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Application Information About Specific Components & Devices

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Batteries (2)
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1-10 of 10

Agilent EEsof EDA Customer Education and Services Brief overview of Agilent EEsof EDA Customer Education and Services. Training Materials 2010-08-11
Antenna Measurement Basics Review the terminology, measurement types, errors sources and test considerations. Reprinted with the permission of Orbit/FR Inc. Training Materials 2004-03-03	PDF 1.11 MB
Automated Stimulus & Current Drain Analysis for Validating/Optimizing Mobile Device Run Time customer viewable presentation Training Materials 2008-04-15	PDF 773 KB
Boundary Scan Online Training Get up to speed on boundary scan! Access online training materials for boundary scan from the comfort of your desk! Training Materials 2010-01-28
Boundary Scan Test Methods for DDR Memories In-circuit testing of DDR Memories has become increasingly difficult. This webcast discusses methods of DDR test development and debug. Training Materials 2011-03-28
Cheetah PNA RCS and Antenna Measurement System Presentation View the presentation on Cheetah PNA RCS and Antenna Measurement Systems. Reprinted with the permission of SPC Corp. Training Materials 2004-03-25	PDF 2.29 MB
DfT rules for boundary scan during ICT Learn about the design for test rules for boundary scan used at in-circuit test, that can help you create a good test, minimizing the time and effort needed for debugging while maximizing the efficiency of your test. Training Materials 2009-12-01	PDF 276 KB
Near-field vs. Far-field Review the tradeoffs and advantages of either a near field or far field antenna test solution. Reprinted with the permission of NearField Systems Inc. Training Materials 2004-03-03	PDF 582 KB
New Tools For Optimizing Operating Time of Mobile Wireless Devices Explore challenges of measuring battery current consumption in design validation of next generation digital communications devices including 2.5/3G handsets, Wireless LAN, and Bluetooth technology. Training Materials 2002-06-25
Surviving State Disruptions Caused by Test: the "Lobotomy Problem” Boundary scan test may affect the logic states of a device as it switches between core logic operation to test mode operation. This webcast puts forth proposals to restore the logic state to a defined state after testing. Training Materials 2010-12-21