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Agilent Vectorless Test Solution

VTEP

VTEP v2.0 Powered, with Cover-Extend Technology

Introducing the industry’s first VTEP/Boundary Scan hybrid.

Cover-Extend Technology (CET)
part of VTEP v2.0 Powered test suite

Now, get test coverage without test access with Cover-Extend Technology which is part
of the growing suite of VTEP solutions, the VTEP v2.0 Powered test suite.
Click here to learn more about Cover-Extend Technology

What is the VTEP v2.0 Powered test suite?
Agilent’s award winning test suite brings you the most comprehensive set of tools to meet
the demands today’s electronic manufacturing test brought on by lack of test access,
ultra-small IC packaging, GHz signaling and assurance of signal integrity.

The test suite comprises of :

Tools Awards
VTEP successor to the world renowned Agilent Testjet
iVTEP Best in Test Award 2007, TMW
Network Parameter Measurement (NPM) EM Asia Innovation Award 2008
Cover-Extend Technology (CET) IPC Innovation Technology Center Award 2008

Coverage Table

VTEP v2.0 Powered Test Suite Devices (ICs) Connectors Sockets
VTEP
(with enhanced speed and enhanced guarding)*1		 x x x
iVTEP
(for ultra-small ICs)		 x    
Network Parameter Measurement (NPM)
(for power and ground coverage)		   x x
Cover-Extend Technology (CET)
(for limited access boards)		 x*2 x x

*1 enhancements has been made to the original VTEP to improve speed and guarding with the latest i3070 software.
*2 speak to your local rep for this exciting opportunity. Contact Us

VTEP
The VTEP hardware is 4X more sensitive and up to 5X better in standard deviation than its predecessor, Testjet. The Autodebug function with per-pin-threshold characterization enables debugging in seconds.
With the latest i3070 software, you get enhanced speed (up to 4X) and better guarding as well.

iVTEP
The technology is for devices with ultra low value measurement of signal pins (< 5fF) of ICs. Targeting ultra small IC packages, flip chips and devices with minimal or no lead frame at all, iVTEP even works with ICs with non-grounded heat spreaders and heat sinks.

Network Parameter Measurement (NPM)
NPM detects defects on power and ground pins. Available for connectors and sockets, this capability enables coverage that could otherwise escape even functional test.

New NPM Connector Library File Request
NPM requires a library file of the connector/socket that user wants to test. To request for a library file for a new connector/socket not currently in your ICT software, please click here.

Cover-Extend Technology (CET)
Cover-Extend Technology is a hybrid between VTEP and Boundary Scan. This is a powerful limited access tool able to help improve your test coverage or even reduce your test point For more information, click here.

Requirements
Hardware
VTEP signal conditioning Mux card
VTEP sensor plate
Amplifier board
Cover-Extend Technology (CET) card - for CET only

Software
Medalist i3070 software ver.07.20p and above
License - for CET only

Part-Numbers Available For Order

VTEP Products Description
N4300-66534 CET (Cover-Extend Technology) Signal-conditioner card (pack-of-1)
N4300A Signal Conditioning MUX Card (Qty : 10)
N4301A Probe Active Electronics (Qty : 50)
N4302A 1.2 Inch Passive Sensor Plate (Qty : 100)
N4303A 2.5 Inch Passive Sensor Plate (Qty : 50)
N4306A 0.5 X 6.0 Passive Sensor Plate (Qty : 50)
N4307A Connect Check Mux Card (Qty : 10)
N4311A Small Probes (Qty : 50)
N4312A Small Probes (Qty : 250)
N4313A Probes (Qty : 250)

Documents & Downloads

Medalist VTEP v2.0 Powered, with Cover-Extend technology  
This brochure provides an overview of Cover-Extend under the VTEP v2.0 Powered vectorless test suite

Brochure 2010-04-06

null PDF 237 KB
Download the Introduction to Medalist VTEP v2.0 Powered with Cover-Extend technology 

Demo 2008-04-18

Article reprint: Finding Power/Ground Defects on Connectors A New Approach 
This paper surveys existing tests for these defects and introduces a new solution based on Network Parameter Measurements

Article Reprint 2008-03-06

null PDF 199 KB
Maximising Test Coverage with Agilent Medalist VTEP v2.0 
This paper describes how to get the most from Agilent Technologies’ industry-leading vectorless test innovation, the Medalist VTEP v2.0 which is a suite of solution comprising VTEP, iVTEP and NPM.

Application Note 2007-04-17

null PDF 227 KB
Languages 
Vectorless Test EP (VTEP) Goes Head-to-Head with Agilent TestJet 
In beta tests, VTEP proved its abilities to improve in-circuit test coverage by over 80 percent compared to Agilent TestJet, especially on boards with hard-to-test packages such as BGAs, micro-BGAs, and SMT edge connectors.

Success Story 2003-12-16

null PDF 351 KB
Medalist iVTEP - intelligent Vectorless Test EP 
Building on the strength of TestJet and VTEP, Agilent intelligent Vectorless Test Extended Performance (iVTEP) can be used for ultra-small geometry packages, flip chips, as well as devices with minimal or no lead frames and heat spreaders.

Technical Overview 2009-09-17

null PDF 155 KB
TestJet & VTEP hardware description and verification 
This application note describes the TestJet and VTEP hardware components and the required connections for assembly on test fixtures. It also provides instructions for the setup and use of the Fixture Verifier.

Application Note 2010-12-22

null PDF 2.16 MB
How to build a fixture for use with the Agilent Cover-Extend Technology 
Cover-Extend Technology is Agilent’s latest limited access solution for in-circuit test. This paper documents the necessary information for a fixture vendor to build a Cover-Extend fixture.

Application Note 2011-06-24

null PDF 1.08 MB
Network Parameter Measurement: Best Practices using the Agilent Medalist i3070 
This paper describes how to maximize benefits from the Network Parameter Measurement capability on the Agilent Medalist i3070 in-circuit test system using enhancements in software version 7.20p.

Application Note 2009-04-02

null PDF 55 KB