基础
去除所有优化201-225 / 271
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Dealing with Board Thickness Variations
The Agilent 5DX has the capability to be implemented such that it can accommodate thickness variations on a board-by-board basis. NOTE: Content described is in the 5DX Reference Guide but is no longer in Chapter 7 as mentioned herein.
应用说明 2001-05-16 |
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31 KB
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Fundamentals of RF and Microwave Power Measurements (AN 64-1C)
This Application Note is for information only. Agilent no longer sells or supports these products.
应用说明 2001-04-16 |
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2.21 MB
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更好使用RF计数器测量的 8 项提示
更好使用RF计数器测量的 8 项提示
应用说明 2001-04-10 |
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LCR/Impedance Measurement Basics
presents impedance, component value definitions, typical measurement problemsand their solutions, and error correction and compensation techniques.
应用说明 2001-03-28 |
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Improved Fault Coverage in a Combined X-ray and In-Circuit Test Environment
Cutting functional test failures in half and doubling the faults detected at process test! These are some of the case study results observed in combined X-ray and in-circuit test environments.
应用说明 2001-02-27 |
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575 KB
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Electrical In-circuit Test Methods for Limited-access Boards
This paper surveys the various electrical test methods and tools available to address testing boards that lack full electrical access.
应用说明 2001-02-27 |
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47 KB
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Use of Wrong Thickness Technique Gives Bad Test Results
Beginning with release 6.0, there are two techniques for measurement of solder thickness on the Agilent 5DX, each based on use of a different Confirmation & Adjustment panel.
应用说明 2000-12-31 |
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网络分析的基础知识 - 网络分析仪的体系结构（AN 1287-2）
本应用指南介绍了网络分析仪已经成为高频元器件和设备进行性能表征的重要工具之一。
应用说明 2000-12-06 |
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The Why, Where, What, How, and When of X-ray Test
How do the different AXI technologies work? What are the appropriate uses of 2D vs 3D X-ray? Where in the mfg process should AXI be placed? How can AXI be used to improve the mfg process?
应用说明 2000-11-01 |
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1.30 MB
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Hybrid32 Migration
This document is provided to help users of HybridPlus Pin Cards more easily incorporate the
Hybrid32 technology into their existing systems.
应用说明 2000-11-01 |
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61 KB
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Learned Data for the 5DX
The Agilent 5DX uses learned data in several ways to improve algorithm performance. There are basically 2 different forms of learned data.
应用说明 2000-11-01 |
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Maximizing Accuracy in Noise Figure Measurements (PN 85719A-1)
This Product Note discusses factors that affect accuracy with the 85719A Noise Figure Measurement System. Statistically generated curves of noise figure measurements uncertainly are also included.
应用说明 2000-10-01 |
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661 KB
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Techniques for Programming the 892X Family of Instruments (PN 892X)
This Product Note describes some key programming techniques for the Agilent 892X family of products. This Note can be used as a training tool for users that are new to programming test equipment, or it can be used by experienced programmers that need to know about unique programming required for...
应用说明 2000-09-01 |
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186 KB
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光谱分析基础（AN 1550-4）
本应用指南旨在帮助读者对光谱分析仪、分析仪技术、技术指标和应用有一个基本理解。 第 1 章描述了基于干涉仪和衍射光栅的光谱分析仪。 第 2 章定义了基于光谱分析仪的衍射光栅的多个保证性能参数，并探讨了单色仪、双单色仪、基于双程单色仪的光谱分析仪的优缺点。
应用说明 2000-09-01 |
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Network Analysis - Filter And Amplifier Measurement Examples (AN 1287-4)
The network analyzer is used for a variety of device and component characterization tasks in both laboratory and production environments.
应用说明 2000-08-01 |
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80 KB
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网络分析 - 矢量网络分析基本原理（AN 1287-1）
应用说明 2000-08-01 |
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Converting 8924C software for the E8285A
This Product Note assumes you are converting
software originally written for the Agilent 8924C, for use with the Agilent E8285A. Ideas are also included for modifying your software to function interchangeably with both the 8924C and the E8285A. This Note is meant to supplement the information...
应用说明 2000-07-01 |
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Simplified Filter Tuning Using Time Domain (AN 1287-8)
This Application Note describes a method of tuning a filter using the time-domain
response of its return loss, which makes filter tuning vastly easier.
应用说明 2000-07-01 |
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769 KB
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Measuring Close-In AM in the Presence of FM (PN 8590-5)
This Product Note explains how to use the FFT function in 8590 C/E/L-series Spectrum Analyzers with Fast Fourier Transform (FFT). FFT simplifies AM analysis by providing a smart user interface.
AM measurements of RF or microwave signals are quick, continuous, and repeatable even when FM is...
应用说明 2000-07-01 |
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137 KB
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信号分析的基础知识（AN 243）
本应用指南旨在向不熟悉频域和模域分析、动态信号分析仪的用户提供初级指导。 它介绍了时域、频域和模域分析，并且概述了动态信号分析仪的主要功能和......
应用说明 2000-06-01 |
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模态测试的基础知识（AN 243-3）
本模态测试应用指南（56 页）概述了结构动力学、采集频率响应数据的测量流程、参数估计（曲线拟合）、用于结构分析的分析方法及其与实验验证的关系......
应用说明 2000-05-01 |
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Comparing the Accuracy and Repeatability of On-Wafer CalibrationTechniques to 110 GHz
by Cascade Microtech
应用说明 2000-03-16 |
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177 KB
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Network Analysis - Mixers - Characterize Frequency-Translating Devices (AN 1287-7)
This Application Note explores current test equipment solutions and techniques that can be used to accurately characterize and test frequency-translating devices.
应用说明 2000-03-01 |
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Agilent TestJet Technology White Paper
This paper describes the Agilent TestJet technique, which makes use of a property of most digital ICs in use in the mid-1990s: the lead frame.
应用说明 2000-01-01 |
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Reducing Load Time for Loaderless Systems
For Series 2L systems, it may be possible to reduce the time it takes to load a panel.
应用说明 1999-12-01 |
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