IC-CAP Device Modeling Software -- Measurement Control and Parameter Extraction
Integrated Circuit Characterization and Analysis Program (IC-CAP) is the industry standard for DC and RF semiconductor device modeling. IC-CAP extracts accurate compact models used in high speed/digital, analog and power RF applications. Today’s most advanced semiconductor foundries and IDMs rely on IC-CAP for modeling silicon CMOS, Bipolar, compound gallium arsenide (GaAs), gallium nitride (GaN) and many other device technologies. IC-CAP is the most advanced, customizable modeling software and includes measurement, simulation, optimization and statistical analysis tools.
Key Benefits of IC-CAP
- Open software architecture enables maximum accuracy and provides ultimate flexibility to create and automate measurement, extraction and verification procedures
- Turnkey extraction solutions for industry standard CMOS models, such as BSIM3/BSIM4, PSP and HiSIM, minimize the learning curve and maximize model accuracy
- Most direct links to commercial simulators ensure consistency between extracted models and the simulators used by circuit designers
Learn about IC-CAP
Note: Trial license requests submitted between December 23, 2013 and January 5, 2014 may be delayed due to a company holiday shutdown. Thank you for your patience.
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