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Long Term Evolution - LTE Test

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Greater insight. Greater confidence. Accelerate next-generation wireless. 

Agilent gives you “greater insight” into your Long Term Evolution (LTE) designs and LTE Test. We provide reduced design uncertainty, faster and easier development of high-performing LTE products and help you find root causes faster. Now with first-to-market test solutions for LTE-Advanced.

To learn more about LTE technology : LTE Technology Overview

To learn more about the LTE implementation of MIMO: MIMO Test

Receive App Notes, CD's and other resources : Long Term Evolution - LTE Resources

To find the product that fits your stage of Long Term Evolution (LTE) development see links to the left.

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EXT Wireless Communications Test Set Non-signaling Test Overview 
This application note explains how non-signaling test methods make it possible for manufacturers to reduce both test times and test equipment costs across a range of wireless technologies

Application Note 2012-08-01

PDF PDF 290 KB
Measuring ACLR Performance in LTE Transmitters 
This note focuses on the adjacent channel leakage-power ratio (ACLR) test, a vital one for LTE.

Application Note 2010-01-07

PDF PDF 684 KB
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Solutions for Femtocell Manufacturing Test 
This short application brief discusses how to best accelerate the delivery of quality, low-cost femtocells to market.

Application Note 2009-05-05

PDF PDF 605 KB
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Stimulus-Response Testing for LTE Components 
This note focuses on the 3GPP LTE specifications that present some new challenges for manufacturers of components and equipment for LTE systems.

Application Note 2010-05-03

PDF PDF 2.86 MB
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