
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PNA - Analyze Lightwave Components (1408-14)
Application Note 2005-06-30 |
PDF
471 KB
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AXI and Lead-Free Process Characterization
How to use Automated X-ray Inspection as a tool to characterize new lead-free soldering processes.
Application Note 2005-06-21 |
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Validating Transceiver FPGAs Using Advanced Calibration Techniques
Application Note 2005-04-27 |
PDF
1.37 MB
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Using LAN in Test Systems: Applications (1465-14) - Application Note and Example Programs
Topics include balancing cost,
convenience and security in three
common LAN scenarios: sharing
instruments, remote monitoring and
data acquisition, and functional test
systems. Includes downloadable example programs.
Application Note 2005-04-01 |
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Using LAN in Test Systems: Setting up System I/O (AN 1465-15) - Application Note
This set of application notes shows
you how to simplify test system
integration by utilizing open connectivity standards such as local area networking (LAN). The collective goal of these notes is to help you produce reliable results, meet your throughput requirements and stay within your budget.
Application Note 2005-03-29 |
PDF
263 KB
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Test and Inspection as Part of the Lead-free Manufacturing Process
The paper addresses issues that will impact defect levels and defect spectrum during the transition to lead-free manufacturing. It also addresses different test and inspection systems’ readiness to test lead-free printed circuit board assemblies.
Application Note 2005-02-22 |
PDF
421 KB
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Introduction to Test-System Design (AN 1465-1)
Application Note 2005-01-20 |
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Understanding the Effects of Racking & System Interconnections (AN 1465-6)
Application Note 2004-12-21 |
PDF
235 KB
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Choosing Your Test-System Hardware Architecture & Instrumentation (AN 1465-5)
Application Note 2004-12-21 |
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Test-System Development Guide: Operational Maintenance (AN 1465-8)
Application Note 2004-12-21 |
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Choosing Your Test System Software Architecture (AN 1465-4)
Application Note 2004-12-21 |
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Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note
This application note answers common questions
about the use of drivers and direct I/O to send commands from a PC application to the test instrument.
Application Note 2004-12-21 |
PDF
374 KB
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Maximizing System Throughput and Optimizing System Deployment (AN 1465-7)
Application Note 2004-12-21 |
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Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note
Using SCPI and Direct I/O vs. Drivers,
the fifth note in the series, outlines
the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems
Application Note 2004-12-13 |
PDF
408 KB
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Test-System Computer I/O Considerations (AN 1465-2) - Application Note
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing
Application Note 2004-12-09 |
PDF
189 KB
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Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note
Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today
for connecting modern instrumentation to computers are GPIB, LAN, and USB.
Application Note 2004-11-19 |
PDF
194 KB
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System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note
Using LAN in Test Systems: PC
Configuration,the third note in
the series, describes the additional
capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.
Application Note 2004-10-19 |
PDF
204 KB
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Network Analyzer Basics
This 94-page note covers the principles of measuring high-frequency electrical networks with network analyzers, including the types of measuremetns and how they allow you to characterize both linear and nonlinear behavior of your devices.
Application Note 2004-09-15 |
PDF
5.82 MB
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Using LAN in Test Systems - Network Configuration (AN 1465-10) - Application Note
The decision to use LAN in a test system delivers important benefits to your company and your team.
From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking
Application Note 2004-09-14 |
PDF
182 KB
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PNA Automation - Software Application Development (1408-13)
Application Note 2004-09-13 |
PDF
961 KB
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The Importance of Test and Inspection When Implementing Lead-Free Manufacturing
Many papers, articles, and studies have been written about process issues, reliability issues, repair issues, and the merits of different alloys. This paper addresses the impacts on test and inspection when going lead-free.
Application Note 2004-08-20 |
PDF
260 KB
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Using Lead-Free PCB Finishes at Manufacturing In-circuit Test Stage
The purpose of this document is to share experiences and educate engineers regarding different PCB surface finishes and the specific changes required in the PCB build process to allow for ICT.
Application Note 2004-08-08 |
PDF
102 KB
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How to use the Agilent N6700 Modular Power System to replace an Agilent 662xA (AN 1467)
This is a high-level overview to help current 662xA owners easily convert to an Agilent N6700.
Application Note 2004-08-02 |
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Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note
The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test.
Application Note 2004-07-29 |
PDF
270 KB
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