High-Speed Digital
- Design & Simulation: Download the Quick Start Guide
- Analysis & Debug: Download the Debugging application note
- Compliance: Visit the compliance web page
- Signal Integrity: Link to the PLTS technical overview
In digital standards, every generational change puts new risks in your path. We see it firsthand when creating our products and working with engineers like you. Agilent’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of. Agilent - achieve your best design.
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Explore this web site for solutions within all four stages of the design cycle as well as the crucial—and integral—field of signal integrity analysis.
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1-13 of 13
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8 Hints for Debugging and Validating High-speed Buses
8 Hints for Debugging High-speed Buses
Application Note 2002-03-05 |
PDF
2.24 MB
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8 Hints for Debugging Siemens MCU-based Designs
A new type of instrument, the mixed signal oscilloscope (MSO), closes the gap in MCU debugging tools. The Agilent 54645D from
Hewlett-Packard combines two analog scope channels with 16 digital logic channels, so you can monitor analog and digital lines at the
same time. This MSO offers more...
Application Note 1998-11-01 |
PDF
736 KB
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DDR4 TdiVW/VdiVW Bit Error Rate Measurement or Understanding Bit Error Rate
Importance of making BER measurement calculations to form a statistical measurement of total jitter to understand the design's data valid window result and design error rates.
Application Note 2013-01-24 |
PDF
1.65 MB
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Debugging Parallel RapidIO Designs
Application Note 2003-01-09 |
PDF
356 KB
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Debugging Signal Integrity and Protocol Layers on DDR Designs
As DDR data transmission rates increase, signal integrity and clarity become critical concerns. So one of the primary challenges with DDR is debugging failures.
Application Note 2008-12-19 |
PDF
984 KB
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Debugging USB 2.0: It's Not Just A Digital World (AN 1382-3)
Debugging USB 2.0 Systems
Application Note 2006-10-05 |
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Effective Reflection Characterization for Active Devices Using ENA Option TDR Application Note
This application note describes Hot TDR measurement, which is an effective characterization method for the reflection of transmitter and receiver.
Application Note 2012-01-12 |
PDF
416 KB
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Improve Your Time-to-Insight:Debugging Intermittent Memory Failures in DDR and DDR2 Systems
Application Note 1575
Application Note 2006-04-14 |
PDF
120 KB
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In-circuit Debug of FPGAs
This application note covers key methods of debugging FPGAs along with technologies that reduce the number of pins needed for debug.
Application Note 2003-05-01 |
PDF
1.43 MB
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InfiniBand System Level Debugging (AN 1382-1)
This application note is written for R & D engineers developing InfiniBand processors and InfiniBand system designers and integrators. It covers key concepts underlying system-level debug and validation of InfiniBand systems.
Application Note 2004-03-17 |
PDF
2.10 MB
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Integrated Debugging-A New Approach to Troubleshooting Your Designs with Real-Time Oscilloscopes
Traditional debugging can be time consuming and inefficient. With Agilent Infiniium oscilloscopes,
“integrated debugging” is a reality, and it leads you directly to the root cause of problems.
Application Note 2008-01-30 |
PDF
1.17 MB
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Mixed Analog & Digital Signal Debug and Analysis Using a Mixed-Signal Oscilloscope
Using a mixed analog and digital 32 bit WLAN application example, this note shows how an MSO with deep memory makes debugging today’s mixed analog and digital designs easier than ever before.
Application Note 2009-06-01 |
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Planning Your Design for Debug: FPGA Dynamic Probe
Application Note 2005-01-26 |
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