基本入門與量測基礎
移除所有細分1-25 / 65
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測試系統開發指南：選擇您的測試系統軟體結構
應用手冊 2004-05-07 |
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3070 In System Programming (ISP) Family
On Board Programming, Bottom Line Benefits
應用手冊 2002-07-25 |
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200 KB
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3070 Increasing Throughput
There are decisions one can make that causes an Agilent 3070 test program to be slower or faster than what Test Consultant generates automatically. This paper offers many tips about how to optimize your system's performance.
應用手冊 1997-03-03 |
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41 KB
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3070 Series 3 Flash70 Programming Guide
This guide contains information about the procedures, tasks, and syntax required to perform flash programming with HP 3070 test systems.
應用手冊 2001-09-12 |
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1.85 MB
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5DX Virus Protection Software Policy
Agilent recognizes that customers require data protection for their PC workstations and computer controlled manufacturing equipment such as the 5DX Test System and associated workstations.
應用手冊 2004-08-26 |
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A Software Algorithm for Implementing Automatic Power Ranging in the 8960 Series 10 Wireless...
This Product Note presents a software algorithm for performing automatic power ranging in the Agilent 8960 Series 10 wireless communications test set with the Agilent E1960A GSM mobile test application installed. Agilent E1960A GSM mobile test application revisions, up to and including, A.01.04...
應用手冊 1999-04-01 |
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311 KB
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Agilent 3070 Now Powered by Industrial PC Controllers
The Agilent 3070 is now controlled by PCs similar to others used in your production and office environment lowering system administration and learning costs.
應用手冊 2003-01-23 |
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207 KB
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Applications and Operations of the 8970A Noise Figure Meter (PN8970A-1)
Part Number: 08970-99000 (Nov81). The 8970A is a discontinued product; this product note is provided for information only.
應用手冊 1981-11-01 |
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7.65 MB
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CDPD MDBS Cell Site Test Software Troubleshooting
This Product Note is a troubleshooting guide designed to answer the most problematic and typical questions that occur when testing a CDPD MDBS with the Agilent Technologies 8921A CDPD test solution.
General situations
Data collection does not work
A parameter you changed does not...
應用手冊 1997-06-01 |
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102 KB
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Connecting a UPS to a 3070 Controller
This paper describes how to connect a UPS to the 3070 testhead controller. It uses the Advanced Power Conversion Smart-UPS with PowerChute Plus software.
應用手冊 2003-01-07 |
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87 KB
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Considerations for Surface Map Setup
The concept of delta-Zs is perhaps the most difficult thing to understand about the surface map process.
應用手冊 2006-08-08 |
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Converting 8924C software for the E8285A
This Product Note assumes you are converting
software originally written for the Agilent 8924C, for use with the Agilent E8285A. Ideas are also included for modifying your software to function interchangeably with both the 8924C and the E8285A. This Note is meant to supplement the information...
應用手冊 2000-07-01 |
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Dealing with Board Thickness Variations
The Agilent 5DX has the capability to be implemented such that it can accommodate thickness variations on a board-by-board basis. NOTE: Content described is in the 5DX Reference Guide but is no longer in Chapter 7 as mentioned herein.
應用手冊 2001-05-16 |
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31 KB
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Design for Testability - Test for Designability
This paper addresses testability considerations, both physical and logical, and focuses on both the new constraints and the new freedoms of modern manufacturing test in the ever-changing challenge.
應用手冊 2003-01-28 |
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852 KB
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Discharge on Unpowered Agilent 3070 Systems
This paper is applicable to both powered and unpowered Agilent 3070 systems, but does not explain how a discharge routine is created on an Unpowered system.
應用手冊 2003-06-13 |
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Discreet Analog Device Testing
The Agilent 3070 series has quite a few built in features to make developing board tests easier, while protecting the operator, the board under test, and the 3070 itself from harm.
應用手冊 1998-10-29 |
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26 KB
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Enhanced Log Records for the Agilent Medalist In-Circuit Test System
Track changes made to your i3070 test programs to improve success.
應用手冊 2009-03-04 |
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801 KB
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Essential Testability Guidelines for Current Technology
This paper addresses essential testability considerations, both electrical and mechanical, and focuses on new requirements of current technologies.
應用手冊 1993-04-22 |
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55 KB
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Extending the 8640B Frequency Down to DC (AN 171-2)
Measurements with Signal Generators Application Note 171-2
應用手冊 1974-09-01 |
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644 KB
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Fixture Interface Pin (MINT Pin) Maintenance
Fixture Interface Pins (MINT Pins) used in production testing will eventually get dirty enough to cause contact problems.
應用手冊 1998-03-01 |
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20 KB
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Handling Surface Mapping with Varying Board Construction
This paper describes a method for dealing with lot-to-lot or supplier-to-supplier variations in board construction. Often the variations in board construction result in different color boards which otherwise cause problems with surface mapping.
應用手冊 2004-12-02 |
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1.02 MB
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How To Float, or Series, Agilent 3070 DUT Supplies
The Agilent 3070 development software does an amazing job of calculating the wiring needed to build fixtures. Even so there are occasionally cases which require wiring that the standard Agilent 3070 software can not handle.
應用手冊 1997-01-23 |
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34 KB
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Hybrid32 Migration
This document is provided to help users of HybridPlus Pin Cards more easily incorporate the
Hybrid32 technology into their existing systems.
應用手冊 2000-11-01 |
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61 KB
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In-circuit Testing of Low Voltage Devices
Core technical document summarizing issues regarding the testing of low voltage devices on the 3070 and i5000, including updated Safeguard information.
應用手冊 2005-05-25 |
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172 KB
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In-System Programming on the Agilent 3070
In-System Programmable devices are more widely used on today's boards to provide flexibility to design engineers and to reduce the cost of a product.
應用手冊 2001-07-02 |
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205 KB
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