Basics & Measurement Fundamentals

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201-225 of 271

Dealing with Board Thickness Variations The Agilent 5DX has the capability to be implemented such that it can accommodate thickness variations on a board-by-board basis. NOTE: Content described is in the 5DX Reference Guide but is no longer in Chapter 7 as mentioned herein. Application Note 2001-05-16	PDF 31 KB
Fundamentals of RF and Microwave Power Measurements (AN 64-1C) This Application Note is for information only. Agilent no longer sells or supports these products. Application Note 2001-04-16	PDF 2.21 MB
8 Hints for Making Better RF Counter Measurements This Brochure focuses on making better RF counter measurements by understanding the effects of counter architecture; recognizing the difference between resolution and accuracy, and scheduling calibration to match performance needs. In addition, the impact of timebase options is discussed along... Application Note 2001-04-10	PDF 194 KB Langues English \| 2001-04-10 \| PDF 194 KB 中文（简体） \| 2001-04-10 \| PDF 194 KB 日本語 \| 2000-04-18 \| PDF 585 KB
LCR/Impedance Measurement Basics presents impedance, component value definitions, typical measurement problemsand their solutions, and error correction and compensation techniques. Application Note 2001-03-28
Improved Fault Coverage in a Combined X-ray and In-Circuit Test Environment Cutting functional test failures in half and doubling the faults detected at process test! These are some of the case study results observed in combined X-ray and in-circuit test environments. Application Note 2001-02-27	PDF 575 KB
Electrical In-circuit Test Methods for Limited-access Boards This paper surveys the various electrical test methods and tools available to address testing boards that lack full electrical access. Application Note 2001-02-27	PDF 47 KB
Use of Wrong Thickness Technique Gives Bad Test Results Beginning with release 6.0, there are two techniques for measurement of solder thickness on the Agilent 5DX, each based on use of a different Confirmation & Adjustment panel. Application Note 2000-12-31
Network Analysis Basics - Architecture Of Network Analyzers (AN 1287-2) This Application Note explains that Network analyzers have become one of the most important tools for characterizing the performance of high-frequency components and devices. Application Note 2000-12-06	PDF 1.42 MB Langues English \| 2000-12-06 \| PDF 1.42 MB 中文（简体） \| 2000-12-06 \| PDF 1.38 MB 日本語 \| PDF
The Why, Where, What, How, and When of X-ray Test How do the different AXI technologies work? What are the appropriate uses of 2D vs 3D X-ray? Where in the mfg process should AXI be placed? How can AXI be used to improve the mfg process? Application Note 2000-11-01	PDF 1.30 MB
Hybrid32 Migration This document is provided to help users of HybridPlus Pin Cards more easily incorporate the Hybrid32 technology into their existing systems. Application Note 2000-11-01	PDF 61 KB
Learned Data for the 5DX The Agilent 5DX uses learned data in several ways to improve algorithm performance. There are basically 2 different forms of learned data. Application Note 2000-11-01
Maximizing Accuracy in Noise Figure Measurements (PN 85719A-1) This Product Note discusses factors that affect accuracy with the 85719A Noise Figure Measurement System. Statistically generated curves of noise figure measurements uncertainly are also included. Application Note 2000-10-01	PDF 661 KB
Techniques for Programming the 892X Family of Instruments (PN 892X) This Product Note describes some key programming techniques for the Agilent 892X family of products. This Note can be used as a training tool for users that are new to programming test equipment, or it can be used by experienced programmers that need to know about unique programming required for... Application Note 2000-09-01	PDF 186 KB
Optical Spectrum Analysis Basics (AN 1550-4) This Application Note is intended to provide the reader with a basic understanding of optical spectrum analyzers, their technologies, specifications, and applications. Chapter 1 describes interferometer-based and diffraction- grating-based optical spectrum analyzers. Chapter 2 defines many of the... Application Note 2000-09-01	PDF 222 KB Langues English \| 2000-09-01 \| PDF 222 KB 中文（简体） \| 2000-09-01 \| PDF 222 KB
Network Analysis - Filter And Amplifier Measurement Examples (AN 1287-4) The network analyzer is used for a variety of device and component characterization tasks in both laboratory and production environments. Application Note 2000-08-01	PDF 80 KB Langues English \| 2000-08-01 \| PDF 80 KB 日本語 \| PDF
Converting 8924C software for the E8285A This Product Note assumes you are converting software originally written for the Agilent 8924C, for use with the Agilent E8285A. Ideas are also included for modifying your software to function interchangeably with both the 8924C and the E8285A. This Note is meant to supplement the information... Application Note 2000-07-01	PDF 378 KB Langues English \| 2000-07-01 \| PDF 378 KB 日本語 \| 2000-01-19 \| PDF 297 KB
Simplified Filter Tuning Using Time Domain (AN 1287-8) This Application Note describes a method of tuning a filter using the time-domain response of its return loss, which makes filter tuning vastly easier. Application Note 2000-07-01	PDF 769 KB Langues English \| 2000-07-01 \| PDF 769 KB 日本語 \| PDF
Measuring Close-In AM in the Presence of FM (PN 8590-5) This Product Note explains how to use the FFT function in 8590 C/E/L-series Spectrum Analyzers with Fast Fourier Transform (FFT). FFT simplifies AM analysis by providing a smart user interface. AM measurements of RF or microwave signals are quick, continuous, and repeatable even when FM is... Application Note 2000-07-01	PDF 137 KB
Fundamentals of Signal Analysis (AN 243) This Application Note is a primer for those who are unfamiliar with the advantages of analysis in the frequency and modal domains and with the class of analyzers we call dynamic signal analyzers. It explains the time, frequency and modal domains and provides an overview of the major functions and... Application Note 2000-06-01	PDF 3.37 MB Langues English \| 2000-06-01 \| PDF 3.37 MB 中文（简体） \| 2000-06-01 \| PDF 3.28 MB
8 Hints For Successful Impedance Measurement (AN 346-4) Selection criteria, device characteristics, fixturing and error correction etc. Application Note 2000-06-01	PDF 599 KB Langues English \| 2000-06-01 \| PDF 599 KB 中文（简体） \| 2011-12-31 \| PDF 810 KB 日本語 \| 2000-04-13 \| PDF 1.10 MB 中文（繁體） \| 2002-12-23 \| PDF 1.63 MB
Fundamentals of Modal Testing (AN 243-3) This modal test 56 page Application Note provides an verview of structural dynamics theory, the measurement process for acquiring frequency response data, parameter estimation (curve fitting), and the analytical techniques of structural analysis and their relation to experimental testing (such... Application Note 2000-05-01	PDF 793 KB Langues English \| 2000-05-01 \| PDF 793 KB 中文（简体） \| 2000-05-01 \| PDF 793 KB
Comparing the Accuracy and Repeatability of On-Wafer CalibrationTechniques to 110 GHz by Cascade Microtech Application Note 2000-03-16	PDF 177 KB
Network Analysis - Mixers - Characterize Frequency-Translating Devices (AN 1287-7) This Application Note explores current test equipment solutions and techniques that can be used to accurately characterize and test frequency-translating devices. Application Note 2000-03-01	PDF 529 KB Langues English \| 2000-03-01 \| PDF 529 KB 日本語 \| 2001-10-10 \| PDF 762 KB
Agilent TestJet Technology White Paper This paper describes the Agilent TestJet technique, which makes use of a property of most digital ICs in use in the mid-1990s: the lead frame. Application Note 2000-01-01
Reducing Load Time for Loaderless Systems For Series 2L systems, it may be possible to reduce the time it takes to load a panel. Application Note 1999-12-01

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