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- Device Modeling and Characterization

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1-19 / 19

Advanced Product Design & Test for High-Speed Digital Devices Webcast Original broadcast Jan 18, 2012 웹캐스트 - recorded
Agilent EEsof EDA Customer Education and Services Brief overview of Agilent EEsof EDA Customer Education and Services. 교육 자료 2010-08-11
Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro Originally broadcast Jan 27, 2011 웹캐스트 - recorded
Breakthrough in High Speed Interconnect Analysis and Compliance Testing Originally broadcast April 27, 2011 웹캐스트 - recorded
EMC 2013 - IEEE International Symposium on Electromagnetic Compatibility August 5- 9, 2013; Denver, CO 트래이드쇼
Genesys Webcasts - "How-To-Design" series Originally broadcast in 2009. Access the 6 WebEX recordings 웹캐스트 - recorded
Hybrid-Active Load Pull with PNA-X and Maury Microwave Original broadcast Jun 12, 2012 웹캐스트 - recorded
IC-CAP User Training This 3-day course will show device modelers how to use Agilent EEsof EDA's IC-CAP software. Click on link to view full course description and class dates and locations. 교육
IMS 2011 (IEEE MTT-S) – Connect, Expert to Expert, at Agilent Avenue 2011 show, last June, 2011; Baltimore Convention Center 트래이드쇼
Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast Original broadcast May 7, 2013 웹캐스트 - recorded
Measurement Based FET Modeling using Artifical Neural Networks (ANN) This presentation was given by Jianjun Xu with introduction by David Root as part of the Innovations in EDA Webcast Series. 세미나 프리젠테이션 2012-02-07	PDF 2.51 MB
New impedance measurement solutions & apps using 5 Hz to 3 GHz VNA Originally broadcast April 19, 2011 웹캐스트 - recorded
Nonlinear Characterization and Modeling Through Pulsed IV/S-Parameters Original broadcast Mar 27, 2012 웹캐스트 - recorded
Optimizing PXI Modular Functional Test System Throughput Webcast Originally broadcast April 27, 2011 웹캐스트 - recorded
PCI Express(R) 3.0 Strategies for Transmitter and Receiver Validation Originally broadcast Feb 10, 2011 웹캐스트 - recorded
Presentation on BSIM4, BSIM3v3 and BSIMSOI RF MOS Modeling This Presentation by Dr. Thomas Gneiting (Advanced Modeling Solution) was presented at Agilent EEsof EDA Seminar, April 04, 2001 details the structure of BSIM3v3, BSIMSOI and BSIM4 RF models. 세미나 프리젠테이션 2001-04-04	PDF 1.49 MB
Presentation on DC & AC Characterization of Semiconductors This Presentation focuses on basics of device measurement and modeling techniques from DC to RF, special aspects of network analyzer calibration, de-embedding and required dummy structures. 세미나 프리젠테이션 2003-01-28	PDF 893 KB
Setting Up IC-CAP WaferPro For On-Wafer Measurements originally broadcast June 22, 2011 웹캐스트 - recorded
Setting up IC-CAP WaferPro for On-Wafer Measurements IC-CAP WaferProIs is an extremely powerful test plan suite, for on-Wafer DC/CV and RF device modeling measurements. 세미나 프리젠테이션 2011-06-22	PDF 3.07 MB