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Basics & Measurement Fundamentals

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3070 Board Tests are Reliable, Repeatable and Transportable. Here's Why. 
It would take a very long paper to discuss all of the factors that make Agilent 3070 tests so reliable, repeatable, and transportable. This paper selects a few of the important ones.

Application Note 2001-08-15

PDF PDF 223 KB
3D Inline Solder Paste Inspection - Benefit Realized 
100% solder paste inspection helps to reduce the contribution from the print process to solder joint defects.

Application Note 2003-06-01

PDF PDF 59 KB
4 Hints for Making Better Microwave Counter Measurements 
This Product Note provides four pertinent hints for making better microwave counter measurements, describes the advantages of using a microwave counter, and deals with the unique measurement problems created by the advancement in counter technology.

Application Note 1998-09-01

PDF PDF 271 KB
Languages 
8 Hints for Debugging and Validating High-speed Buses 
8 Hints for Debugging High-speed Buses

Application Note 2002-03-05

PDF PDF 2.24 MB
8 Hints for Debugging Siemens MCU-based Designs 
A new type of instrument, the mixed signal oscilloscope (MSO), closes the gap in MCU debugging tools. The Agilent 54645D from Hewlett-Packard combines two analog scope channels with 16 digital logic channels, so you can monitor analog and digital lines at the same time. This MSO offers more...

Application Note 1998-11-01

PDF PDF 736 KB
8 Hints for Making Better Measurements Using Analog RF Signal Generators 
This guide helps you improve the accuracy of your measurements that involve using RF analog signal sources.

Application Note 2001-11-14

PDF PDF 1.01 MB
Languages 
8 Hints for Making Better Measurements Using RF Signal Generators Application Note 
This application provides 8 hints for improving the accuracy of your measurements using RF signal generators.

Application Note 2012-06-27

PDF PDF 1.35 MB
8 Hints for Making Better RF Counter Measurements 
This Brochure focuses on making better RF counter measurements by understanding the effects of counter architecture; recognizing the difference between resolution and accuracy, and scheduling calibration to match performance needs. In addition, the impact of timebase options is discussed along...

Application Note 2001-04-10

PDF PDF 194 KB
Languages 
8 Hints for Making Better Spectrum Analyzer Measurements (AN 1286-1) 
This application note provides eight pertinent hints for making better spectrum analyzer measurements such as measuring low level signals and indentifying internal distortion products.

Application Note 2009-09-07

PDF PDF 739 KB
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8 Hints for Solving Common Debugging Problems with Your Logic Analyzer (AN 1326) 

Application Note 2007-04-19

PDF PDF 1000 KB
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8 Hints For Successful Impedance Measurement (AN 346-4) 
Selection criteria, device characteristics, fixturing and error correction etc.

Application Note 2000-06-01

PDF PDF 599 KB
Languages 
8 More Hints for Making Better Scopes Measurements 
This Application Note contains a variety of hints to help you understand and improve your use of oscilloscopes. It includes the following 8 hints: 1. Don't forget to check that probe 2. A quick, easy way to troubleshoot mixed hardware/software prototypes 3. Using scopes to measure noisy signals 4...

Application Note 1999-12-01

PDF PDF 840 KB
8510 Calibration - Measuring Noninsertable Devices (PN 8510-13) 
The majority of devices used in real-world microwave systems are noninsertable because of the connectors employed.

Application Note 2006-07-13

PDF PDF 261 KB
8510 Calibration Standard Definitions (AN 8510-5B) 
This Product Note covers methods for specifying calibration standards and describes the procedures for their use with the Agilent 8510 Network Analyzer.

Application Note 2006-07-13

PDF PDF 1.12 MB
A New Process for Measuring and Displaying Board Test Coverage 
Written by Kenneth P. Parker, Agilent Technologies. First presented at Apex 2003, Anaheim, California.

Application Note 2003-01-01

PDF PDF 116 KB
A Technique for Calibrating Phase Shifters to High Accuracy (AN 19) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1966-05-01

PDF PDF 3.84 MB
Achieving Fast Design Cycle Time 
This application note describes how fast cycle time is achieved using the impedance analyzer such as the E4991A and 4294A with the Electronic Design Automation (EDA) tools.

Application Note 2008-11-13

PDF PDF 461 KB
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Adjusting the Defect Analyzer detection parameters on the Medalist 5DX Automated X-ray System 
Defect Analyzer operates by making a small change in the ‘z’ height of the board and re-testing suspect joints.

Application Note 2008-06-12

 
Adjusting the X-ray Surface Map parameters on the Medalist 5DX Automated X-ray System 
Tips on obtaining the best images using the 5DX surface map parameters.

Application Note 2008-06-19

 
Advanced impedance measurement capability of the RF I-V method (AN 1369-2) 
This application note describes the difference between the network analyzer and impedance analyzer for the measurement principle and actual measurement performance.

Application Note 2001-07-26

PDF PDF 753 KB
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Advanced TDR Techniques (AN 62-3) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1990-04-01

PDF PDF 2.73 MB
Agilent 3070 Outsource Series Pay-Per-Use Board Test System 
With an Agilent 3070 Outsource Pay-Per-Use System, you can define your system according to the products you have to test.

Application Note 2002-03-08

PDF PDF 247 KB
Agilent TestJet Technology White Paper 
This paper describes the Agilent TestJet technique, which makes use of a property of most digital ICs in use in the mid-1990s: the lead frame.

Application Note 2000-01-01

 
An Introduction to Multiport and Balanced Device Measurements (AN 1373-1) 
The increase in integration in the wireless communications and electronics industries and the need to decrease size, cost, weight, and power consumption is driving design engineers to replace discrete components with more complex modules.

Application Note 2002-11-11

PDF PDF 522 KB
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AOI - A Strategy for Closing the Loop 
This paper describes a set of defect prevention solutions centered on the availability of high-quality inspection and measurements data from an AOI system and a few carefully engineered software applications

Application Note 2006-04-16

PDF PDF 291 KB

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