IC-CAP Device Modeling Software -- Measurement Control and Parameter Extraction

Integrated Circuit Characterization and Analysis Program (IC-CAP) is the industry standard for DC and RF semiconductor device modeling. IC-CAP extracts accurate compact models used in high speed/digital, analog and power RF applications. Today’s most advanced semiconductor foundries and IDMs rely on IC-CAP for modeling silicon CMOS, Bipolar, compound gallium arsenide (GaAs), gallium nitride (GaN) and many other device technologies. IC-CAP is the most advanced, customizable modeling software and includes measurement, simulation, optimization and statistical analysis tools.

Key Benefits of IC-CAP

Open software architecture enables maximum accuracy and provides ultimate flexibility to create and automate measurement, extraction and verification procedures
Turnkey extraction solutions for industry standard CMOS models, such as BSIM3/BSIM4, PSP and HiSIM, minimize the learning curve and maximize model accuracy
Most direct links to commercial simulators ensure consistency between extracted models and the simulators used by circuit designers