RF & Microwave
For most of your RF & Microwave measurement needs, you can find application & solution information here.
Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.
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1-4 of 4
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A Simplified Extension of X-parameters to Describe Memory Effects for Wideband Modulated Signals
Model memory effects of microwave amplifiers in the case of wideband modulated signals.
Application Note 2010-05-05 |
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Extension of X-parameters to Include Long-Term Dynamic Memory Effects
IEEE MTT-S International Microwave Symposium Digest, Boston
Application Note 2009-06-05 |
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Polyharmonic Distortion Modeling
Application Note 2006-06-01 |
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Solutions for Characterizing and Designing Linear Active Devices
This short application brief discusses how to accurately characterize a devices’ nonlinear behavior.
Application Note 2009-08-21 |
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